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Multiple-objective backtrace for solving test generation constraints (title)
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book article
Multiple-objective backtrace for solving test generation constraints
Mekler, A.
;
Raik, Jaan
International Symposium on System-on-Chip : November 19-21, 2003, Tampere, Finland : proceedings
2003
/
p. 123-126 : ill
https://ieeexplore.ieee.org/document/1267732
book article
Number of records 1, displaying
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keyword
18
1.
Test Group Generation for Detecting Multiple Faults
2.
adaptive test strategy generation
3.
automated test pattern generation
4.
automatic test case generation
5.
automatic test pattern generation
6.
automatic test program generation
7.
behaviour level test generation
8.
functional test generation
9.
Hierarchical Multi-level Test Generation
10.
high-level test data generation
11.
highlevel test generation
12.
implementation-independent test generation
13.
offline test generation
14.
provably correct test generation
15.
test generation
16.
test generation and fault diagnosis
17.
test program generation
18.
multiple-input multiple output system
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