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Ubar, Raimund-Johannes (author)

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276

book article

Faults and fault models for integrated circuits and systems [Electronic resource] : [slides]Ubar, Raimund-JohannesDesign and Test Technology for Dependable Hardware/Software Systems : DEDIS/DAAD Summer Academy : BTU Cottbus, Sept. 1st-12th, 20082008 / [64] p. : ill. [CD-ROM]

book article
277

book article

Feasibility of structurally synthesized BDD models for test generationRaik, Jaan; Ubar, Raimund-JohannesProceedings of the IEEE European Test Workshop, Barcelona, Spain, May 27-29, 19981998 / p. 145-146

book article
278

book

Fehler in Automaten1989 http://www.ester.ee/record=b2015320*est

book
279

journal article

Fehlerbestimmung in kombinatorischen Scaltungen durch Lösung der Booleschen DifferentialgleichungenUbar, Raimund-JohannesNachrichtentechnik, Elektronik : technisch-wissenschaftlishe Zeitschrift für die gesamte elektronische Nachrichtentechnik1978 / p. 330-334 : ill https://www.ester.ee/record=b1550811*est

journal article
280

book article

ForewordUbar, Raimund-Johannes; Prinetto, Paolo; Al-Hashimi, BashirInformal Digest of Papers : 10 IEEE European Test Symposium : Tallinn, Estonia, May 22-25, 20052005 / p. III

book article
281

book article

Foreword to the 12th IEEE DDECS SymposiumPliva, Zdenek; Manhaeve, Hans; Renovell, Michel; Novak, Ondrej; Ubar, Raimund-Johannes; Drabkova, JindraProceedings of the 2009 IEEE Symposium on Design and Diagnostics of Electronic Circuits and Systems : April 15-17, 2009, Liberec, Czech Republic2009 / p. iii http://dx.doi.org/10.1109/DDECS.2009.5012081

book article
282

dissertation

Formal verification and error correction on high-level decision diagrams = Formaalne verifitseerimine ja vigade parandamine kõrgtasemelistel otsustusdiagrammidelKarputkin, Anton2012

dissertation
283

book article

FPGA based fault emulation of synchronous sequential circuitsEllervee, Peeter; Raik, Jaan; Tihhomirov, Valentin; Ubar, Raimund-JohannesProceedings [of] 22nd NORCHIP Conference : Oslo, Norway, 8-9 November 20042004 / p. 59-62 https://ieeexplore.ieee.org/abstract/document/1423822

book article
284

book article

FPGA design flow with automated test generationElst, G.; Diener, Karl-Heinz; Ivask, Eero; Raik, Jaan; Ubar, Raimund-JohannesProc. of German 11th Workshop on Test Technology and Reliability of Circuits and Systems : Potsdam, 19991999 / p. 120-123

book article
285

journal article

FPGA-based fault emulation of synchronous sequential circuitsEllervee, Peeter; Raik, Jaan; Tammemäe, Kalle; Ubar, Raimund-JohannesIET computers and digital techniques2007 / 2, p. 70-76 : ill https://ieeexplore.ieee.org/abstract/document/1423822

journal article
286

book article

From online fault detection to fault management in network-on-chips : a ground-up approachAzad, Siavoosh Payandeh; Niazmand, Behrad; Janson, Karl; Nevin, George; Oyeniran, Adeboye Stephen; Putkaradze, Tsotne; Apneet Kaur; Raik, Jaan; Jervan, Gert; Ubar, Raimund-Johannes; Hollstein, ThomasProceedings 2017 IEEE 20th International Symposium on Design and Diagnotics of Electronic Circuit & Systems(DDECS) : April 19-21, 2017, Dresden, Germany2017 / p. 48-53 : ill https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=7934553

book article
287

book article

FTGEN - система генерирования функциональных тестовUbar, Raimund-Johannes; Dušina, Julia; Zaugarov, Viktor; Крупнова Е.; Storožev, SergeiProceedings of CAD-93 : new information technologies for science, education and business, Yalta, May 4-13, 19931993 / p. 123-125

book article
288

book article

Functional built-in self-test for processor cores in SoCUbar, Raimund-Johannes; Indus, Viljar; Kalmend, Oliver; Evartson, Teet; Orasson, Elmet30th IEEE NORCHIP Conference : Copenhagen, Denmark, November 12-14, 20122012 / p. 1-4 : ill

book article
289

book article

Functional level controllability analysis for digital circuitsUbar, Raimund-Johannes; Kuchcinski, KtzysztofProc. of the Design Automation Conference, Kaunas, Lithuania, June 1-4, 19921992 / p. 13-21

book article
290

book article

Functional level test set generation methodsUbar, Raimund-JohannesProceedings of the 12th Conference on Fault-Tolerant Systems and Diagnostics, Prague, Czechoslovakia, September, 19891989 / p. 46-55

book article
291

book article

Functional level testability analysis for digital circuitsUbar, Raimund-Johannes; Kuchcinski, KtzysztofETC '93 : European Test Conference, Rotterdam, The Netherlands, April 19-22, 19931993 / p. 545-546

book article
292

book

Functional level testability analysis for digital circuitsUbar, Raimund-Johannes1992

book
293

journal article

Functional self-test of high-performance pipe-lined signal processing architecturesGorev, Maksim; Ubar, Raimund-Johannes; Ellervee, Peeter; Devadze, Sergei; Raik, Jaan; Min, MartMicroprocessors and microsystems2015 / p. 909-918 : ill http://dx.doi.org/10.1016/j.micpro.2014.11.002

journal article
294

book article

Functional specification and testing of digital systemsUbar, Raimund-JohannesMultimicroprocessor systems: Proceedings of the 3rd Symposium, Stralsund, oct. 16-20, 1989, Vol 11989 / p. 207-217

book article
295

book article

Functional test generation for finite state machinesUbar, Raimund-Johannes; Brik, Marina; Jutman, Artur; Raik, Jaan; Bengtsson, Tomas; Kumar, ShashiBEC 2006 : 2006 International Baltic Electronics Conference : Tallinn University of Technology, October 2-4, 2006, Tallinn, Estonia : proceedings of the 10th Biennial Baltic Electronics Conference2006 / p. 205-208 : ill

book article
296

book article

Functional test program generation for digital systemsUbar, Raimund-Johannes; Dušina, Julia; Krupnova, Helena; Storožev, Sergei; Zaugarov, ViktorTestmethoden und Zuverlässigkeit von Schaltungen und Systemen : proceedings of the 6th workshop, Vaals (Niederlande), March 6-8, 19941994 / p. 14-18: ill

book article
297

book article

Funktsionaalsete alternatiivsete graafide mudeli süntees digitaallülitusteleKivi, E.; Ubar, Raimund-JohannesXXXII üliõpilaste teaduslik-tehnilise konverentsi ettekannete teesid : pühendatud V. I. Lenini 110. sünniaastapäevale : 16.-18. aprill 19801981 / lk. 91 https://www.ester.ee/record=b1322611*est

book article
298

book article

GA-based test generation for sequential circuitsBrik, Marina; Raik, Jaan; Ubar, Raimund-Johannes; Ivask, EeroProceedings of East–West Design & Test Workshop (EWDTW’04) : Yalta, Alushta, Crimea, Ukraine, September 23-26, 20042004 / p. 30-34

book article
299

book article

Gate-level modelling of NBTI-induced delays under process variationsCopetti, Thiago; Cardoso Medeiros, Guilherme; Bolzani Poehls, Leticia; Vargas, Fabian; Kostin, Sergei; Jenihhin, Maksim; Raik, Jaan; Ubar, Raimund-JohannesLATS 2016 : 17th IEEE Latin-American Test Symposium, Foz do Iguacu, Brazil, 6th-9th April 20162016 / p. 75-80 : ill http://dx.doi.org/10.1109/LATW.2016.7483343

book article
300

book article

Generating directed tests for C programs using RTL ATPGRaik, Jaan; Drenkhan, Tiia; Jenihhin, Maksim; Viilukas, Taavi; Karputkin, Anton; Tšepurov, Anton; Ubar, Raimund-JohannesProceedings of the IEEE 13th Workshop on RTL and High Level Testing (WRTLT'12)2012 / p. 1-6

book article

Number of records 834, displaying 276 - 300

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1. Ubar, Raimund-Johannes 1941
2. Räämet, Raimund 1918-2004
3. Aare, Johannes 1915-2000
4. Aavik, Eduard-Johannes
5. Ahrenschild, Johannes (-1936)
6. Alaots, Johannes
7. Aljak, Arnold Johannes
8. Allik, Erich-Johannes
9. Avik, Eduard Johannes 1891-1942
10. Drechsler, Wolfgang Johannes Max
11. Ehala, Johannes 1986
12. Hint, Johannes 1914-1985
13. Johannes, Ille 1939
14. Johannson, Johannes
15. Johanson, Johannes
16. Juhans, Johannes 1874-1956
17. Kajander, Aleksi Oskar Johannes 1994
18. Kiiwet, Johannes
19. Kiivet, Johannes 1879-1967
20. Kivit, Johannes
21. Kollist, Johannes 1884-1937
22. Kollist, Johannes Theodor
23. Korv, August Johannes 1911-1981
24. Krimmer, Robert Johannes
25. Käpp, Martin Johannes
26. Langel, Johannes 1900-1985
27. Langell, Johannes
28. Livländer, Robert Johannes
29. Lutsar, Richard-Johannes
30. Madise, Johannes 1920-?
31. Maltenek, Evald Leonhard Johannes
32. Matsulevitš, Johannes
33. Meitre, Johannes 1906-1978
34. Messer, Johannes
35. Muru, Johannes 1995
36. Mäll, Johannes 1911-1981
37. Mühlman, Johannes
38. Mühlmann, Johannes 1888-1936
39. Notermans, Antonius Johannes Hubertus 1959
40. Nuudi, Johannes 1895-1975
41. Palo, Johannes 1925-1960
42. Pals, Johannes 1903-1941
43. Pello, Johannes 1958
44. Pervik, Johannes 1892-1958
45. Presmann, Johannes 1942
46. Putk, Aksel-Johannes 1928-1999
47. Püümann, Mait Johannes
48. Renter, Olav-Johannes
49. Roes, Johannes 1914
50. Russwurm, Johannes
51. Russvurm, Johannes 1855-1939
52. Russvurm, Johannes Carl Gysbert Immanuel
53. Sakeus, Johannes 1880-1934
54. Taimsalu, Johannes 1891-1942
55. Teiman, Johannes
56. Teimann, Johannes Rudolf (kuni 22.05.1935)
57. Tomson, Johannes
58. Tuulre, Feliks Johannes 1908-1987
59. Veerus, Johannes Voldemar 1897-1972
60. Verus, Johannes Voldemar
61. Vuhk, Oskar Johannes

1. Ubar, Raimund-Johannes, 1941-
2. Hagelberg, Raimund, 1927-2012
3. Räämet, Raimund, 1918-2004
4. Aare, Johannes, 1915-2000
5. Aavik, Johannes, 1880-1973
6. Avik, Eduard Johannes, 1891-1942
7. Bender, Naatan Johannes
8. Erm, Johannes, 1998-
9. Granö, Johannes Gabriel
10. Hint, Johannes, 1914-1985
11. Johannes Paulus II, paavst, 1920-2005
12. Kert, Johannes
13. Kiivet, Johannes, 1879-1967
14. Kollist, Johannes
15. Käis, Johannes
16. Lang, Johannes
17. Maide, Johannes Voldemar
18. Mossov, Johannes
19. Pals, Johannes, 1903-1941
20. Pello, Johannes
21. Putk, Aksel-Johannes
22. Rammul, Aleksander Johannes, 1875-1949
23. Steinbrunn, Johannes
24. Taimsalu, Johannes, 1891-1942
25. Talu, Martin Johannes
26. Veerus, Johannes Voldemar, 1897-1972
27. Veski, Johannes Voldemar, 1873-1968
28. Voll, Johannes

1. Johannes Mittus, vasevalamise tööstus

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