Toggle navigation
Publications
Profiles
Research Groups
Indexes
Help and information
Eesti keeles
Intranet
Publications
Profiles
Research Groups
Indexes
Help and information
Eesti keeles
Intranet
Databases
Publications
Searching
My bookmarks
0
Ubar, Raimund-Johannes (author)
All fields
Source search
Author search
Subject term search
Title search
starts with
containes
exact match
All fields
Source search
Author search
Subject term search
Title search
starts with
containes
exact match
—
All fields
Source search
Author search
Subject term search
Title search
starts with
containes
exact match
—
All fields
Source search
Author search
Subject term search
Title search
starts with
containes
exact match
—
All fields
Source search
Author search
Subject term search
Title search
starts with
containes
exact match
—
Add criteria
Advanced search
filter
Clear
×
types of item
book
..
journal article
..
newspaper article
..
book article
..
dissertation
..
Open Access
..
Scientific publication
..
year
year of publication
Loading..
author
Loading..
TTÜ department
Loading..
subject term
Loading..
series
Loading..
name of the person
Loading..
keyword
Loading..
Clear
Number of records
834
Look more..
(4/141)
Export
export all inquiry results
(834)
Save TXT fail
Save PDF fail
print
Open for editing with marked entries
my bookmarks
display
Bibliographic view
Short view
sort
author ascending
author descending
year of publication ascending
year of publication descending
title ascending
title descending
301
book article
Functional test program generation for digital systems
Ubar, Raimund-Johannes
;
Dušina, Julia
;
Krupnova, Helena
;
Storožev, Sergei
;
Zaugarov, Viktor
Testmethoden und Zuverlässigkeit von Schaltungen und Systemen : proceedings of the 6th workshop, Vaals (Niederlande), March 6-8, 1994
1994
/
p. 14-18: ill
book article
302
book article
Funktsionaalsete alternatiivsete graafide mudeli süntees digitaallülitustele
Kivi, E.
;
Ubar, Raimund-Johannes
XXXII üliõpilaste teaduslik-tehnilise konverentsi ettekannete teesid : pühendatud V. I. Lenini 110. sünniaastapäevale : 16.-18. aprill 1980
1981
/
lk. 91
https://www.ester.ee/record=b1322611*est
book article
303
book article
GA-based test generation for sequential circuits
Brik, Marina
;
Raik, Jaan
;
Ubar, Raimund-Johannes
;
Ivask, Eero
Proceedings of East–West Design & Test Workshop (EWDTW’04) : Yalta, Alushta, Crimea, Ukraine, September 23-26, 2004
2004
/
p. 30-34
book article
304
book article
Gate-level modelling of NBTI-induced delays under process variations
Copetti, Thiago
;
Cardoso Medeiros, Guilherme
;
Bolzani Poehls, Leticia
;
Vargas, Fabian
;
Kostin, Sergei
;
Jenihhin, Maksim
;
Raik, Jaan
;
Ubar, Raimund-Johannes
LATS 2016 : 17th IEEE Latin-American Test Symposium, Foz do Iguacu, Brazil, 6th-9th April 2016
2016
/
p. 75-80 : ill
http://dx.doi.org/10.1109/LATW.2016.7483343
book article
305
book article
Generating directed tests for C programs using RTL ATPG
Raik, Jaan
;
Drenkhan, Tiia
;
Jenihhin, Maksim
;
Viilukas, Taavi
;
Karputkin, Anton
;
Tšepurov, Anton
;
Ubar, Raimund-Johannes
Proceedings of the IEEE 13th Workshop on RTL and High Level Testing (WRTLT'12)
2012
/
p. 1-6
book article
306
book article
Generation of tests for the localization of single gate design errors in combinational circuits using the stuck-at fault model
Ubar, Raimund-Johannes
;
Borrione, Dominique
XI Brasilian Symposium on Integrated Circuit Design, September 30 - October 3, 1998, Rio de Janeiro, Brazil : proceedings
1998
/
p. 51-54
book article
307
book article
Generic interconnect BIST for Network-on-Chip
Jutman, Artur
;
Ubar, Raimund-Johannes
;
Raik, Jaan
DDECS : 8th IEEE Workshop on Design and Diagnostics of Electronic Circuits and Systems : April 13-16, 2005, Sopron, Hungary : proceedings
2005
/
p. 224-227 : ill
book article
308
journal article
Guest editorial
Lande, Tor Sverre
;
Ubar, Raimund-Johannes
Analog integrated circuits and signal processing
1999
/
1, p. 5-6
journal article
309
journal article
[H. Bleeker, P.Van Den Eijnden, F.De Jong. Boundary-scan test. Boston : Kluwer Academic, 1993. 225 p. : book review]
Ubar, Raimund-Johannes
Engineering applications of artificial intelligence
1994
/
p. 86-87
https://www.ester.ee/record=b1200126*est
journal article
310
book
Handbook of testing electronic systems
Novak, Ondrej
;
Gramatova, Elena
;
Ubar, Raimund-Johannes
;
Jutman, Artur
;
Raik, Jaan
2005
https://www.ester.ee/record=b2102523*est
book
311
newspaper article
Hea teaduse odav väljamüük
Ubar, Raimund-Johannes
Postimees
2017
/
lk. 6
https://teadus.postimees.ee/4343295/raimund-ubar-hea-teaduse-odav-valjamuuk
newspaper article
312
book article
Hierarchical analysis of short defects between metal lines in CMOS IC
Pleskacz, Witold A.
;
Jenihhin, Maksim
;
Raik, Jaan
;
Rakowski, Michal
;
Ubar, Raimund-Johannes
;
Kuzmicz, Wieslaw
Proceedings : 11th EUROMICRO Conference on Digital System Design : Architectures, Methods and Tools : (DSD 2008) : September 3-5, 2008, Parma, Italy
2008
/
p. 729-734 : ill
book article
313
book article
Hierarchical approach to test generation for digital systems at system, circuit and defect levels
Ubar, Raimund-Johannes
45. Internationales Wissenschaftliches Kolloquium, 04.-06.10.2000 : Tagungsband
2000
/
S. 711-716 : Ill
book article
314
journal article
Hierarchical approaches to test generation and fault simulation
Ubar, Raimund-Johannes
Radioelectronics and informatics
2003
/
p. 204
journal article
315
book article
A hierarchical automatic test pattern generator based on using alternative graphs
Brik, Marina
;
Jervan, Gert
;
Markus, Antti
;
Raik, Jaan
;
Ubar, Raimund-Johannes
Proceedings of the 4th International Workshop Mixed Design of Integrated Circuits and Systems : MIXDES'97 : Poznan, Poland, 12-14 June 1997
1997
/
p. 415-420
book article
316
book article
Hierarchical calculation of malicious faults for evaluating the fault-tolerance
Ubar, Raimund-Johannes
;
Devadze, Sergei
;
Jenihhin, Maksim
;
Raik, Jaan
;
Jervan, Gert
;
Ellervee, Peeter
Proceedings : Fourth IEEE International Symposium on Electronic Design, Test and Applications : [DELTA 2008] : 23-25 January 2008, Hong Kong, SAR, China
2008
/
p. 222-227 : ill
book article
317
book article
Hierarchical concurrent test generation for synchronous sequential circuits
Ubar, Raimund-Johannes
;
Brik, Marina
Proceedings of the 7th International Conference Mixed Design of Integrated Circuits and Systems : MIXDES 2000 : Gdynia, Poland, 15-17 June 2000
2000
/
p. 533-538 : ill
book article
318
book article
Hierarchical defect level test quality analysis
Blyzniuk, M.
;
Cibakova, Tatiana
;
Gramatova, Elena
;
Kuzmicz, W.
;
Lobur, M.
;
Pleskacz, Witold A.
;
Raik, Jaan
;
Ubar, Raimund-Johannes
VILAB User Forum
2000
/
[11] p
book article
319
book article
Hierarchical defect-oriented fault simulation for digital circuits
Blyzniuk, M.
;
Cibakova, Tatiana
;
Gramatova, Elena
;
Kuzmicz, W.
;
Lobur, M.
;
Pleskacz, Witold A.
;
Raik, Jaan
;
Ubar, Raimund-Johannes
IEEE European Test Workshop : 23-26 May 2000, Cascais, Portugal : ETW 2000 : proceedings
2000
/
p. 69-74 : ill
book article
320
book article
Hierarchical defect-oriented fault simulation for digital circuits
Blyzniuk, M.
;
Cibakova, Tatiana
;
Gramatova, Elena
;
Kuzmicz, W.
;
Lobur, M.
;
Pleskacz, Witold A.
;
Raik, Jaan
;
Ubar, Raimund-Johannes
IEEE European Test Workshop
2000
/
p. 151-156
https://ieeexplore.ieee.org/document/873781
book article
321
book article
Hierarchical design error diagnosis in combinational circuits by stuck-at fault test patterns
Ubar, Raimund-Johannes
;
Jutman, Artur
Proceedings of the 6th International Conference on Mixed Design of Integrated Circuits and Systems : MIXDES'99 : Krakow, Poland, 17-19 June 1999
1999
/
p. 437-442 : ill
book article
322
book article
Hierarchical fault diagnosis in embedded digital systems with multi-level decision diagrams [Electronic resource]
Ubar, Raimund-Johannes
;
Evartson, Teet
;
Lensen, Harri
;
Aarna, Margit
5th International Conference on Industrial Automation = Cinquieme Conference Internationale sur l'Automatisation Industrielle : June 11-13, 2007, Montreal, Canada
2007
/
[6] p. [CD-ROM]
book article
323
book article
Hierarchical fault simulation for finite state machines
Brik, Marina
;
Raik, Jaan
;
Ubar, Raimund-Johannes
The 7th Biennial Conference on Electronics and Microsystem Technology "Baltic Electronics Conference" : BEC 2000 : October 8 - 11, 2000, Tallinn, Estonia : conference proceedings
2000
/
p. 145-148 : ill
book article
324
book article
Hierarchical fault simulation in digital systems
Ubar, Raimund-Johannes
;
Raik, Jaan
;
Ivask, Eero
;
Brik, Marina
International Symposium on Signals, Circuits and Systems : SCS 2001 : July 10-11, 2001, Iasi, Romania : proceedings
2001
/
p. 181-184 : ill
book article
325
book article
Hierarchical identification of NBTI-critical gates in nanoscale logic
Kostin, Sergei
;
Raik, Jaan
;
Ubar, Raimund-Johannes
;
Jenihhin, Maksim
LATW2014 : 15th IEEE Latin-American Test Workshop : Fortaleza, Brazil, March 12th-15th, 2014
2014
/
[6] p. : ill
book article
Number of records 834, displaying
301 - 325
previous
9
10
11
12
13
14
15
16
17
18
next
CV
57
1.
Ubar, Raimund-Johannes 1941
2.
Räämet, Raimund 1918-2004
3.
Aare, Johannes 1915-2000
4.
Ahrenschild, Johannes (-1936)
5.
Alaots, Johannes
6.
Aljak, Arnold Johannes
7.
Allik, Erich-Johannes
8.
Avik, Eduard Johannes
9.
Drechsler, Wolfgang Johannes Max
10.
Ehala, Johannes 1986
11.
Hint, Johannes 1914-1985
12.
Johannes, Ille 1939
13.
Johannson, Johannes
14.
Johanson, Johannes
15.
Juhans, Johannes 1874-1956
16.
Kajander, Aleksi Oskar Johannes 1994
17.
Kiiwet, Johannes
18.
Kiivet, Johannes 1879-1967
19.
Kivit, Johannes
20.
Kollist, Johannes 1884-1937
21.
Kollist, Johannes Theodor
22.
Korv, August Johannes 1911-1981
23.
Krimmer, Robert Johannes
24.
Käpp, Martin Johannes
25.
Langel, Johannes 1900-1985
26.
Langell, Johannes
27.
Livländer, Robert Johannes
28.
Madise, Johannes 1920
29.
Meitre, Johannes 1906-1978
30.
Messer, Johannes
31.
Muru, Johannes 1995
32.
Mäll, Johannes 1911-1981
33.
Mühlman, Johannes
34.
Mühlmann, Johannes 1888-1936
35.
Notermans, Antonius Johannes Hubertus 1959
36.
Nuudi, Johannes 1895-1975
37.
Palo, Johannes 1925-1960
38.
Pals, Johannes 1903-1941
39.
Pello, Johannes 1958
40.
Pervik, Johannes 1892-1958
41.
Presmann, Johannes 1942
42.
Putk, Aksel-Johannes 1928-1999
43.
Püümann, Mait Johannes
44.
Renter, Olav-Johannes
45.
Roes, Johannes 1914
46.
Russwurm, Johannes
47.
Russvurm, Johannes 1855-1939
48.
Russvurm, Johannes Carl Gysbert Immanuel
49.
Sakeus, Johannes 1880-1934
50.
Taimsalu, Johannes 1891-1942
51.
Teiman, Johannes
52.
Teimann, Johannes Rudolf (kuni 22.05.1935)
53.
Tomson, Johannes
54.
Tuulre, Feliks Johannes 1908-1987
55.
Veerus, Johannes Voldemar 1897-1972
56.
Verus, Johannes Voldemar
57.
Vuhk, Oskar Johannes
author
56
1.
Ubar, Raimund-Johannes
2.
Hagelberg, Raimund
3.
Räämet, Raimund
4.
Aare, Johannes
5.
Avik, Eduard Johannes
6.
Bauer, Johannes
7.
Bender, Naatan Johannes
8.
Buchmann, Johannes
9.
Deelstra, Johannes
10.
Ehala, Johannes
11.
Engelmayer, Johannes
12.
Gotzmann, Johannes
13.
Helander, Johannes
14.
Hint, Johannes
15.
Hüsse, Johannes
16.
Johannes, Anu
17.
Johannes, Ellen
18.
Johannes, Ille
19.
Johannes, Kaljo-Mihkel
20.
Järv, Johannes
21.
Kadak, Johannes
22.
Kajander, Aleksi Oskar Johannes
23.
Karstensen, Johannes
24.
Kerkhoven, Eduard Johannes
25.
Kiivet, Johannes
26.
Krimmer, Robert Johannes
27.
Kukebal, Johannes
28.
Meitre, Johannes
29.
Miller, Johannes
30.
Mühlman, Johannes
31.
Norberg, Johannes
32.
Notermans, Antonius Johannes Hubertus
33.
Ortlepp, Johannes
34.
Parikas, Johannes
35.
Pello, Johannes
36.
Pervik, Johannes-Eduard
37.
Piiper, Johannes
38.
Presmann, Johannes
39.
Putk, Aksel-Johannes
40.
Pätsch, Johannes
41.
Saar, Johannes
42.
Sautter, Johannes
43.
Sinisalo, Touko Johannes
44.
Steinbrunn, Johannes
45.
Sutt, Johannes
46.
Zeiringer, Johannes Paul
47.
Taimsalu, Johannes
48.
Talu, Martin Johannes
49.
Tammekänd, Johannes
50.
Tilk, Johannes
51.
Tralla, Johannes
52.
Veerus, Johannes
53.
Vibur, Johannes Ferdinand
54.
Vind, Johannes
55.
Voll, Johannes
56.
Voltri, Johannes
name of the person
27
1.
Ubar, Raimund-Johannes, 1941-
2.
Hagelberg, Raimund, 1927-2012
3.
Räämet, Raimund, 1918-2004
4.
Aare, Johannes, 1915-2000
5.
Aavik, Johannes, 1880-1973
6.
Avik, Eduard Johannes, 1891-1942
7.
Bender, Naatan Johannes
8.
Granö, Johannes Gabriel
9.
Hint, Johannes, 1914-1985
10.
Johannes Paulus II, paavst, 1920-2005
11.
Kert, Johannes
12.
Kiivet, Johannes, 1879-1967
13.
Kollist, Johannes
14.
Käis, Johannes
15.
Lang, Johannes
16.
Maide, Johannes Voldemar
17.
Mossov, Johannes
18.
Pals, Johannes, 1903-1941
19.
Pello, Johannes
20.
Putk, Aksel-Johannes
21.
Rammul, Aleksander Johannes, 1875-1949
22.
Steinbrunn, Johannes
23.
Taimsalu, Johannes, 1891-1942
24.
Talu, Martin Johannes
25.
Veerus, Johannes Voldemar, 1897-1972
26.
Veski, Johannes Voldemar, 1873-1968
27.
Voll, Johannes
subject term
1
1.
Johannes Mittus, vasevalamise tööstus
×
vaste
starts with
ends with
containes
sort
Relevance
ascending
descending
year of publication
author
TTÜ department
subject term
series
name of the person
keyword
Otsing
Valikud
0
year of publication
AND
OR
NOT
author
AND
OR
NOT
TTÜ department
AND
OR
NOT
subject term
AND
OR
NOT
series
AND
OR
NOT
name of the person
AND
OR
NOT
keyword
AND
OR
NOT