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Implementation-independent functional test generation for RISC microprocessors (title)
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book article
Implementation-independent functional test generation for RISC microprocessors
Oyeniran, Adeboye Stephen
;
Ubar, Raimund-Johannes
;
Jenihhin, Maksim
;
Raik, Jaan
VLSI-SoC 2019 : 27th IFIP/IEEE International Conference on Very Large Scale Integration : [proceedings]
2019
/
p. 82-87 : ill
https://doi.org/10.1109/VLSI-SoC.2019.8920323
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keyword
19
1.
implementation-independent test generation
2.
Implementation-Independent Testing of Microprocessors
3.
functional test generation
4.
functional self-test
5.
adaptive test strategy generation
6.
automated test pattern generation
7.
automatic test case generation
8.
automatic test pattern generation
9.
automatic test program generation
10.
behaviour level test generation
11.
Hierarchical Multi-level Test Generation
12.
high-level test data generation
13.
highlevel test generation
14.
offline test generation
15.
provably correct test generation
16.
test generation
17.
test generation and fault diagnosis
18.
Test Group Generation for Detecting Multiple Faults
19.
test program generation
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