Toggle navigation
Publikatsioonid
Profiilid
Uurimisrühmad
Registrid
Abi ja info
Switch to English
Intranet
Publikatsioonid
Profiilid
Uurimisrühmad
Registrid
Abi ja info
English
Intranet
Andmebaasid
Publikatsioonid
Otsing
Valitud kirjed
0
register-transfer level (võtmesõna)
Kõikidelt väljadelt
Allika otsing
Autori otsing
Märksõna otsing
Pealkirja otsing
sõna
algab
täpne vaste
vabatekst
Kõikidelt väljadelt
Allika otsing
Autori otsing
Märksõna otsing
Pealkirja otsing
sõna
algab
täpne vaste
vabatekst
—
Kõikidelt väljadelt
Allika otsing
Autori otsing
Märksõna otsing
Pealkirja otsing
sõna
algab
täpne vaste
vabatekst
—
Kõikidelt väljadelt
Allika otsing
Autori otsing
Märksõna otsing
Pealkirja otsing
sõna
algab
täpne vaste
vabatekst
—
Kõikidelt väljadelt
Allika otsing
Autori otsing
Märksõna otsing
Pealkirja otsing
sõna
algab
täpne vaste
vabatekst
—
Lisa tingimus
Liitotsing
filter
Tühista
×
teaviku laadid
raamat
..
artikkel ajakirjas
..
artikkel ajalehes
..
artikkel kogumikus
..
dissertatsioon
..
Open Access
..
Teaduspublikatsioon
..
aasta
ilmumisaasta
Toon andmeid..
autor
Toon andmeid..
TTÜ struktuuriüksus
Toon andmeid..
märksõna
Toon andmeid..
seeria-sari
Toon andmeid..
tema kohta
Toon andmeid..
võtmesõna
Toon andmeid..
Tühista
Kirjeid leitud
4
Vaata veel..
(1/220)
Ekspordi
ekspordi kõik päringu tulemused
(4)
Salvesta TXT fail
prindi
Märgitud kirjetega toimetamiseks ava
valitud kirjed
kuva
Bibliokirje
Lühikirje
reasta
autor kasvavalt
autor kahanevalt
ilmumisaasta kasvavalt
ilmumisaasta kahanevalt
pealkiri kasvavalt
pealkiri kahanevalt
1
artikkel kogumikus
Fast RTL fault simulation using decision diagrams and bitwise set operations
Reinsalu, Uljana
;
Raik, Jaan
;
Ubar, Raimund-Johannes
;
Ellervee, Peeter
2011 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) : 3-5 October 2011, Vancouver, Canada
2011
/
p. 164-170
https://ieeexplore.ieee.org/document/6104440
artikkel kogumikus
2
artikkel ajakirjas
Identifying untestable faults in sequential circuits using test path constraints
Viilukas, Taavi
;
Karputkin, Anton
;
Raik, Jaan
;
Jenihhin, Maksim
;
Ubar, Raimund-Johannes
;
Fujiwara, Hideo
Journal of electronic testing : theory and applications (JETTA)
2012
/
p. 511-521 : ill
https://link.springer.com/article/10.1007/s10836-012-5312-5
artikkel ajakirjas
3
artikkel ajakirjas
On the reuse of TLM mutation analysis at RTL
Guarnieri, Valerio
;
Hantson, Hanno
;
Raik, Jaan
;
Jenihhin, Maksim
;
Ubar, Raimund-Johannes
Journal of electronic testing : theory and applications
2012
/
p. 435-448 : ill
https://link.springer.com/article/10.1007/s10836-012-5303-6
artikkel ajakirjas
4
artikkel kogumikus EST
/
artikkel kogumikus ENG
SynAssert: automated synthesis of CSCA leakage patterns into cost-effective security assertions
Azarpeyvand, Ali Azarpeyvand
;
Eslami, Mohammad
;
Jervan, Gert
;
Raik, Jaan
;
Ghasempouri, Tara
Proceedings of 2025 IEEE Computer Society Annual Symposium on VLSI (ISVLSI)
2025
/
6 p. : ill
https://doi.org/10.1109/ISVLSI65124.2025.11130310
Conference proceedings at Scopus
Article at Scopus
Article at WOS
artikkel kogumikus EST
/
artikkel kogumikus ENG
Kirjeid leitud 4, kuvan
1 - 4
võtmesõna
220
1.
register-transfer level
2.
Register-Transfer Level (RTL)
3.
Register Transfer Level - RTL
4.
register transfer level modeling decision diagams
5.
register transfer and gate level simulation
6.
gate and register transfer levels
7.
diffusion (mass transfer, heat transfer)
8.
logic level and high level BDDs
9.
Swedish Cancer Register
10.
acoustic transfer impedance
11.
acyl transfer
12.
bidirectional power transfer
13.
capacitive power transfer
14.
cash transfer
15.
charge transfer
16.
compound heat transfer enhancement technique
17.
cross-city model transfer
18.
desined heat transfer coefficient
19.
Ekman transfer
20.
energy transfer
21.
frozen embryo transfer
22.
gene transfer
23.
general theory of information transfer
24.
generic transfer functions
25.
heat- and mass transfer
26.
heat mass transfer
27.
heat transfer
28.
heat transfer coefficient
29.
heat transfer enhancement
30.
heat transfer fluids
31.
implicit fractional transfer function
32.
inductive pover transfer
33.
inductive power transfer
34.
inductive power transfer (IPT)
35.
inductive wireless power transfer link
36.
international knowledge transfer
37.
intramolecular charge transfer
38.
knowledge transfer
39.
knowledge transfer office
40.
mass transfer
41.
methyl transfer
42.
moisture transfer
43.
net transfer capacity
44.
on-device transfer learning
45.
orced convection heat transfer coefficent
46.
phase-transfer catalysis
47.
plasma transfer arc welding
48.
policy transfer
49.
power transfer distribution factor
50.
radiative recombination transfer function
51.
REST (Representational State Transfer)
52.
reverse power transfer
53.
risk transfer
54.
single electron transfer
55.
spectral transfer function
56.
targeted energy transfer (TET)
57.
technology transfer
58.
technology transfer and diffusion
59.
technology transfer network
60.
technology transfer office
61.
technology-transfer processes
62.
technology-transfer processes
63.
transfer
64.
transfer equations
65.
transfer equivalence
66.
transfer function
67.
transfer functions
68.
transfer learning
69.
transfer of knowledge
70.
transport processes/heat transfer
71.
university technology transfer
72.
wireless power transfer
73.
absolute sea level
74.
airport level of service
75.
arousal level
76.
assurance level
77.
behaviour level test generation
78.
bi-level optimization
79.
CO2 level in classrooms
80.
CO2 level in classrooms and kindergartens
81.
confidence level
82.
country-level logistics
83.
Cross-level Modeling of Faults in Digital Systems
84.
customer compatibility level
85.
deep level
86.
deep level traps
87.
determination of the CO2 level
88.
determining the level of creatine
89.
digitalisation level
90.
distribution-level phasor measurement units (D-PMUs)
91.
education level
92.
exposure level
93.
extreme low-water level
94.
extreme penetration level of non synchronous generation
95.
extreme sea-level prediction
96.
extreme water level
97.
gate-level analysis
98.
gate-level circuit abstraction
99.
gate-level netlist
100.
graduate level
101.
Hierarchical Multi-level Test Generation
102.
hierarchical two-level analysis
103.
high level DD (HLDD)
104.
high level of security
105.
high level synthesis
106.
high-level control fault model
107.
high-level control faults
108.
high-level decision diagram
109.
high-level decision diagrams
110.
high-level decision diagrams (HLDD) synthesis
111.
High-level Decision Diagrams for Modeling Digital Systems
112.
high-level expert group on AI
113.
high-level fault coverage
114.
high-level fault model
115.
high-level fault simulation
116.
high-level functional fault model
117.
high-level synthesis
118.
High-Level Synthesis (HLS)
119.
high-level synthesis for test
120.
high-level test data generation
121.
improvement of safety level at enterprises
122.
improvement of safety level at SMEs
123.
initial level of security
124.
lake level
125.
lake-level fluctuations
126.
level control
127.
level crossing
128.
level ice
129.
Level of paranoia
130.
level set
131.
level(s) methodology
132.
level-crossing ADC
133.
level-crossing analog-to-digital converters
134.
level-crossing analogue-to-digital converters (ADC)
135.
logic level
136.
lower trophic level models
137.
low-level
138.
low-level control system transportation
139.
low-level fault redundancy
140.
low-level radiation
141.
Low-level RF EMF
142.
macro-level industry influences
143.
mean sea level
144.
medium level of security
145.
module level power electronics (MLPE)
146.
module-level power electronics (MLPE)
147.
multi-level governance
148.
multi-level inverter
149.
multi-level leadership
150.
multi-level modeling
151.
multi-level perspective
152.
multi-level perspective of sustainability transitions
153.
multi-level selection and processing environment
154.
noise level
155.
operational level (OL)
156.
Price level
157.
Process/Product Sigma Performance Level (PSPL)
158.
PV module level power electronics
159.
relative sea level
160.
relative sea level changes
161.
relative sea-level change
162.
RH level
163.
school-level policies
164.
sea level
165.
sea level forecasting
166.
sea level prediction
167.
sea level reconstruction
168.
sea level rise
169.
sea level series
170.
sea level trend
171.
sea level: variations and mean
172.
sea-level
173.
sea-level changes
174.
sea-level equation
175.
Sea-level indicator
176.
sea-level prediction
177.
sea-level rise
178.
sea-level trend
179.
Security Level Evaluation
180.
service-level agreements
181.
seven-level multilevel
182.
Sigma performance level
183.
skin conductance level
184.
software level TMR
185.
software security level
186.
steel-level bureaucracy
187.
strategic level decision makers
188.
sufficient level of security
189.
system level
190.
system level hazards
191.
system level simulation
192.
system level test
193.
system planning level
194.
system-level analysis
195.
system-level evaluation
196.
task-level uninterrupted presence
197.
three-level
198.
three-level converter
199.
three-level inverter
200.
three-level neutral-point-clamped inverter
201.
three-level NPC inverter
202.
three-level T-type
203.
three-level T-type inverter
204.
three-level T-type quasi-impedance-source inverter (3L-T-type qZSI)
205.
three-level voltage inverter
206.
Tool Confidence Level
207.
top-level domain
208.
transaction-level modeling
209.
treatment level
210.
two-level inverter
211.
undergraduate level
212.
university level informatics education
213.
water level
214.
water level fluctuation
215.
water level measurements
216.
water level reconstruction
217.
water-level changes
218.
voltage level
219.
voltage level optimisation
220.
3-level T-type inverter
×
vaste
algab
lõpeb
sisaldab
reasta
Relevantsuse alusel
kasvavalt
kahanevalt
ilmumisaasta
autor
TTÜ struktuuriüksus
märksõna
seeria-sari
tema kohta
võtmesõna
Otsing
Valikud
0
ilmumisaasta
AND
OR
NOT
autor
AND
OR
NOT
TTÜ struktuuriüksus
AND
OR
NOT
märksõna
AND
OR
NOT
seeria-sari
AND
OR
NOT
tema kohta
AND
OR
NOT
võtmesõna
AND
OR
NOT