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Test Group Generation for Detecting Multiple Faults (keyword)
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book
Structural decision diagrams in digital test : theory and applications
Ubar, Raimund-Johannes
;
Raik, Jaan
;
Jenihhin, Maksim
;
Jutman, Artur
2024
https://doi.org/10.1007/978-3-031-44734-1
https://www.ester.ee/record=b5734441*est
book
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20
1.
Test Group Generation for Detecting Multiple Faults
2.
Avoiding Mutual Masking of Multiple Faults
3.
multiple faults
4.
adaptive test strategy generation
5.
automated test pattern generation
6.
automatic test case generation
7.
automatic test pattern generation
8.
automatic test program generation
9.
behaviour level test generation
10.
functional test generation
11.
Hierarchical Multi-level Test Generation
12.
high-level test data generation
13.
highlevel test generation
14.
implementation-independent test generation
15.
offline test generation
16.
provably correct test generation
17.
test generation
18.
test generation and fault diagnosis
19.
test program generation
20.
multiple-input multiple output system
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