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Hierarchical test generation for finite state machines (title)
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book article
Hierarchical test generation for finite state machines
Brik, Marina
;
Ubar, Raimund-Johannes
BEC : Baltic Electronics Conference : proceedings of the 4th Biennial Conference, October 9-14, 1994, Tallinn (Estonia). 1
1994
/
p. 319-324: ill
book article
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keyword
22
1.
hierarchical finite state machine
2.
finite-state machines
3.
Hierarchical Multi-level Test Generation
4.
Algorithmic State Machines (ASMs)
5.
finite state machine
6.
Finite State Machine - FSM
7.
adaptive test strategy generation
8.
automated test pattern generation
9.
automatic test case generation
10.
automatic test pattern generation
11.
automatic test program generation
12.
behaviour level test generation
13.
functional test generation
14.
high-level test data generation
15.
highlevel test generation
16.
implementation-independent test generation
17.
offline test generation
18.
provably correct test generation
19.
test generation
20.
test generation and fault diagnosis
21.
Test Group Generation for Detecting Multiple Faults
22.
test program generation
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