Toggle navigation
Publications
Profiles
Research Groups
Indexes
Help and information
Eesti keeles
Intranet
Publications
Profiles
Research Groups
Indexes
Help and information
Eesti keeles
Intranet
Databases
Publications
Searching
My bookmarks
0
Representing transparency conditions in test generation for VLSI by decision diagrams (title)
All fields
Source search
Author search
Subject term search
Title search
starts with
containes
exact match
All fields
Source search
Author search
Subject term search
Title search
starts with
containes
exact match
—
All fields
Source search
Author search
Subject term search
Title search
starts with
containes
exact match
—
All fields
Source search
Author search
Subject term search
Title search
starts with
containes
exact match
—
All fields
Source search
Author search
Subject term search
Title search
starts with
containes
exact match
—
Add criteria
Advanced search
filter
Clear
×
types of item
book
..
journal article
..
newspaper article
..
book article
..
dissertation
..
Open Access
..
Scientific publications
..
year
year of publication
Loading..
author
Loading..
TalTech department
Loading..
subject term
Loading..
series
Loading..
name of the person
Loading..
keyword
Loading..
Clear
Number of records
1
Look more..
(1/26)
Export
export all inquiry results
(1)
Save TXT fail
print
Open for editing with marked entries
my bookmarks
display
Bibliographic view
Short view
sort
author ascending
author descending
year of publication ascending
year of publication descending
title ascending
title descending
1
book article
Representing transparency conditions in test generation for VLSI by decision diagrams
Ubar, Raimund-Johannes
Proceedings of the First Electronic Circuits and Systems Conference : Bratislava, Slovakia, September 4-5, 1997
1997
/
p. 213-216
book article
Number of records 1, displaying
1 - 1
keyword
26
1.
Binary Decision Diagrams
2.
binary decision diagrams (BDD)
3.
decision diagrams
4.
highlevel decision diagrams
5.
high-level decision diagrams
6.
high-level decision diagrams (HLDD) synthesis
7.
High-level Decision Diagrams for Modeling Digital Systems
8.
shared structurally synthesized Binary Decision Diagrams
9.
Structural Decision Diagrams for Modeling Digital Circuits
10.
adaptive test strategy generation
11.
automated test pattern generation
12.
automatic test case generation
13.
automatic test pattern generation
14.
automatic test program generation
15.
behaviour level test generation
16.
functional test generation
17.
Hierarchical Multi-level Test Generation
18.
high-level test data generation
19.
highlevel test generation
20.
implementation-independent test generation
21.
offline test generation
22.
provably correct test generation
23.
test generation
24.
test generation and fault diagnosis
25.
Test Group Generation for Detecting Multiple Faults
26.
test program generation
×
match
starts with
ends with
containes
sort
Relevance
ascending
descending
year of publication
author
TalTech department
subject term
series
name of the person
keyword
Otsing
Valikud
0
year of publication
AND
OR
NOT
author
AND
OR
NOT
TalTech department
AND
OR
NOT
subject term
AND
OR
NOT
series
AND
OR
NOT
name of the person
AND
OR
NOT
keyword
AND
OR
NOT