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Automatic test generation system for VLSI (title)
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book article
Automatic test generation system for VLSI
Jervan, Gert
;
Markus, Antti
;
Raik, Jaan
;
Ubar, Raimund-Johannes
Proceedings of the First Electronic Circuits and Systems Conference : Bratislava, Slovakia, September 4-5, 1997
1997
/
p. 255-258
book article
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keyword
27
1.
automatic test case generation
2.
automatic test pattern generation
3.
automatic test program generation
4.
automatic code generation
5.
Automatic generation control
6.
automatic GUI model generation
7.
Automatic identification system
8.
automatic identification system (AIS)
9.
adaptive test strategy generation
10.
automated test pattern generation
11.
behaviour level test generation
12.
functional test generation
13.
Hierarchical Multi-level Test Generation
14.
high-level test data generation
15.
highlevel test generation
16.
implementation-independent test generation
17.
offline test generation
18.
provably correct test generation
19.
test generation
20.
test generation and fault diagnosis
21.
Test Group Generation for Detecting Multiple Faults
22.
test program generation
23.
Board and System Test
24.
IEEE 9 bus test system
25.
system level test
26.
VLSI
27.
VLSI circuits
subject term
1
1.
VLSI-ahelad
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