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Efficient hierarchical approach to test generation for digital systems (title)
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book article
Efficient hierarchical approach to test generation for digital systems
Ubar, Raimund-Johannes
;
Raik, Jaan
IEEE ISQED 2000 : proceedings of the IEEE 2000 1st International Symposium on Quality Electronic Design : March 20-22, 2000, San Jose, California
2000
/
p. 189-195 : ill
https://ieeexplore.ieee.org/document/838873
book article
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keyword
28
1.
Hierarchical Multi-level Test Generation
2.
adaptive test strategy generation
3.
automated test pattern generation
4.
automatic test case generation
5.
automatic test pattern generation
6.
automatic test program generation
7.
behaviour level test generation
8.
functional test generation
9.
high-level test data generation
10.
highlevel test generation
11.
implementation-independent test generation
12.
offline test generation
13.
provably correct test generation
14.
test generation
15.
test generation and fault diagnosis
16.
Test Group Generation for Detecting Multiple Faults
17.
test program generation
18.
digital test
19.
Digital test and testable design
20.
distributed generation systems
21.
Cross-level Modeling of Faults in Digital Systems
22.
digital circuits and systems
23.
digital control systems
24.
digital product-service systems
25.
digital social systems
26.
digital systems
27.
High-level Decision Diagrams for Modeling Digital Systems
28.
teaching design and test of systems
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