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GA-based test generation for sequential circuits (title)
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book article
GA-based test generation for sequential circuits
Brik, Marina
;
Raik, Jaan
;
Ubar, Raimund-Johannes
;
Ivask, Eero
Proceedings of East–West Design & Test Workshop (EWDTW’04) : Yalta, Alushta, Crimea, Ukraine, September 23-26, 2004
2004
/
p. 30-34
book article
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keyword
27
1.
combinational and sequential circuits
2.
sequential circuits
3.
adaptive test strategy generation
4.
automated test pattern generation
5.
automatic test case generation
6.
automatic test pattern generation
7.
automatic test program generation
8.
behaviour level test generation
9.
functional test generation
10.
Hierarchical Multi-level Test Generation
11.
high-level test data generation
12.
highlevel test generation
13.
implementation-independent test generation
14.
offline test generation
15.
provably correct test generation
16.
test generation
17.
test generation and fault diagnosis
18.
Test Group Generation for Detecting Multiple Faults
19.
test program generation
20.
Activity-based demand generation
21.
template based sql generation
22.
Automated Synthesis of Software-based Self-test
23.
FPGA based test
24.
rtioco-based timed test sequences
25.
software based self-test
26.
software-based self-test
27.
software-based self-test (SBST)
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