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testimine (subject term)
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226
book article
Hybrid BIST optimization using reseeding and test set compaction
Jervan, Gert
;
Orasson, Elmet
;
Kruus, Helena
;
Ubar, Raimund-Johannes
10th Euromicro Conference on Digital System Design Architectures, Methods and Tools, DSD 2007 : 29-31 August 2007, Lübeck, Germany : proceedings
2007
/
p. 596-603 : ill
http://dx.doi.org/10.1109/DSD.2007.4341529
book article
227
journal article
Hybrid BIST optimization using reseeding and test set compaction
Jervan, Gert
;
Orasson, Elmet
;
Kruus, Helena
;
Ubar, Raimund-Johannes
Microprocessors and microsystems
2008
/
5/6, p. 254-262 : ill
https://www.sciencedirect.com/science/article/abs/pii/S0141933108000288
journal article
228
book article
Hybrid BIST scheduling for NoC-based SoCs
Jervan, Gert
;
Shchenova, Tatjana
;
Ubar, Raimund-Johannes
Proceedings [of] 24th IEEE Norchip Conference : Linköping, Sweden, 20-21 November 2006
2006
/
p. 141-144 : ill
https://ieeexplore.ieee.org/document/4126966
book article
229
book article
Hybrid BIST time minimization for core-based systems with STUMPS architecture
Jervan, Gert
;
Eles, Petru
;
Peng, Zebo
;
Ubar, Raimund-Johannes
;
Jenihhin, Maksim
18th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems : 3-5 November 2003, Boston, Massachusetts : proceedings
2003
/
p. 225-232 : ill
https://ieeexplore.ieee.org/document/1250116
book article
230
dissertation
Hybrid built-in self-test : methods and tools for analysis and optimization of BIST = Sisseehitatud hübriidne isetestimine : meetodid ja vahendid analüüsiks ning optimeerimiseks
Orasson, Elmet
2007
https://www.ester.ee/record=b2305436*est
dissertation
231
book
Hybrid built-in self-test and test generation techniques for digital systems
Jervan, Gert
2005
https://www.ester.ee/record=b2177537*est
book
232
book article
Hybrid functional BIST for digital systems
Mazurova, Natalja
;
Smahtina, Julia
;
Ubar, Raimund-Johannes
BEC 2004 : proceedings of the 9th Biennial Baltic Electronics Conference : October 3-6, 2004, Tallinn, Estonia
2004
/
p. 205-208 : ill
book article
233
book article
Hydraulic conductivity testing method for all-in aggregates and mining waste materials
Šommet, Julija
;
Pastarus, Jüri-Rivaldo
;
Sabanov, Sergei
10th International Symposium "Topical Problems in the Field of Electrical and Power Engineering”. Doctoral School of Energy and Geotechnology II : Pärnu, Estonia, January 10-15, 2011
2011
/
p. 122-126 : ill
book article
234
journal article
Hygrothermal calculations and laboratory tests on timber-framed wall structures
Kalamees, Targo
;
Vinha, Juha
Building and environment
2003
/
5, p. 689-697 : ill
https://www.sciencedirect.com/science/article/pii/S036013230200207X
journal article
235
book article EST
/
book article ENG
IEEE European Test Symposium (ETS)
Eggersgluss, Stephan
;
Hamdioui, Said
;
Jutman, Artur
;
Michael, Maria K.
;
Raik, Jaan
2019 IEEE International Test Conference (ITC)
2019
/
4 p
https://doi.org/10.1109/ITC44170.2019.9000148
Conference proceeding at Scopus
Article at Scopus
Article at WOS
book article EST
/
book article ENG
236
book article
Implementation-independent functional test for transition delay faults in microprocessors
Oyeniran, Adeboye Stephen
;
Ubar, Raimund-Johannes
;
Jenihhin, Maksim
;
Raik, Jaan
2020 23rd Euromicro Conference on Digital System Design (DSD), 26-28 August 2020, Kranj, Slovenia
2020
/
p. 646-650
https://doi.org/10.1109/DSD51259.2020.00105
book article
237
book article
Implementation-independent functional test generation for RISC microprocessors
Oyeniran, Adeboye Stephen
;
Ubar, Raimund-Johannes
;
Jenihhin, Maksim
;
Raik, Jaan
VLSI-SoC 2019 : 27th IFIP/IEEE International Conference on Very Large Scale Integration : [proceedings]
2019
/
p. 82-87 : ill
https://doi.org/10.1109/VLSI-SoC.2019.8920323
book article
238
book article
An improved estimation methodology for hybrid BIST cost calculation
Jervan, Gert
;
Peng, Zebo
;
Ubar, Raimund-Johannes
;
Korelina, Olga
Proceedings [of] 22nd NORCHIP Conference : Oslo, Norway, 8-9 November 2004
2004
/
p. 297-300 : ill
https://ieeexplore.ieee.org/document/1423882
book article
239
book article
Improved modeling of audio signals by modifying transient locations
Vafin, Renat
;
Heusdens, Richard
;
Par, Steven van de
;
Kleijn, W. Bastiaan
Proceedings of the 2001 IEEE Workshop on Applications of Signal Processing to Audio and Acoustics : October 21-24,2001, Mohonk Mountain House, New Paltz, New York, USA
2001
/
p. 143-143 : ill
https://ieeexplore.ieee.org/document/969563
book article
240
book article
Improving embedded software testing
Savimaa, Raul
SCI 2004 : the 8th World Multi-Conference on Systemics, Cybernetics and Informatics : July 18-21, 2004, Orlando, Florida, USA. Volume 1, Information Systems, Technologies and Applications : proceedings
2004
/
p. 270-274
book article
241
book article EST
/
book article ENG
Inductive and coinductive predicate liftings for effectful programs
Veltri, Niccolò
;
Voorneveld, Niels F.W.
Proceedings 37th Conference on Mathematical Foundations of Programming SemanticsHybrid: Salzburg, Austria and Online, 30th August - 2nd September, 2021
2021
/
p. 260-277
https://doi.org/10.4204/EPTCS.351.16
Conference proceeding at Scopus
Article at Scopus
Article at WOS
book article EST
/
book article ENG
242
book article
Integrated design and test generation under Internet based environment MOSCITO
Schneider, Andre
;
Ivask, Eero
;
Ubar, Raimund-Johannes
Euromicro Symposium on Digital System Design : Architectures, Methods and Tools : September 4-6, 2002, Dortmund, Germany : proceedings
2002
/
p. 187-194 : ill
http://dx.doi.org/10.1109/DSD.2002.1115368
book article
243
journal article EST
/
journal article ENG
Integrated self-regulating resistive heating for isothermal nucleic acid amplification tests (NAAT) in Lab-on-a-Chip (LoC) devices
Pardy, Tamas
;
Tulp, Indrek
;
Kremer, Clemens
;
Rang, Toomas
;
Stewart, Ray
PLoS ONE
2017
/
p. 1-11 : ill
https://doi.org/10.1371/journal.pone.0189968
Journal metrics at Scopus
Article at Scopus
Journal metrics at WOS
Article at WOS
journal article EST
/
journal article ENG
244
book
Intelligent support for expert system verification and testing in object-oriented programming environments : (preprint)
Trausan-Matu, S.
;
Tepandi, Jaak
;
Barbuceanu, M.
1990
book
245
book article
Interaction coefficient for resistance to fragmentation by GOST and EN test results
Koreneva, Julia
;
Šommet, Julija
Road and Rail Infrastructure V : proceedings of the 5th International Conference on Road and Rail Infrastructures – CETRA 2018, 17-19 May 2018, Zadar, Croatia
2018
/
p. 207–214
https://doi.org/10.5592/CO/cetra.2018.896
book article
246
book article
Internet based test generation and fault simulation
Ivask, Eero
;
Ubar, Raimund-Johannes
;
Raik, Jaan
;
Schneider, Andre
IEEE Design and Diagnostics of Electronic Circuits and Systems - IEEE DDECS 2001 : Fourth International Workshop on IEEE Design and Diagnostics of Electronic Circuits and Systems : Györ, Hungary, April 18-20, 2001
2001
/
p. 57-60 : ill
book article
247
book article
Internet-based collaborative test generation with MOSCITO [Electronic resource]
Schneider, Andre
;
Ivask, Eero
;
Miklos, P.
;
Raik, Jaan
;
Diener, Karl-Heinz
;
Ubar, Raimund-Johannes
;
Cibakova, Tatiana
;
Gramatova, Elena
SIGDA publications on CD-ROM : DATE'02 : Design, Automation and Test in Europe, Paris, France, March 4-8, 2002
2002
/
[6] p. [CD-ROM]
https://www.cecs.uci.edu/~papers/date07/PAPERS/2002/DATE02/PDFFILES/02E_2.PDF
book article
248
book article
Internet-based software for teaching test of digital circuits
Ubar, Raimund-Johannes
;
Orasson, Elmet
;
Wuttke, Heinz-Dietrich
23rd International Conference on Microelectronics : MIEL 2002, Niš, Yugoslavia, 12-15 May 2002 : proceedings. Volume 2
2002
/
p. 659-662 : ill
https://ieeexplore.ieee.org/document/1003344
book article
249
book article
Internet-based software for teaching test of digital circuits
Ubar, Raimund-Johannes
;
Jutman, Artur
;
Orasson, Elmet
;
Raik, Jaan
;
Evartson, Teet
;
Wuttke, Heinz-Dietrich
Microelectronics education : proceedings of the 4th European Workshop on Microelectronics Education : EWME 2002, Spain, May 23-24, 2002
2002
/
p. 317-320 : ill
https://ieeexplore.ieee.org/document/1003344
book article
250
book article
Internet-based testability-driven test generation in the virtual environment MOSCITO
Schneider, Andre
;
Diener, Karl-Heinz
;
Elst, G.
;
Ivask, Eero
;
Raik, Jaan
;
Ubar, Raimund-Johannes
International Federation for Information Processing IFIP : International Workshop on IP-Based SoC Design 2002 : proceedings : Grenoble, October 30-31, 2002
2002
/
p. 357-362 : ill
http://publica.fraunhofer.de/dokumente/N-287433.html
book article
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