prindi

Mixed-level defect simulation in data-paths of digital systems

autor
Ubar, Raimund-Johannes
Raik, Jaan
Ivask, Eero
Brik, Marina
vastutusandmed
R.Ubar, J.Raik, E.Ivask, M.Brik
allikas
23rd International Conference on Microelectronics : MIEL 2002, Niš, Yugoslavia, 12-15 May 2002 : proceedings. Volume 2
ilmumiskoht
[S.l.]
kirjastus/väljaandja
IEEE Electron Devices Society
ilmumisaasta
2002
leheküljed
p. 617-620 : ill
ISBN
0-7803-7235-2
märkused
Bibliogr.: 8 ref
Ubar, R.-J., Raik, J., Ivask, E., Brik, M. Mixed-level defect simulation in data-paths of digital systems // 23rd International Conference on Microelectronics : MIEL 2002, Niš, Yugoslavia, 12-15 May 2002 : proceedings. Volume 2. [S.l.] : IEEE Electron Devices Society, 2002. p. 617-620 : ill.