Teaching advanced test issues in digital electronics
vastutusandmed
Raimund Ubar, Elmet Orasson, Jaan Raik, Heinz-Dietrich Wuttke
allikas
Proceedings of the 6th IEEE International Conference on Information Technology Based Higher Education and Training : ITHET : July 7-9, 2005, Juan Dolio, Dominican Republic
ilmumiskoht
[S.l.]
kirjastus/väljaandja
ilmumisaasta
leheküljed
p. S2B-1 - S2B-6 : ill
konverentsi nimetus, aeg
6th IEEE International Conference on Information Technology Based Higher Education and Training, July 7-9, 2005
konverentsi toimumispaik
Juan Dolio, Dominican Republic
ISBN
0-7803-9141-1
märkused
Biobliogr.: 11 ref
TTÜ struktuuriüksus
keel
inglise
võtmesõna
Ubar, R.-J., Orasson, E., Raik, J., Wuttke, H.-D. Teaching advanced test issues in digital electronics // Proceedings of the 6th IEEE International Conference on Information Technology Based Higher Education and Training : ITHET : July 7-9, 2005, Juan Dolio, Dominican Republic. [S.l.] : IEEE, 2005. p. S2B-1 - S2B-6 : ill.