Toggle navigation
Publications
Profiles
Research Groups
Indexes
Help and information
Eesti keeles
Intranet
Publications
Profiles
Research Groups
Indexes
Help and information
Eesti keeles
Intranet
Databases
Publications
Advanced search
My bookmarks
0
processor testing (keyword)
All fields
Source search
Author search
Subject term search
Title search
source
author
DOI
year of publication
location of publication
supervisor
category
publisher
classifier
conference location
quartile
availibility
subject term
title
series
name of the person
TalTech subject term
TalTech department
url
keyword
All fields
author
co-contibutor
commentator
compiler
corporate author
editor
expert
interviewer
supervisor
translator
series variant title
title
translation of title
variant title
source
special issue
name of the institution
subject of form
subject of location
subject of time
subject term
series
series variant title
availibility
Open Access
category (general)
category (sub)
starts with
containes
exact match
All fields
Source search
Author search
Subject term search
Title search
source
author
DOI
year of publication
location of publication
supervisor
category
publisher
classifier
conference location
quartile
availibility
subject term
title
series
name of the person
TalTech subject term
TalTech department
url
keyword
All fields
author
co-contibutor
commentator
compiler
corporate author
editor
expert
interviewer
supervisor
translator
series variant title
title
translation of title
variant title
source
special issue
name of the institution
subject of form
subject of location
subject of time
subject term
series
series variant title
availibility
Open Access
category (general)
category (sub)
starts with
containes
exact match
All fields
Source search
Author search
Subject term search
Title search
source
author
DOI
year of publication
location of publication
supervisor
category
publisher
classifier
conference location
quartile
availibility
subject term
title
series
name of the person
TalTech subject term
TalTech department
url
keyword
All fields
author
co-contibutor
commentator
compiler
corporate author
editor
expert
interviewer
supervisor
translator
series variant title
title
translation of title
variant title
source
special issue
name of the institution
subject of form
subject of location
subject of time
subject term
series
series variant title
availibility
Open Access
category (general)
category (sub)
starts with
containes
exact match
All fields
Source search
Author search
Subject term search
Title search
source
author
DOI
year of publication
location of publication
supervisor
category
publisher
classifier
conference location
quartile
availibility
subject term
title
series
name of the person
TalTech subject term
TalTech department
url
keyword
All fields
author
co-contibutor
commentator
compiler
corporate author
editor
expert
interviewer
supervisor
translator
series variant title
title
translation of title
variant title
source
special issue
name of the institution
subject of form
subject of location
subject of time
subject term
series
series variant title
availibility
Open Access
category (general)
category (sub)
starts with
containes
exact match
—
All fields
Source search
Author search
Subject term search
Title search
source
author
DOI
year of publication
location of publication
supervisor
category
publisher
classifier
conference location
quartile
availibility
subject term
title
series
name of the person
TalTech subject term
TalTech department
url
keyword
All fields
author
co-contibutor
commentator
compiler
corporate author
editor
expert
interviewer
supervisor
translator
series variant title
title
translation of title
variant title
source
special issue
name of the institution
subject of form
subject of location
subject of time
subject term
series
series variant title
availibility
Open Access
category (general)
category (sub)
starts with
containes
exact match
—
Add criteria
Simple search
filter
Clear
×
types of item
book
..
journal article
..
newspaper article
..
book article
..
dissertation
..
Open Access
..
Scientific publications
..
year
year of publication
Loading..
author
Loading..
TalTech department
Loading..
subject term
Loading..
series
Loading..
name of the person
Loading..
keyword
Loading..
Clear
Number of records
2
Look more..
(2/97)
Export
export all inquiry results
(2)
Save TXT fail
print
Open for editing with marked entries
my bookmarks
display
Bibliographic view
Short view
sort
author ascending
author descending
year of publication ascending
year of publication descending
title ascending
title descending
1
book article
At-speed functional built-in self-test methodology for processors [Electronic resource]
Ubar, Raimund-Johannes
;
Indus, Viljar
;
Kalmend, Oliver
Proceedings of the IASTED International Conference on Engineering and Applied Science : December 27-29, 2012, Columbo, Sri Lanka
2012
/
p. 168-172 : ill [CD-ROM]
book article
2
journal article
High-Level Implementation-Independent Functional Software-Based Self-Test for RISC Processors
Oyeniran, Adeboye Stephen
;
Ubar, Raimund-Johannes
;
Jenihhin, Maksim
;
Raik, Jaan
Journal of electronic testing : theory and applications
2020
/
p. 87-103
https://doi.org/10.1007/s10836-020-05856-7
journal article
Number of records 2, displaying
1 - 2
keyword
96
1.
processor testing
2.
RISC processor testing
3.
processor core testing
4.
Implementation-Independent Testing of Microprocessors
5.
microprocessor testing
6.
ARM processor
7.
crypto processor
8.
digital signal processor (DSP)
9.
multicore processor
10.
multi-processor
11.
multi-processor system-on-chip
12.
multi-processor system-on-chips (MPSoCs)
13.
Muti-Processor System on Chip (MPSoC)
14.
processor architecture
15.
processor designs
16.
processor-centric board
17.
processor-centric board test
18.
accelerated testing
19.
acoustomechanical testing
20.
anaerobic testing
21.
aspect-oriented testing
22.
assessment and testing
23.
at-speed testing
24.
benchmark testing
25.
Berridge testing
26.
burst testing
27.
cancer genomic testing
28.
compliance testing
29.
compositional testing
30.
computer aided testing
31.
cone heater testing
32.
conformance testing
33.
courses on electronic testing and design
34.
cybersecurity testing
35.
D. non-destructive testing
36.
deformation testing
37.
design field testing
38.
destructive testing
39.
eddy current testing
40.
eddy current testing (ECT)
41.
erosion testing
42.
fabric testing
43.
fatigue testing
44.
fire testing
45.
hierarchical testing
46.
hypotheses testing
47.
integration testing
48.
laboratory scale testing
49.
load testing
50.
macro mechanical testing and green surface tribology
51.
material testing
52.
materials testing
53.
measurement and testing
54.
mechanical testing
55.
memory testing
56.
metamorphic testing
57.
model based testing
58.
model-based mutation testing
59.
model-based testing
60.
mutation testing
61.
network-testing
62.
non destructive testing
63.
nondestructive testing
64.
non-destructive testing
65.
on-site testing
66.
pin on disc wear testing
67.
PMU calibration testing
68.
PMU testing
69.
point-of-care testing
70.
real-time HiL testing
71.
regression testing
72.
robustness testing
73.
safety and security testing
74.
scenario testing
75.
scratch testing
76.
security testing
77.
shear testing
78.
small-scale fire testing
79.
software testing
80.
software-in-the-loop (SIL) testing
81.
stand-alone testing
82.
stress-testing
83.
substation testing methods
84.
system testing
85.
tensile testing
86.
testing
87.
testing methods
88.
testing of digital devices
89.
testing of generator
90.
testing of phasor measurement units
91.
two-dimensional array testing
92.
ultrasonic testing
93.
wafer testing
94.
wear testing
95.
vibration testing
96.
virtual testing
TalTech department
1
1.
Testing and Calibration Centre of TUT
×
match
starts with
ends with
containes
sort
Relevance
ascending
descending
year of publication
author
TalTech department
subject term
series
name of the person
keyword
Otsing
Valikud
0
year of publication
AND
OR
NOT
author
AND
OR
NOT
TalTech department
AND
OR
NOT
subject term
AND
OR
NOT
series
AND
OR
NOT
name of the person
AND
OR
NOT
keyword
AND
OR
NOT