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book article
At-speed functional built-in self-test methodology for processors [Electronic resource]
Ubar, Raimund-Johannes
;
Indus, Viljar
;
Kalmend, Oliver
Proceedings of the IASTED International Conference on Engineering and Applied Science : December 27-29, 2012, Columbo, Sri Lanka
2012
/
p. 168-172 : ill [CD-ROM]
book article
2
journal article
High-Level Implementation-Independent Functional Software-Based Self-Test for RISC Processors
Oyeniran, Adeboye Stephen
;
Ubar, Raimund-Johannes
;
Jenihhin, Maksim
;
Raik, Jaan
Journal of electronic testing : theory and applications
2020
/
p. 87-103
https://doi.org/10.1007/s10836-020-05856-7
journal article
Number of records 2, displaying
1 - 2
keyword
93
1.
processor testing
2.
RISC processor testing
3.
processor core testing
4.
Implementation-Independent Testing of Microprocessors
5.
microprocessor testing
6.
ARM processor
7.
crypto processor
8.
digital signal processor (DSP)
9.
multicore processor
10.
multi-processor
11.
multi-processor system-on-chip
12.
multi-processor system-on-chips (MPSoCs)
13.
Muti-Processor System on Chip (MPSoC)
14.
processor architecture
15.
processor designs
16.
processor-centric board
17.
processor-centric board test
18.
accelerated testing
19.
acoustomechanical testing
20.
anaerobic testing
21.
aspect-oriented testing
22.
assessment and testing
23.
at-speed testing
24.
benchmark testing
25.
Berridge testing
26.
burst testing
27.
cancer genomic testing
28.
compliance testing
29.
compositional testing
30.
computer aided testing
31.
conformance testing
32.
courses on electronic testing and design
33.
cybersecurity testing
34.
D. non-destructive testing
35.
deformation testing
36.
design field testing
37.
destructive testing
38.
eddy current testing
39.
eddy current testing (ECT)
40.
erosion testing
41.
fatigue testing
42.
fire testing
43.
hierarchical testing
44.
hypotheses testing
45.
integration testing
46.
laboratory scale testing
47.
load testing
48.
macro mechanical testing and green surface tribology
49.
material testing
50.
materials testing
51.
measurement and testing
52.
mechanical testing
53.
memory testing
54.
metamorphic testing
55.
model based testing
56.
model-based mutation testing
57.
model-based testing
58.
mutation testing
59.
network-testing
60.
non destructive testing
61.
nondestructive testing
62.
non-destructive testing
63.
on-site testing
64.
pin on disc wear testing
65.
PMU calibration testing
66.
PMU testing
67.
point-of-care testing
68.
real-time HiL testing
69.
regression testing
70.
robustness testing
71.
safety and security testing
72.
scenario testing
73.
scratch testing
74.
security testing
75.
small-scale fire testing
76.
software testing
77.
software-in-the-loop (SIL) testing
78.
stand-alone testing
79.
stress-testing
80.
substation testing methods
81.
system testing
82.
tensile testing
83.
testing
84.
testing methods
85.
testing of digital devices
86.
testing of generator
87.
testing of phasor measurement units
88.
two-dimensional array testing
89.
ultrasonic testing
90.
wafer testing
91.
wear testing
92.
vibration testing
93.
virtual testing
TalTech department
1
1.
Testing and Calibration Centre of TUT
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