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teaching design and test of systems (võtmesõna)
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artikkel kogumikus
Environment for innovative university research training in the field of digital test
Oyeniran, Adeboye Stephen
;
Ademilua, Tolulope
;
Kruus, Margus
;
Ubar, Raimund-Johannes
2021 30th Annual Conference of the European Association for Education in Electrical and Information Engineering (EAEEIE)
2021
https://doi.org/10.1109/EAEEIE50507.2021.9531003
artikkel kogumikus
Kirjeid leitud 1, kuvan
1 - 1
võtmesõna
184
1.
teaching design and test of systems
2.
design and test
3.
design-for-test
4.
Digital test and testable design
5.
parallel design and test
6.
test model design
7.
control systems design
8.
design and implementation of Performance Management Systems
9.
design support systems
10.
nanoelectronic systems design
11.
nano-electronic systems design
12.
design methodology and human-centred design
13.
chemistry teaching
14.
classroom teaching
15.
computer-aided teaching
16.
conception of teaching
17.
coping with online teaching and learning
18.
designing a teaching model
19.
digital teaching
20.
digital teaching tool
21.
effective teaching
22.
effective teaching and learning
23.
effective teaching engineering
24.
entrepreneurial teaching and learning
25.
higher education teaching
26.
Hybrid teaching
27.
integrative teaching method
28.
interactive teaching methods
29.
learning by teaching
30.
logic teaching
31.
mastery teaching
32.
online teaching
33.
practical teaching methods
34.
remote teaching
35.
research oriented teaching
36.
robot-assisted teaching
37.
scholarship of teaching and learning
38.
teaching
39.
teaching best practices
40.
teaching case
41.
teaching challenges
42.
teaching commons
43.
teaching concept
44.
teaching engineering
45.
teaching engineering ethics
46.
teaching experience
47.
teaching factory
48.
teaching materials
49.
teaching methodology
50.
teaching methods
51.
teaching model
52.
teaching models
53.
teaching of informatics
54.
teaching strategies
55.
teaching strategy
56.
teaching supply chain management
57.
tools for interactive learning and teaching
58.
web-based teaching
59.
accelerated shelf-life test
60.
adaptive test strategy generation
61.
antigen test
62.
ASTM G65 dry sand rubber wheel abrasion test
63.
automated test environment
64.
automated test pattern generation
65.
automatic test case generation
66.
automatic test pattern generation
67.
automatic test program generation
68.
Auvergne test-bed
69.
battery test
70.
behavioral test
71.
behaviour level test generation
72.
bending test
73.
bit-error rate test
74.
Board and System Test
75.
board test
76.
bounds test
77.
built-in self-test
78.
capillary condensation redistribution test
79.
chi-square test
80.
closed bottle test
81.
cognitive screening test
82.
compartment fire test
83.
compartment test
84.
cone penetration test (CPT)
85.
COVID-19 antigen test
86.
cutting test
87.
cybersecurity test bed
88.
DDR4 interconnect test
89.
deterministic test sequences
90.
diagnostic test
91.
digital test
92.
double-pulse test
93.
drawing test
94.
dry droplet antimicrobial test
95.
embedded test
96.
fan pressurisation test
97.
final test result prediction
98.
four-point bending test
99.
FPGA based test
100.
FPGA-Assisted Test
101.
FPGA-centric test
102.
functional self-test
103.
functional test generation
104.
Granger causality test
105.
hardness test
106.
high-level synthesis for test
107.
high-level test data generation
108.
highlevel test generation
109.
high-speed serial link test
110.
IEEE 9 bus test system
111.
implementation-independent test generation
112.
in situ tensile test in SEM
113.
industrial field test
114.
in-situ tensile test in SEM
115.
Johansen cointegration test
116.
Kolmogorov-Smirnov test
117.
load test
118.
logic built-in self-test
119.
Luria alternating series test
120.
Mann–Kendall test
121.
memory interconnect test
122.
microprocessor test
123.
Model test
124.
multiplier test
125.
offline test generation
126.
orthogonal test
127.
package test analysis
128.
performance test
129.
piezocone penetration test (CPTu)
130.
Point Load Test index
131.
pressurisation test
132.
processor-centric board test
133.
progressive damage test
134.
provably correct test generation
135.
pseudo-exhaustive test
136.
purity test
137.
rtioco-based timed test sequences
138.
seasonal Mann Kendall test
139.
seismic piezocone penetration test
140.
self-test
141.
self-test architectures
142.
sentence writing test
143.
serial sevens test
144.
ship towing test tank
145.
similar material simulation test
146.
small‐scale test
147.
software based self-test
148.
software-based self-test
149.
software-based self-test (SBST)
150.
soil phosphorus (P) test
151.
standard test method
152.
static load test
153.
static-dynamic probing test (SDT)
154.
stress test
155.
system level test
156.
tensile test
157.
test
158.
test and evaluation platform
159.
test bench
160.
test coverage
161.
test driven development
162.
test driven modelling
163.
test embankment
164.
test equipment
165.
test generation
166.
test generation and fault diagnosis
167.
test groups
168.
test optimization
169.
test packets
170.
test path synthesis
171.
test patterns
172.
test point insertion
173.
test program generation
174.
test reference year
175.
test replication
176.
test scenario description language
177.
test-bed
178.
test-chips
179.
test-house
180.
test-pattern
181.
test-suite reduction
182.
Three-point bending test
183.
unit root test
184.
1995 ECC benchmark test
märksõna
2
1.
European Test Symposium (ETS)
2.
16PF (test)
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