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book article
At-speed functional built-in self-test methodology for processors [Electronic resource]
Ubar, Raimund-Johannes
;
Indus, Viljar
;
Kalmend, Oliver
Proceedings of the IASTED International Conference on Engineering and Applied Science : December 27-29, 2012, Columbo, Sri Lanka
2012
/
p. 168-172 : ill [CD-ROM]
book article
2
journal article
High-Level Implementation-Independent Functional Software-Based Self-Test for RISC Processors
Oyeniran, Adeboye Stephen
;
Ubar, Raimund-Johannes
;
Jenihhin, Maksim
;
Raik, Jaan
Journal of electronic testing : theory and applications
2020
/
p. 87-103
https://doi.org/10.1007/s10836-020-05856-7
journal article
Number of records 2, displaying
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keyword
86
1.
processor testing
2.
RISC processor testing
3.
processor core testing
4.
microprocessor testing
5.
ARM processor
6.
crypto processor
7.
digital signal processor (DSP)
8.
multicore processor
9.
multi-processor
10.
multi-processor system-on-chip
11.
multi-processor system-on-chips (MPSoCs)
12.
Muti-Processor System on Chip (MPSoC)
13.
processor designs
14.
processor-centric board
15.
processor-centric board test
16.
accelerated testing
17.
acoustomechanical testing
18.
anaerobic testing
19.
aspect-oriented testing
20.
at-speed testing
21.
benchmark testing
22.
Berridge testing
23.
cancer genomic testing
24.
compliance testing
25.
compositional testing
26.
computer aided testing
27.
conformance testing
28.
courses on electronic testing and design
29.
cybersecurity testing
30.
D. non-destructive testing
31.
design field testing
32.
destructive testing
33.
eddy current testing
34.
eddy current testing (ECT)
35.
erosion testing
36.
fatigue testing
37.
fire testing
38.
hierarchical testing
39.
hypotheses testing
40.
integration testing
41.
laboratory scale testing
42.
load testing
43.
macro mechanical testing and green surface tribology
44.
material testing
45.
materials testing
46.
measurement and testing
47.
mechanical testing
48.
memory testing
49.
metamorphic testing
50.
model based testing
51.
model-based mutation testing
52.
model-based testing
53.
mutation testing
54.
network-testing
55.
non destructive testing
56.
nondestructive testing
57.
non-destructive testing
58.
on-site testing
59.
pin on disc wear testing
60.
PMU calibration testing
61.
PMU testing
62.
point-of-care testing
63.
real-time HiL testing
64.
regression testing
65.
robustness testing
66.
scenario testing
67.
scratch testing
68.
security testing
69.
small-scale fire testing
70.
software testing
71.
software-in-the-loop (SIL) testing
72.
stand-alone testing
73.
stress-testing
74.
substation testing methods
75.
system testing
76.
tensile testing
77.
testing
78.
testing methods
79.
testing of digital devices
80.
testing of generator
81.
testing of phasor measurement units
82.
two-dimensional array testing
83.
wafer testing
84.
wear testing
85.
vibration testing
86.
virtual testing
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