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book article
At-speed functional built-in self-test methodology for processors [Electronic resource]
Ubar, Raimund-Johannes
;
Indus, Viljar
;
Kalmend, Oliver
Proceedings of the IASTED International Conference on Engineering and Applied Science : December 27-29, 2012, Columbo, Sri Lanka
2012
/
p. 168-172 : ill [CD-ROM]
book article
2
journal article
High-Level Implementation-Independent Functional Software-Based Self-Test for RISC Processors
Oyeniran, Adeboye Stephen
;
Ubar, Raimund-Johannes
;
Jenihhin, Maksim
;
Raik, Jaan
Journal of electronic testing : theory and applications
2020
/
p. 87-103
https://doi.org/10.1007/s10836-020-05856-7
journal article
Number of records 2, displaying
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keyword
88
1.
processor testing
2.
RISC processor testing
3.
processor core testing
4.
microprocessor testing
5.
ARM processor
6.
crypto processor
7.
digital signal processor (DSP)
8.
multicore processor
9.
multi-processor
10.
multi-processor system-on-chip
11.
multi-processor system-on-chips (MPSoCs)
12.
Muti-Processor System on Chip (MPSoC)
13.
processor architecture
14.
processor designs
15.
processor-centric board
16.
processor-centric board test
17.
accelerated testing
18.
acoustomechanical testing
19.
anaerobic testing
20.
aspect-oriented testing
21.
at-speed testing
22.
benchmark testing
23.
Berridge testing
24.
cancer genomic testing
25.
compliance testing
26.
compositional testing
27.
computer aided testing
28.
conformance testing
29.
courses on electronic testing and design
30.
cybersecurity testing
31.
D. non-destructive testing
32.
design field testing
33.
destructive testing
34.
eddy current testing
35.
eddy current testing (ECT)
36.
erosion testing
37.
fatigue testing
38.
fire testing
39.
hierarchical testing
40.
hypotheses testing
41.
integration testing
42.
laboratory scale testing
43.
load testing
44.
macro mechanical testing and green surface tribology
45.
material testing
46.
materials testing
47.
measurement and testing
48.
mechanical testing
49.
memory testing
50.
metamorphic testing
51.
model based testing
52.
model-based mutation testing
53.
model-based testing
54.
mutation testing
55.
network-testing
56.
non destructive testing
57.
nondestructive testing
58.
non-destructive testing
59.
on-site testing
60.
pin on disc wear testing
61.
PMU calibration testing
62.
PMU testing
63.
point-of-care testing
64.
real-time HiL testing
65.
regression testing
66.
robustness testing
67.
safety and security testing
68.
scenario testing
69.
scratch testing
70.
security testing
71.
small-scale fire testing
72.
software testing
73.
software-in-the-loop (SIL) testing
74.
stand-alone testing
75.
stress-testing
76.
substation testing methods
77.
system testing
78.
tensile testing
79.
testing
80.
testing methods
81.
testing of digital devices
82.
testing of generator
83.
testing of phasor measurement units
84.
two-dimensional array testing
85.
wafer testing
86.
wear testing
87.
vibration testing
88.
virtual testing
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