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book article
At-speed functional built-in self-test methodology for processors [Electronic resource]
Ubar, Raimund-Johannes
;
Indus, Viljar
;
Kalmend, Oliver
Proceedings of the IASTED International Conference on Engineering and Applied Science : December 27-29, 2012, Columbo, Sri Lanka
2012
/
p. 168-172 : ill [CD-ROM]
book article
2
journal article
High-Level Implementation-Independent Functional Software-Based Self-Test for RISC Processors
Oyeniran, Adeboye Stephen
;
Ubar, Raimund-Johannes
;
Jenihhin, Maksim
;
Raik, Jaan
Journal of electronic testing : theory and applications
2020
/
p. 87-103
https://doi.org/10.1007/s10836-020-05856-7
journal article
Number of records 2, displaying
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keyword
98
1.
processor testing
2.
RISC processor testing
3.
processor core testing
4.
Implementation-Independent Testing of Microprocessors
5.
microprocessor testing
6.
ARM processor
7.
crypto processor
8.
digital signal processor (DSP)
9.
multicore processor
10.
multi-processor
11.
multi-processor system-on-chip
12.
multi-processor system-on-chips (MPSoCs)
13.
Muti-Processor System on Chip (MPSoC)
14.
processor architecture
15.
processor designs
16.
processor-centric board
17.
processor-centric board test
18.
accelerated testing
19.
acoustomechanical testing
20.
anaerobic testing
21.
aspect-oriented testing
22.
assessment and testing
23.
at-speed testing
24.
benchmark testing
25.
Berridge testing
26.
burst testing
27.
cancer genomic testing
28.
compliance testing
29.
compositional testing
30.
computer aided testing
31.
cone heater testing
32.
conformance testing
33.
courses on electronic testing and design
34.
cybersecurity testing
35.
D. non-destructive testing
36.
deformation testing
37.
design field testing
38.
destructive testing
39.
eddy current testing
40.
eddy current testing (ECT)
41.
erosion testing
42.
fabric testing
43.
fatigue testing
44.
fire testing
45.
hierarchical testing
46.
hypotheses testing
47.
integration testing
48.
laboratory scale testing
49.
load testing
50.
macro mechanical testing and green surface tribology
51.
material testing
52.
materials testing
53.
measurement and testing
54.
mechanical testing
55.
memory testing
56.
metamorphic testing
57.
model based testing
58.
model-based mutation testing
59.
model-based testing
60.
mutation testing
61.
network-testing
62.
non destructive testing
63.
nondestructive testing
64.
non-destructive testing
65.
non-destructive testing (NDT)
66.
On-site drug testing
67.
on-site testing
68.
pin on disc wear testing
69.
PMU calibration testing
70.
PMU testing
71.
point-of-care testing
72.
real-time HiL testing
73.
regression testing
74.
robustness testing
75.
safety and security testing
76.
scenario testing
77.
scratch testing
78.
security testing
79.
shear testing
80.
small-scale fire testing
81.
software testing
82.
software-in-the-loop (SIL) testing
83.
stand-alone testing
84.
stress-testing
85.
substation testing methods
86.
system testing
87.
tensile testing
88.
testing
89.
testing methods
90.
testing of digital devices
91.
testing of generator
92.
testing of phasor measurement units
93.
two-dimensional array testing
94.
ultrasonic testing
95.
wafer testing
96.
wear testing
97.
vibration testing
98.
virtual testing
TalTech department
1
1.
Testing and Calibration Centre of TUT
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