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book article
At-speed functional built-in self-test methodology for processors [Electronic resource]
Ubar, Raimund-Johannes
;
Indus, Viljar
;
Kalmend, Oliver
Proceedings of the IASTED International Conference on Engineering and Applied Science : December 27-29, 2012, Columbo, Sri Lanka
2012
/
p. 168-172 : ill [CD-ROM]
book article
2
journal article
High-Level Implementation-Independent Functional Software-Based Self-Test for RISC Processors
Oyeniran, Adeboye Stephen
;
Ubar, Raimund-Johannes
;
Jenihhin, Maksim
;
Raik, Jaan
Journal of electronic testing : theory and applications
2020
/
p. 87-103
https://doi.org/10.1007/s10836-020-05856-7
journal article
Number of records 2, displaying
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keyword
84
1.
processor testing
2.
RISC processor testing
3.
processor core testing
4.
microprocessor testing
5.
ARM processor
6.
crypto processor
7.
digital signal processor (DSP)
8.
multicore processor
9.
multi-processor
10.
multi-processor system-on-chip
11.
multi-processor system-on-chips (MPSoCs)
12.
Muti-Processor System on Chip (MPSoC)
13.
processor designs
14.
processor-centric board
15.
processor-centric board test
16.
accelerated testing
17.
acoustomechanical testing
18.
anaerobic testing
19.
aspect-oriented testing
20.
at-speed testing
21.
benchmark testing
22.
Berridge testing
23.
cancer genomic testing
24.
compliance testing
25.
compositional testing
26.
computer aided testing
27.
conformance testing
28.
courses on electronic testing and design
29.
cybersecurity testing
30.
D. non-destructive testing
31.
design field testing
32.
eddy current testing
33.
erosion testing
34.
fatigue testing
35.
fire testing
36.
hierarchical testing
37.
hypotheses testing
38.
integration testing
39.
laboratory scale testing
40.
load testing
41.
macro mechanical testing and green surface tribology
42.
material testing
43.
materials testing
44.
measurement and testing
45.
mechanical testing
46.
memory testing
47.
metamorphic testing
48.
model based testing
49.
model-based mutation testing
50.
model-based testing
51.
mutation testing
52.
network-testing
53.
non destructive testing
54.
nondestructive testing
55.
non-destructive testing
56.
on-site testing
57.
pin on disc wear testing
58.
PMU calibration testing
59.
PMU testing
60.
point-of-care testing
61.
real-time HiL testing
62.
regression testing
63.
robustness testing
64.
scenario testing
65.
scratch testing
66.
security testing
67.
small-scale fire testing
68.
software testing
69.
software-in-the-loop (SIL) testing
70.
stand-alone testing
71.
stress-testing
72.
substation testing methods
73.
system testing
74.
tensile testing
75.
testing
76.
testing methods
77.
testing of digital devices
78.
testing of generator
79.
testing of phasor measurement units
80.
two-dimensional array testing
81.
wafer testing
82.
wear testing
83.
vibration testing
84.
virtual testing
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