Toggle navigation
Publications
Profiles
Research Groups
Indexes
Help and information
Eesti keeles
Intranet
Publications
Profiles
Research Groups
Indexes
Help and information
Eesti keeles
Intranet
Databases
Publications
Searching
My bookmarks
0
processor testing (keyword)
All fields
Source search
Author search
Subject term search
Title search
starts with
containes
exact match
All fields
Source search
Author search
Subject term search
Title search
starts with
containes
exact match
—
All fields
Source search
Author search
Subject term search
Title search
starts with
containes
exact match
—
All fields
Source search
Author search
Subject term search
Title search
starts with
containes
exact match
—
All fields
Source search
Author search
Subject term search
Title search
starts with
containes
exact match
—
Add criteria
Advanced search
filter
Clear
×
types of item
book
..
journal article
..
newspaper article
..
book article
..
dissertation
..
Open Access
..
Scientific publications
..
year
year of publication
Loading..
author
Loading..
TalTech department
Loading..
subject term
Loading..
series
Loading..
name of the person
Loading..
keyword
Loading..
Clear
Number of records
2
Look more..
(2/96)
Export
export all inquiry results
(2)
Save TXT fail
print
Open for editing with marked entries
my bookmarks
display
Bibliographic view
Short view
sort
author ascending
author descending
year of publication ascending
year of publication descending
title ascending
title descending
1
book article
At-speed functional built-in self-test methodology for processors [Electronic resource]
Ubar, Raimund-Johannes
;
Indus, Viljar
;
Kalmend, Oliver
Proceedings of the IASTED International Conference on Engineering and Applied Science : December 27-29, 2012, Columbo, Sri Lanka
2012
/
p. 168-172 : ill [CD-ROM]
book article
2
journal article
High-Level Implementation-Independent Functional Software-Based Self-Test for RISC Processors
Oyeniran, Adeboye Stephen
;
Ubar, Raimund-Johannes
;
Jenihhin, Maksim
;
Raik, Jaan
Journal of electronic testing : theory and applications
2020
/
p. 87-103
https://doi.org/10.1007/s10836-020-05856-7
journal article
Number of records 2, displaying
1 - 2
keyword
95
1.
processor testing
2.
RISC processor testing
3.
processor core testing
4.
Implementation-Independent Testing of Microprocessors
5.
microprocessor testing
6.
ARM processor
7.
crypto processor
8.
digital signal processor (DSP)
9.
multicore processor
10.
multi-processor
11.
multi-processor system-on-chip
12.
multi-processor system-on-chips (MPSoCs)
13.
Muti-Processor System on Chip (MPSoC)
14.
processor architecture
15.
processor designs
16.
processor-centric board
17.
processor-centric board test
18.
accelerated testing
19.
acoustomechanical testing
20.
anaerobic testing
21.
aspect-oriented testing
22.
assessment and testing
23.
at-speed testing
24.
benchmark testing
25.
Berridge testing
26.
burst testing
27.
cancer genomic testing
28.
compliance testing
29.
compositional testing
30.
computer aided testing
31.
cone heater testing
32.
conformance testing
33.
courses on electronic testing and design
34.
cybersecurity testing
35.
D. non-destructive testing
36.
deformation testing
37.
design field testing
38.
destructive testing
39.
eddy current testing
40.
eddy current testing (ECT)
41.
erosion testing
42.
fatigue testing
43.
fire testing
44.
hierarchical testing
45.
hypotheses testing
46.
integration testing
47.
laboratory scale testing
48.
load testing
49.
macro mechanical testing and green surface tribology
50.
material testing
51.
materials testing
52.
measurement and testing
53.
mechanical testing
54.
memory testing
55.
metamorphic testing
56.
model based testing
57.
model-based mutation testing
58.
model-based testing
59.
mutation testing
60.
network-testing
61.
non destructive testing
62.
nondestructive testing
63.
non-destructive testing
64.
on-site testing
65.
pin on disc wear testing
66.
PMU calibration testing
67.
PMU testing
68.
point-of-care testing
69.
real-time HiL testing
70.
regression testing
71.
robustness testing
72.
safety and security testing
73.
scenario testing
74.
scratch testing
75.
security testing
76.
shear testing
77.
small-scale fire testing
78.
software testing
79.
software-in-the-loop (SIL) testing
80.
stand-alone testing
81.
stress-testing
82.
substation testing methods
83.
system testing
84.
tensile testing
85.
testing
86.
testing methods
87.
testing of digital devices
88.
testing of generator
89.
testing of phasor measurement units
90.
two-dimensional array testing
91.
ultrasonic testing
92.
wafer testing
93.
wear testing
94.
vibration testing
95.
virtual testing
TalTech department
1
1.
Testing and Calibration Centre of TUT
×
match
starts with
ends with
containes
sort
Relevance
ascending
descending
year of publication
author
TalTech department
subject term
series
name of the person
keyword
Otsing
Valikud
0
year of publication
AND
OR
NOT
author
AND
OR
NOT
TalTech department
AND
OR
NOT
subject term
AND
OR
NOT
series
AND
OR
NOT
name of the person
AND
OR
NOT
keyword
AND
OR
NOT