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book article
At-speed functional built-in self-test methodology for processors [Electronic resource]
Ubar, Raimund-Johannes
;
Indus, Viljar
;
Kalmend, Oliver
Proceedings of the IASTED International Conference on Engineering and Applied Science : December 27-29, 2012, Columbo, Sri Lanka
2012
/
p. 168-172 : ill [CD-ROM]
book article
2
journal article
High-Level Implementation-Independent Functional Software-Based Self-Test for RISC Processors
Oyeniran, Adeboye Stephen
;
Ubar, Raimund-Johannes
;
Jenihhin, Maksim
;
Raik, Jaan
Journal of electronic testing : theory and applications
2020
/
p. 87-103
https://doi.org/10.1007/s10836-020-05856-7
journal article
Number of records 2, displaying
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keyword
81
1.
processor testing
2.
RISC processor testing
3.
processor core testing
4.
microprocessor testing
5.
crypto processor
6.
digital signal processor (DSP)
7.
multicore processor
8.
multi-processor
9.
multi-processor system-on-chip
10.
Muti-Processor System on Chip (MPSoC)
11.
processor designs
12.
processor-centric board
13.
processor-centric board test
14.
accelerated testing
15.
acoustomechanical testing
16.
anaerobic testing
17.
aspect-oriented testing
18.
at-speed testing
19.
benchmark testing
20.
Berridge testing
21.
cancer genomic testing
22.
compliance testing
23.
compositional testing
24.
computer aided testing
25.
conformance testing
26.
courses on electronic testing and design
27.
cybersecurity testing
28.
D. non-destructive testing
29.
design field testing
30.
eddy current testing
31.
erosion testing
32.
fatigue testing
33.
fire testing
34.
hierarchical testing
35.
hypotheses testing
36.
integration testing
37.
laboratory scale testing
38.
load testing
39.
macro mechanical testing and green surface tribology
40.
material testing
41.
measurement and testing
42.
mechanical testing
43.
memory testing
44.
metamorphic testing
45.
model based testing
46.
model-based mutation testing
47.
model-based testing
48.
mutation testing
49.
network-testing
50.
non destructive testing
51.
nondestructive testing
52.
non-destructive testing
53.
on-site testing
54.
pin on disc wear testing
55.
PMU calibration testing
56.
PMU testing
57.
point-of-care testing
58.
real-time HiL testing
59.
regression testing
60.
robustness testing
61.
scenario testing
62.
scratch testing
63.
security testing
64.
small-scale fire testing
65.
software testing
66.
software-in-the-loop (SIL) testing
67.
stand-alone testing
68.
stress-testing
69.
substation testing methods
70.
system testing
71.
tensile testing
72.
testing
73.
testing methods
74.
testing of digital devices
75.
testing of generator
76.
testing of phasor measurement units
77.
two-dimensional array testing
78.
wafer testing
79.
wear testing
80.
vibration testing
81.
virtual testing
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