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book article

At-speed self-testing of high-performance pipe-lined processing architectures [Electronic resource]Gorev, Maksim; Ubar, Raimund-Johannes; Ellervee, Peeter; Devadze, Sergei; Raik, Jaan; Min, Mart31st Norchip Conference : Vilnius, Lithuania, 11-12 November 2013 : conference program and papers2013 / p. 1-6 : ill [USB]

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Functional self-test of high-performance pipe-lined signal processing architecturesGorev, Maksim; Ubar, Raimund-Johannes; Ellervee, Peeter; Devadze, Sergei; Raik, Jaan; Min, MartMicroprocessors and microsystems2015 / p. 909-918 : ill http://dx.doi.org/10.1016/j.micpro.2014.11.002

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book article

Self-testing of pipe-lined signal processing architectures at-speedGorev, Maksim; Ubar, Raimund-Johannes; Ellervee, PeeterInfo- ja kommunikatsioonitehnoloogia doktorikooli IKTDK seitsmenda aastakonverentsi artiklite kogumik : 15.-16. novembril 2013, Haapsalu2013 / p. 25-28 : ill

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Number of records 3, displaying 1 - 3

1. at-speed testing
2. boundedness and summability with speed
3. boundedness with speed
4. convergence and absolute convergence with speed
5. convergence and boundedness with speed
6. convergence and α-absolute convergence with speed
7. convergence with speed
8. Drilling speed
9. high speed boat
10. high speed craft (HSC)
11. high speed machining
12. high speed measurement
13. high-speed
14. high-speed craft
15. high-speed design
16. high-speed MAS (magic angle spinning)
17. high-speed planing crafts
18. high-speed railway
19. high-speed serial link test
20. high-speed temperature scanner
21. high-speed thermogravimetric analysis
22. low speed
23. operational speed
24. Pollen fall speed
25. speed
26. speed and position estimation
27. speed of convergence
28. speed tracking setpoints
29. summability and boundedness with speed
30. variable speed drive
31. variable speed drives
32. variable speed wind turbines
33. variable-speed drives
34. variable-speed drives (VSDs)
35. wind speed
36. α-absolute convergence with speed
37. accelerated testing
38. acoustomechanical testing
39. anaerobic testing
40. aspect-oriented testing
41. benchmark testing
42. Berridge testing
43. cancer genomic testing
44. compliance testing
45. compositional testing
46. computer aided testing
47. conformance testing
48. courses on electronic testing and design
49. cybersecurity testing
50. D. non-destructive testing
51. design field testing
52. destructive testing
53. eddy current testing
54. eddy current testing (ECT)
55. erosion testing
56. fatigue testing
57. fire testing
58. hierarchical testing
59. hypotheses testing
60. integration testing
61. laboratory scale testing
62. load testing
63. macro mechanical testing and green surface tribology
64. material testing
65. materials testing
66. measurement and testing
67. mechanical testing
68. memory testing
69. metamorphic testing
70. microprocessor testing
71. model based testing
72. model-based mutation testing
73. model-based testing
74. mutation testing
75. network-testing
76. non destructive testing
77. nondestructive testing
78. non-destructive testing
79. on-site testing
80. pin on disc wear testing
81. PMU calibration testing
82. PMU testing
83. point-of-care testing
84. processor core testing
85. processor testing
86. real-time HiL testing
87. regression testing
88. RISC processor testing
89. robustness testing
90. scenario testing
91. scratch testing
92. security testing
93. small-scale fire testing
94. software testing
95. software-in-the-loop (SIL) testing
96. stand-alone testing
97. stress-testing
98. substation testing methods
99. system testing
100. tensile testing
101. testing
102. testing methods
103. testing of digital devices
104. testing of generator
105. testing of phasor measurement units
106. two-dimensional array testing
107. wafer testing
108. wear testing
109. vibration testing
110. virtual testing

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