Searching - TalTech Research Portal

Publications
Profiles
Research Groups
Indexes
Help and information
Eesti keeles

Research Groups

Help and information

Searching

at-speed testing (keyword)

—

—

—

—

Add criteria Advanced search filter

Clear

types of item

book ..

journal article ..

newspaper article ..

book article ..

dissertation ..

Open Access ..

Scientific publications ..

year

year of publication

Loading..

Loading..

TalTech department

Loading..

Loading..

Loading..

name of the person

Loading..

Loading..

Clear

Number of records 3
Look more.. (2/120)
Export

export all inquiry results (3)
Save TXT fail

Save PDF fail

print
Open for editing with marked entries my bookmarks

display

sort
1

book article

At-speed self-testing of high-performance pipe-lined processing architectures [Electronic resource]Gorev, Maksim; Ubar, Raimund-Johannes; Ellervee, Peeter; Devadze, Sergei; Raik, Jaan; Min, Mart31st Norchip Conference : Vilnius, Lithuania, 11-12 November 2013 : conference program and papers2013 / p. 1-6 : ill [USB]

book article
2

journal article

Functional self-test of high-performance pipe-lined signal processing architecturesGorev, Maksim; Ubar, Raimund-Johannes; Ellervee, Peeter; Devadze, Sergei; Raik, Jaan; Min, MartMicroprocessors and microsystems2015 / p. 909-918 : ill http://dx.doi.org/10.1016/j.micpro.2014.11.002

journal article
3

book article

Self-testing of pipe-lined signal processing architectures at-speedGorev, Maksim; Ubar, Raimund-Johannes; Ellervee, PeeterInfo- ja kommunikatsioonitehnoloogia doktorikooli IKTDK seitsmenda aastakonverentsi artiklite kogumik : 15.-16. novembril 2013, Haapsalu2013 / p. 25-28 : ill

book article

Number of records 3, displaying 1 - 3

1. at-speed testing
2. A-statistical convergence with speed
3. boundedness and summability with speed
4. boundedness with speed
5. convergence and absolute convergence with speed
6. convergence and boundedness with speed
7. convergence and α-absolute convergence with speed
8. convergence with speed
9. Drilling speed
10. high speed boat
11. high speed craft (HSC)
12. high speed machining
13. high speed measurement
14. high-speed
15. high-speed craft
16. high-speed design
17. high-speed MAS (magic angle spinning)
18. high-speed planing crafts
19. high-speed railway
20. high-speed serial link test
21. high-speed temperature scanner
22. high-speed thermogravimetric analysis
23. low speed
24. operational speed
25. paranormed absolute convergence with speed
26. paranormed boundedness with speed
27. paranormed convergence with speed
28. paranormed zero-convergence with speed
29. Pollen fall speed
30. speed
31. speed and position estimation
32. speed of convergence
33. speed tracking setpoints
34. summability and boundedness with speed
35. zero-convergence with speed
36. variable speed drive
37. variable speed drives
38. variable speed wind turbines
39. variable-speed drives
40. variable-speed drives (VSDs)
41. wind speed
42. α-absolute convergence with speed
43. α-absolute summability with speed
44. accelerated testing
45. acoustomechanical testing
46. anaerobic testing
47. aspect-oriented testing
48. benchmark testing
49. Berridge testing
50. cancer genomic testing
51. compliance testing
52. compositional testing
53. computer aided testing
54. conformance testing
55. courses on electronic testing and design
56. cybersecurity testing
57. D. non-destructive testing
58. design field testing
59. destructive testing
60. eddy current testing
61. eddy current testing (ECT)
62. erosion testing
63. fatigue testing
64. fire testing
65. hierarchical testing
66. hypotheses testing
67. Implementation-Independent Testing of Microprocessors
68. integration testing
69. laboratory scale testing
70. load testing
71. macro mechanical testing and green surface tribology
72. material testing
73. materials testing
74. measurement and testing
75. mechanical testing
76. memory testing
77. metamorphic testing
78. microprocessor testing
79. model based testing
80. model-based mutation testing
81. model-based testing
82. mutation testing
83. network-testing
84. non destructive testing
85. nondestructive testing
86. non-destructive testing
87. on-site testing
88. pin on disc wear testing
89. PMU calibration testing
90. PMU testing
91. point-of-care testing
92. processor core testing
93. processor testing
94. real-time HiL testing
95. regression testing
96. RISC processor testing
97. robustness testing
98. safety and security testing
99. scenario testing
100. scratch testing
101. security testing
102. small-scale fire testing
103. software testing
104. software-in-the-loop (SIL) testing
105. stand-alone testing
106. stress-testing
107. substation testing methods
108. system testing
109. tensile testing
110. testing
111. testing methods
112. testing of digital devices
113. testing of generator
114. testing of phasor measurement units
115. two-dimensional array testing
116. wafer testing
117. wear testing
118. vibration testing
119. virtual testing

1. Testing and Calibration Centre of TUT

match

sort

Otsing
Valikud 0

year of publication

author

TalTech department

subject term

series

name of the person

keyword

TalTech Library

Akadeemia tee 1

13519

TalTech homepage TalTech Library homepage Digital Collection of TalTech Library Digiteek Repository

6203551

data@taltech.ee

TalTech Raamatukogu