Toggle navigation
Publications
Profiles
Research Groups
Indexes
Help and information
Eesti keeles
Intranet
Publications
Profiles
Research Groups
Indexes
Help and information
Eesti keeles
Intranet
Databases
Publications
Searching
My bookmarks
0
nondestructive testing (keyword)
All fields
Source search
Author search
Subject term search
Title search
starts with
containes
exact match
All fields
Source search
Author search
Subject term search
Title search
starts with
containes
exact match
—
All fields
Source search
Author search
Subject term search
Title search
starts with
containes
exact match
—
All fields
Source search
Author search
Subject term search
Title search
starts with
containes
exact match
—
All fields
Source search
Author search
Subject term search
Title search
starts with
containes
exact match
—
Add criteria
Advanced search
filter
Clear
×
types of item
book
..
journal article
..
newspaper article
..
book article
..
dissertation
..
Open Access
..
Scientific publications
..
year
year of publication
Loading..
author
Loading..
TalTech department
Loading..
subject term
Loading..
series
Loading..
name of the person
Loading..
keyword
Loading..
Clear
Number of records
4
Look more..
(2/86)
Export
export all inquiry results
(4)
Save TXT fail
print
Open for editing with marked entries
my bookmarks
display
Bibliographic view
Short view
sort
author ascending
author descending
year of publication ascending
year of publication descending
title ascending
title descending
1
journal article EST
/
journal article ENG
Convolution of Barker and Mutually Orthogonal Golay Complementary Codes for Ultrasonic Testing
Peng, Chengxiang
;
Annus, Paul
;
Rist, Marek
;
Land, Raul
;
Ratassepp, Madis
Sensors
2025
/
art. 5007
https://doi.org/10.3390/s25165007
journal article EST
/
journal article ENG
2
book article EST
/
book article ENG
Flexible data acquisition system with custom front-end for ultrasonic NDT research
Peng, Chengxiang
;
Ratassepp, Madis
;
Annus, Paul
;
Rist, Marek
;
Land, Raul
;
Märtens, Olev
2024 19th Biennial Baltic Electronics Conference (BEC)
2024
/
4 p
https://doi.org/10.1109/BEC61458.2024.10737989
Conference proceedings at Scopus
Article at Scopus
Article at WOS
book article EST
/
book article ENG
3
journal article
Higlights in the research into complexity of nonlinear waves
Engelbrecht, Jüri
;
Berezovski, Arkadi
;
Soomere, Tarmo
Proceedings of the Estonian Academy of Sciences
2010
/
p. 61-65
https://doi.org//10.3176/proc.2010.2.01
journal article
4
journal article EST
/
journal article ENG
Tone bursts in exponentially graded materials characterized by parametric plots
Ravasoo, Arvi
Proceedings of the Estonian Academy of Sciences
2013
/
p. 258-266
https://doi.org/10.3176/proc.2013.4.06
Journal metrics at Scopus
at Scopus
Journal metrics at WOS
Article at WOS
journal article EST
/
journal article ENG
Number of records 4, displaying
1 - 4
keyword
85
1.
nondestructive testing
2.
nondestructive material characterization
3.
ultrasonic nondestructive evaluation
4.
accelerated testing
5.
acoustomechanical testing
6.
anaerobic testing
7.
aspect-oriented testing
8.
assessment and testing
9.
at-speed testing
10.
benchmark testing
11.
Berridge testing
12.
burst testing
13.
cancer genomic testing
14.
compliance testing
15.
compositional testing
16.
computer aided testing
17.
cone heater testing
18.
conformance testing
19.
courses on electronic testing and design
20.
cybersecurity testing
21.
D. non-destructive testing
22.
deformation testing
23.
design field testing
24.
destructive testing
25.
eddy current testing
26.
eddy current testing (ECT)
27.
erosion testing
28.
fatigue testing
29.
fire testing
30.
hierarchical testing
31.
hypotheses testing
32.
Implementation-Independent Testing of Microprocessors
33.
integration testing
34.
laboratory scale testing
35.
load testing
36.
macro mechanical testing and green surface tribology
37.
material testing
38.
materials testing
39.
measurement and testing
40.
mechanical testing
41.
memory testing
42.
metamorphic testing
43.
microprocessor testing
44.
model based testing
45.
model-based mutation testing
46.
model-based testing
47.
mutation testing
48.
network-testing
49.
non destructive testing
50.
non-destructive testing
51.
on-site testing
52.
pin on disc wear testing
53.
PMU calibration testing
54.
PMU testing
55.
point-of-care testing
56.
processor core testing
57.
processor testing
58.
real-time HiL testing
59.
regression testing
60.
RISC processor testing
61.
robustness testing
62.
safety and security testing
63.
scenario testing
64.
scratch testing
65.
security testing
66.
shear testing
67.
small-scale fire testing
68.
software testing
69.
software-in-the-loop (SIL) testing
70.
stand-alone testing
71.
stress-testing
72.
substation testing methods
73.
system testing
74.
tensile testing
75.
testing
76.
testing methods
77.
testing of digital devices
78.
testing of generator
79.
testing of phasor measurement units
80.
two-dimensional array testing
81.
ultrasonic testing
82.
wafer testing
83.
wear testing
84.
vibration testing
85.
virtual testing
TalTech department
1
1.
Testing and Calibration Centre of TUT
×
match
starts with
ends with
containes
sort
Relevance
ascending
descending
year of publication
author
TalTech department
subject term
series
name of the person
keyword
Otsing
Valikud
0
year of publication
AND
OR
NOT
author
AND
OR
NOT
TalTech department
AND
OR
NOT
subject term
AND
OR
NOT
series
AND
OR
NOT
name of the person
AND
OR
NOT
keyword
AND
OR
NOT