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journal article EST
/
journal article ENG
Design for accelerated testing of DC-link capacitors in photovoltaic inverters based on mission profiles
Sangwongwanich, Ariya
;
Shen, Yanfeng
;
Chub, Andrii
;
Liivik, Elizaveta
;
Vinnikov, Dmitri
;
Wang, Huai
;
Blaabjerg, Frede
IEEE transactions on industry applications
2021
/
p. 741−753
https://doi.org/10.1109/TIA.2020.3030568
Journal metrics at Scopus
Article at Scopus
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Article at WOS
journal article EST
/
journal article ENG
2
book article EST
/
book article ENG
Mission profile-based accelerated testing of DC-link capacitors in photovoltaic inverters
Sangwongwanich, Ariya
;
Shen, Yanfeng
;
Chub, Andrii
;
Liivik, Elizaveta
;
Vinnikov, Dmitri
;
Wang, Huai
;
Blaabjerg, Frede
Thirty-Fourth Annual IEEE Applied Power Electronics Conference and Exposition, March 17 – 21, 2019, Anaheim, California
2019
/
p. 2833-2840 : ill
https://doi.org/10.1109/APEC.2019.8721794
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book article EST
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book article ENG
Number of records 2, displaying
1 - 2
keyword
90
1.
accelerated testing
2.
accelerated carbonation
3.
accelerated shelf-life test
4.
accelerated shelf-life tests
5.
bias corrected and accelerated method
6.
acoustomechanical testing
7.
anaerobic testing
8.
aspect-oriented testing
9.
assessment and testing
10.
at-speed testing
11.
benchmark testing
12.
Berridge testing
13.
burst testing
14.
cancer genomic testing
15.
compliance testing
16.
compositional testing
17.
computer aided testing
18.
cone heater testing
19.
conformance testing
20.
courses on electronic testing and design
21.
cybersecurity testing
22.
D. non-destructive testing
23.
deformation testing
24.
design field testing
25.
destructive testing
26.
eddy current testing
27.
eddy current testing (ECT)
28.
erosion testing
29.
fabric testing
30.
fatigue testing
31.
fire testing
32.
hierarchical testing
33.
hypotheses testing
34.
Implementation-Independent Testing of Microprocessors
35.
integration testing
36.
laboratory scale testing
37.
load testing
38.
macro mechanical testing and green surface tribology
39.
material testing
40.
materials testing
41.
measurement and testing
42.
mechanical testing
43.
memory testing
44.
metamorphic testing
45.
microprocessor testing
46.
model based testing
47.
model-based mutation testing
48.
model-based testing
49.
mutation testing
50.
network-testing
51.
non destructive testing
52.
nondestructive testing
53.
non-destructive testing
54.
non-destructive testing (NDT)
55.
On-site drug testing
56.
on-site testing
57.
pin on disc wear testing
58.
PMU calibration testing
59.
PMU testing
60.
point-of-care testing
61.
processor core testing
62.
processor testing
63.
real-time HiL testing
64.
regression testing
65.
RISC processor testing
66.
robustness testing
67.
safety and security testing
68.
scenario testing
69.
scratch testing
70.
security testing
71.
shear testing
72.
small-scale fire testing
73.
software testing
74.
software-in-the-loop (SIL) testing
75.
stand-alone testing
76.
stress-testing
77.
substation testing methods
78.
system testing
79.
tensile testing
80.
testing
81.
testing methods
82.
testing of digital devices
83.
testing of generator
84.
testing of phasor measurement units
85.
two-dimensional array testing
86.
ultrasonic testing
87.
wafer testing
88.
wear testing
89.
vibration testing
90.
virtual testing
TalTech department
1
1.
Testing and Calibration Centre of TUT
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