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processor core testing (keyword)
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1
book article
High-level test generation for processing elements in many-core systems
Oyeniran, Adeboye Stephen
;
Ubar, Raimund-Johannes
;
Azad, Siavoosh Payandeh
;
Raik, Jaan
12th International Symposium on Reconfigurable Communication-centric Systems-on-Chip (ReCoSoC2017), July 12-14, 2017, Madrid, Spain : proceedings
2017
/
8 p. : ill
http://dx.doi.org/10.1109/ReCoSoC.2017.8016156
book article
2
book article
Mixed-level identification of fault redundancy in microprocessors
Oyeniran, Adeboye Stephen
;
Ubar, Raimund-Johannes
;
Jenihhin, Maksim
;
Gürsoy, Cemil Cem
;
Raik, Jaan
LATS 2019 : 20th IEEE Latin American Test Symposium : Santiago, Chile, March 11th - 13th 2019
2019
/
6 p. : ill
https://doi.org/10.1109/LATW.2019.8704591
book article
Number of records 2, displaying
1 - 2
keyword
117
1.
processor core testing
2.
processor testing
3.
RISC processor testing
4.
ARM processor
5.
crypto processor
6.
digital signal processor (DSP)
7.
multicore processor
8.
multi-processor
9.
multi-processor system-on-chip
10.
multi-processor system-on-chips (MPSoCs)
11.
Muti-Processor System on Chip (MPSoC)
12.
processor architecture
13.
processor designs
14.
processor-centric board
15.
processor-centric board test
16.
air core
17.
air core coupled coils
18.
core collection
19.
core loss
20.
core losses
21.
core shell heterostructures
22.
core short-circuit
23.
core/shell
24.
core-less induction furnace
25.
core-shell nanoparticles
26.
core-shell particle
27.
cpu core
28.
crypto core
29.
DPP core ontology
30.
ferromagnetic core
31.
firn core
32.
many-core
33.
Ohesaare core
34.
sediment core
35.
sediment core records
36.
soft magnetic core
37.
toroidal magnetic core
38.
accelerated testing
39.
acoustomechanical testing
40.
anaerobic testing
41.
aspect-oriented testing
42.
assessment and testing
43.
at-speed testing
44.
benchmark testing
45.
Berridge testing
46.
burst testing
47.
cancer genomic testing
48.
compliance testing
49.
compositional testing
50.
computer aided testing
51.
cone heater testing
52.
conformance testing
53.
courses on electronic testing and design
54.
cybersecurity testing
55.
D. non-destructive testing
56.
deformation testing
57.
design field testing
58.
destructive testing
59.
eddy current testing
60.
eddy current testing (ECT)
61.
erosion testing
62.
fatigue testing
63.
fire testing
64.
hierarchical testing
65.
hypotheses testing
66.
Implementation-Independent Testing of Microprocessors
67.
integration testing
68.
laboratory scale testing
69.
load testing
70.
macro mechanical testing and green surface tribology
71.
material testing
72.
materials testing
73.
measurement and testing
74.
mechanical testing
75.
memory testing
76.
metamorphic testing
77.
microprocessor testing
78.
model based testing
79.
model-based mutation testing
80.
model-based testing
81.
mutation testing
82.
network-testing
83.
non destructive testing
84.
nondestructive testing
85.
non-destructive testing
86.
on-site testing
87.
pin on disc wear testing
88.
PMU calibration testing
89.
PMU testing
90.
point-of-care testing
91.
real-time HiL testing
92.
regression testing
93.
robustness testing
94.
safety and security testing
95.
scenario testing
96.
scratch testing
97.
security testing
98.
shear testing
99.
small-scale fire testing
100.
software testing
101.
software-in-the-loop (SIL) testing
102.
stand-alone testing
103.
stress-testing
104.
substation testing methods
105.
system testing
106.
tensile testing
107.
testing
108.
testing methods
109.
testing of digital devices
110.
testing of generator
111.
testing of phasor measurement units
112.
two-dimensional array testing
113.
ultrasonic testing
114.
wafer testing
115.
wear testing
116.
vibration testing
117.
virtual testing
TalTech department
1
1.
Testing and Calibration Centre of TUT
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