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processor core testing (keyword)
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book article
High-level test generation for processing elements in many-core systems
Oyeniran, Adeboye Stephen
;
Ubar, Raimund-Johannes
;
Azad, Siavoosh Payandeh
;
Raik, Jaan
12th International Symposium on Reconfigurable Communication-centric Systems-on-Chip (ReCoSoC2017), July 12-14, 2017, Madrid, Spain : proceedings
2017
/
8 p. : ill
http://dx.doi.org/10.1109/ReCoSoC.2017.8016156
book article
2
book article
Mixed-level identification of fault redundancy in microprocessors
Oyeniran, Adeboye Stephen
;
Ubar, Raimund-Johannes
;
Jenihhin, Maksim
;
Gürsoy, Cemil Cem
;
Raik, Jaan
LATS 2019 : 20th IEEE Latin American Test Symposium : Santiago, Chile, March 11th - 13th 2019
2019
/
6 p. : ill
https://doi.org/10.1109/LATW.2019.8704591
book article
Number of records 2, displaying
1 - 2
keyword
100
1.
processor core testing
2.
processor testing
3.
RISC processor testing
4.
ARM processor
5.
crypto processor
6.
digital signal processor (DSP)
7.
multicore processor
8.
multi-processor
9.
multi-processor system-on-chip
10.
multi-processor system-on-chips (MPSoCs)
11.
Muti-Processor System on Chip (MPSoC)
12.
processor designs
13.
processor-centric board
14.
processor-centric board test
15.
core collection
16.
core loss
17.
core losses
18.
core shell heterostructures
19.
core short-circuit
20.
core/shell
21.
core-less induction furnace
22.
core-shell nanoparticles
23.
cpu core
24.
crypto core
25.
ferromagnetic core
26.
firn core
27.
many-core
28.
Ohesaare core
29.
sediment core records
30.
toroidal magnetic core
31.
accelerated testing
32.
acoustomechanical testing
33.
anaerobic testing
34.
aspect-oriented testing
35.
at-speed testing
36.
benchmark testing
37.
Berridge testing
38.
cancer genomic testing
39.
compliance testing
40.
compositional testing
41.
computer aided testing
42.
conformance testing
43.
courses on electronic testing and design
44.
cybersecurity testing
45.
D. non-destructive testing
46.
design field testing
47.
eddy current testing
48.
erosion testing
49.
fatigue testing
50.
fire testing
51.
hierarchical testing
52.
hypotheses testing
53.
integration testing
54.
laboratory scale testing
55.
load testing
56.
macro mechanical testing and green surface tribology
57.
material testing
58.
materials testing
59.
measurement and testing
60.
mechanical testing
61.
memory testing
62.
metamorphic testing
63.
microprocessor testing
64.
model based testing
65.
model-based mutation testing
66.
model-based testing
67.
mutation testing
68.
network-testing
69.
non destructive testing
70.
nondestructive testing
71.
non-destructive testing
72.
on-site testing
73.
pin on disc wear testing
74.
PMU calibration testing
75.
PMU testing
76.
point-of-care testing
77.
real-time HiL testing
78.
regression testing
79.
robustness testing
80.
scenario testing
81.
scratch testing
82.
security testing
83.
small-scale fire testing
84.
software testing
85.
software-in-the-loop (SIL) testing
86.
stand-alone testing
87.
stress-testing
88.
substation testing methods
89.
system testing
90.
tensile testing
91.
testing
92.
testing methods
93.
testing of digital devices
94.
testing of generator
95.
testing of phasor measurement units
96.
two-dimensional array testing
97.
wafer testing
98.
wear testing
99.
vibration testing
100.
virtual testing
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