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processor core testing (keyword)
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1
book article
High-level test generation for processing elements in many-core systems
Oyeniran, Adeboye Stephen
;
Ubar, Raimund-Johannes
;
Azad, Siavoosh Payandeh
;
Raik, Jaan
12th International Symposium on Reconfigurable Communication-centric Systems-on-Chip (ReCoSoC2017), July 12-14, 2017, Madrid, Spain : proceedings
2017
/
8 p. : ill
http://dx.doi.org/10.1109/ReCoSoC.2017.8016156
book article
2
book article
Mixed-level identification of fault redundancy in microprocessors
Oyeniran, Adeboye Stephen
;
Ubar, Raimund-Johannes
;
Jenihhin, Maksim
;
Gürsoy, Cemil Cem
;
Raik, Jaan
LATS 2019 : 20th IEEE Latin American Test Symposium : Santiago, Chile, March 11th - 13th 2019
2019
/
6 p. : ill
https://doi.org/10.1109/LATW.2019.8704591
book article
Number of records 2, displaying
1 - 2
keyword
111
1.
processor core testing
2.
processor testing
3.
RISC processor testing
4.
ARM processor
5.
crypto processor
6.
digital signal processor (DSP)
7.
multicore processor
8.
multi-processor
9.
multi-processor system-on-chip
10.
multi-processor system-on-chips (MPSoCs)
11.
Muti-Processor System on Chip (MPSoC)
12.
processor architecture
13.
processor designs
14.
processor-centric board
15.
processor-centric board test
16.
air core coupled coils
17.
core collection
18.
core loss
19.
core losses
20.
core shell heterostructures
21.
core short-circuit
22.
core/shell
23.
core-less induction furnace
24.
core-shell nanoparticles
25.
core-shell particle
26.
cpu core
27.
crypto core
28.
DPP core ontology
29.
ferromagnetic core
30.
firn core
31.
many-core
32.
Ohesaare core
33.
sediment core
34.
sediment core records
35.
toroidal magnetic core
36.
accelerated testing
37.
acoustomechanical testing
38.
anaerobic testing
39.
aspect-oriented testing
40.
at-speed testing
41.
benchmark testing
42.
Berridge testing
43.
burst testing
44.
cancer genomic testing
45.
compliance testing
46.
compositional testing
47.
computer aided testing
48.
conformance testing
49.
courses on electronic testing and design
50.
cybersecurity testing
51.
D. non-destructive testing
52.
deformation testing
53.
design field testing
54.
destructive testing
55.
eddy current testing
56.
eddy current testing (ECT)
57.
erosion testing
58.
fatigue testing
59.
fire testing
60.
hierarchical testing
61.
hypotheses testing
62.
Implementation-Independent Testing of Microprocessors
63.
integration testing
64.
laboratory scale testing
65.
load testing
66.
macro mechanical testing and green surface tribology
67.
material testing
68.
materials testing
69.
measurement and testing
70.
mechanical testing
71.
memory testing
72.
metamorphic testing
73.
microprocessor testing
74.
model based testing
75.
model-based mutation testing
76.
model-based testing
77.
mutation testing
78.
network-testing
79.
non destructive testing
80.
nondestructive testing
81.
non-destructive testing
82.
on-site testing
83.
pin on disc wear testing
84.
PMU calibration testing
85.
PMU testing
86.
point-of-care testing
87.
real-time HiL testing
88.
regression testing
89.
robustness testing
90.
safety and security testing
91.
scenario testing
92.
scratch testing
93.
security testing
94.
small-scale fire testing
95.
software testing
96.
software-in-the-loop (SIL) testing
97.
stand-alone testing
98.
stress-testing
99.
substation testing methods
100.
system testing
101.
tensile testing
102.
testing
103.
testing methods
104.
testing of digital devices
105.
testing of generator
106.
testing of phasor measurement units
107.
two-dimensional array testing
108.
wafer testing
109.
wear testing
110.
vibration testing
111.
virtual testing
TalTech department
1
1.
Testing and Calibration Centre of TUT
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