Toggle navigation
Publications
Profiles
Research Groups
Indexes
Help and information
Eesti keeles
Intranet
Publications
Profiles
Research Groups
Indexes
Help and information
Eesti keeles
Intranet
Databases
Publications
Searching
My bookmarks
0
processor core testing (keyword)
All fields
Source search
Author search
Subject term search
Title search
starts with
containes
exact match
All fields
Source search
Author search
Subject term search
Title search
starts with
containes
exact match
—
All fields
Source search
Author search
Subject term search
Title search
starts with
containes
exact match
—
All fields
Source search
Author search
Subject term search
Title search
starts with
containes
exact match
—
All fields
Source search
Author search
Subject term search
Title search
starts with
containes
exact match
—
Add criteria
Advanced search
filter
Clear
×
types of item
book
..
journal article
..
newspaper article
..
book article
..
dissertation
..
Open Access
..
Scientific publication
..
year
year of publication
Loading..
author
Loading..
TTÜ department
Loading..
subject term
Loading..
series
Loading..
name of the person
Loading..
keyword
Loading..
Clear
Number of records
2
Look more..
(1/103)
Export
export all inquiry results
(2)
Save TXT fail
Save PDF fail
print
Open for editing with marked entries
my bookmarks
display
Bibliographic view
Short view
sort
author ascending
author descending
year of publication ascending
year of publication descending
title ascending
title descending
1
book article
High-level test generation for processing elements in many-core systems
Oyeniran, Adeboye Stephen
;
Ubar, Raimund-Johannes
;
Azad, Siavoosh Payandeh
;
Raik, Jaan
12th International Symposium on Reconfigurable Communication-centric Systems-on-Chip (ReCoSoC2017), July 12-14, 2017, Madrid, Spain : proceedings
2017
/
8 p. : ill
http://dx.doi.org/10.1109/ReCoSoC.2017.8016156
book article
2
book article
Mixed-level identification of fault redundancy in microprocessors
Oyeniran, Adeboye Stephen
;
Ubar, Raimund-Johannes
;
Jenihhin, Maksim
;
Gürsoy, Cemil Cem
;
Raik, Jaan
LATS 2019 : 20th IEEE Latin American Test Symposium : Santiago, Chile, March 11th - 13th 2019
2019
/
6 p. : ill
https://doi.org/10.1109/LATW.2019.8704591
book article
Number of records 2, displaying
1 - 2
keyword
103
1.
processor core testing
2.
processor testing
3.
RISC processor testing
4.
ARM processor
5.
crypto processor
6.
digital signal processor (DSP)
7.
multicore processor
8.
multi-processor
9.
multi-processor system-on-chip
10.
multi-processor system-on-chips (MPSoCs)
11.
Muti-Processor System on Chip (MPSoC)
12.
processor designs
13.
processor-centric board
14.
processor-centric board test
15.
air core coupled coils
16.
core collection
17.
core loss
18.
core losses
19.
core shell heterostructures
20.
core short-circuit
21.
core/shell
22.
core-less induction furnace
23.
core-shell nanoparticles
24.
cpu core
25.
crypto core
26.
ferromagnetic core
27.
firn core
28.
many-core
29.
Ohesaare core
30.
sediment core records
31.
toroidal magnetic core
32.
accelerated testing
33.
acoustomechanical testing
34.
anaerobic testing
35.
aspect-oriented testing
36.
at-speed testing
37.
benchmark testing
38.
Berridge testing
39.
cancer genomic testing
40.
compliance testing
41.
compositional testing
42.
computer aided testing
43.
conformance testing
44.
courses on electronic testing and design
45.
cybersecurity testing
46.
D. non-destructive testing
47.
design field testing
48.
destructive testing
49.
eddy current testing
50.
eddy current testing (ECT)
51.
erosion testing
52.
fatigue testing
53.
fire testing
54.
hierarchical testing
55.
hypotheses testing
56.
integration testing
57.
laboratory scale testing
58.
load testing
59.
macro mechanical testing and green surface tribology
60.
material testing
61.
materials testing
62.
measurement and testing
63.
mechanical testing
64.
memory testing
65.
metamorphic testing
66.
microprocessor testing
67.
model based testing
68.
model-based mutation testing
69.
model-based testing
70.
mutation testing
71.
network-testing
72.
non destructive testing
73.
nondestructive testing
74.
non-destructive testing
75.
on-site testing
76.
pin on disc wear testing
77.
PMU calibration testing
78.
PMU testing
79.
point-of-care testing
80.
real-time HiL testing
81.
regression testing
82.
robustness testing
83.
scenario testing
84.
scratch testing
85.
security testing
86.
small-scale fire testing
87.
software testing
88.
software-in-the-loop (SIL) testing
89.
stand-alone testing
90.
stress-testing
91.
substation testing methods
92.
system testing
93.
tensile testing
94.
testing
95.
testing methods
96.
testing of digital devices
97.
testing of generator
98.
testing of phasor measurement units
99.
two-dimensional array testing
100.
wafer testing
101.
wear testing
102.
vibration testing
103.
virtual testing
×
match
starts with
ends with
containes
sort
Relevance
ascending
descending
year of publication
author
TTÜ department
subject term
series
name of the person
keyword
Otsing
Valikud
0
year of publication
AND
OR
NOT
author
AND
OR
NOT
TTÜ department
AND
OR
NOT
subject term
AND
OR
NOT
series
AND
OR
NOT
name of the person
AND
OR
NOT
keyword
AND
OR
NOT