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processor core testing (keyword)
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book article
High-level test generation for processing elements in many-core systems
Oyeniran, Adeboye Stephen
;
Ubar, Raimund-Johannes
;
Azad, Siavoosh Payandeh
;
Raik, Jaan
12th International Symposium on Reconfigurable Communication-centric Systems-on-Chip (ReCoSoC2017), July 12-14, 2017, Madrid, Spain : proceedings
2017
/
8 p. : ill
http://dx.doi.org/10.1109/ReCoSoC.2017.8016156
book article
2
book article
Mixed-level identification of fault redundancy in microprocessors
Oyeniran, Adeboye Stephen
;
Ubar, Raimund-Johannes
;
Jenihhin, Maksim
;
Gürsoy, Cemil Cem
;
Raik, Jaan
LATS 2019 : 20th IEEE Latin American Test Symposium : Santiago, Chile, March 11th - 13th 2019
2019
/
6 p. : ill
https://doi.org/10.1109/LATW.2019.8704591
book article
Number of records 2, displaying
1 - 2
keyword
106
1.
processor core testing
2.
processor testing
3.
RISC processor testing
4.
ARM processor
5.
crypto processor
6.
digital signal processor (DSP)
7.
multicore processor
8.
multi-processor
9.
multi-processor system-on-chip
10.
multi-processor system-on-chips (MPSoCs)
11.
Muti-Processor System on Chip (MPSoC)
12.
processor architecture
13.
processor designs
14.
processor-centric board
15.
processor-centric board test
16.
air core coupled coils
17.
core collection
18.
core loss
19.
core losses
20.
core shell heterostructures
21.
core short-circuit
22.
core/shell
23.
core-less induction furnace
24.
core-shell nanoparticles
25.
cpu core
26.
crypto core
27.
ferromagnetic core
28.
firn core
29.
many-core
30.
Ohesaare core
31.
sediment core
32.
sediment core records
33.
toroidal magnetic core
34.
accelerated testing
35.
acoustomechanical testing
36.
anaerobic testing
37.
aspect-oriented testing
38.
at-speed testing
39.
benchmark testing
40.
Berridge testing
41.
cancer genomic testing
42.
compliance testing
43.
compositional testing
44.
computer aided testing
45.
conformance testing
46.
courses on electronic testing and design
47.
cybersecurity testing
48.
D. non-destructive testing
49.
design field testing
50.
destructive testing
51.
eddy current testing
52.
eddy current testing (ECT)
53.
erosion testing
54.
fatigue testing
55.
fire testing
56.
hierarchical testing
57.
hypotheses testing
58.
integration testing
59.
laboratory scale testing
60.
load testing
61.
macro mechanical testing and green surface tribology
62.
material testing
63.
materials testing
64.
measurement and testing
65.
mechanical testing
66.
memory testing
67.
metamorphic testing
68.
microprocessor testing
69.
model based testing
70.
model-based mutation testing
71.
model-based testing
72.
mutation testing
73.
network-testing
74.
non destructive testing
75.
nondestructive testing
76.
non-destructive testing
77.
on-site testing
78.
pin on disc wear testing
79.
PMU calibration testing
80.
PMU testing
81.
point-of-care testing
82.
real-time HiL testing
83.
regression testing
84.
robustness testing
85.
safety and security testing
86.
scenario testing
87.
scratch testing
88.
security testing
89.
small-scale fire testing
90.
software testing
91.
software-in-the-loop (SIL) testing
92.
stand-alone testing
93.
stress-testing
94.
substation testing methods
95.
system testing
96.
tensile testing
97.
testing
98.
testing methods
99.
testing of digital devices
100.
testing of generator
101.
testing of phasor measurement units
102.
two-dimensional array testing
103.
wafer testing
104.
wear testing
105.
vibration testing
106.
virtual testing
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