Toggle navigation
Publications
Profiles
Research Groups
Indexes
Help and information
Eesti keeles
Intranet
Publications
Profiles
Research Groups
Indexes
Help and information
Eesti keeles
Intranet
Databases
Publications
Searching
My bookmarks
0
processor core testing (keyword)
All fields
Source search
Author search
Subject term search
Title search
starts with
containes
exact match
All fields
Source search
Author search
Subject term search
Title search
starts with
containes
exact match
—
All fields
Source search
Author search
Subject term search
Title search
starts with
containes
exact match
—
All fields
Source search
Author search
Subject term search
Title search
starts with
containes
exact match
—
All fields
Source search
Author search
Subject term search
Title search
starts with
containes
exact match
—
Add criteria
Advanced search
filter
Clear
×
types of item
book
..
journal article
..
newspaper article
..
book article
..
dissertation
..
Open Access
..
Scientific publication
..
year
year of publication
Loading..
author
Loading..
TTÜ department
Loading..
subject term
Loading..
series
Loading..
name of the person
Loading..
keyword
Loading..
Clear
Number of records
2
Look more..
(1/97)
Export
export all inquiry results
(2)
Save TXT fail
Save PDF fail
print
Open for editing with marked entries
my bookmarks
display
Bibliographic view
Short view
sort
author ascending
author descending
year of publication ascending
year of publication descending
title ascending
title descending
1
book article
High-level test generation for processing elements in many-core systems
Oyeniran, Adeboye Stephen
;
Ubar, Raimund-Johannes
;
Azad, Siavoosh Payandeh
;
Raik, Jaan
12th International Symposium on Reconfigurable Communication-centric Systems-on-Chip (ReCoSoC2017), July 12-14, 2017, Madrid, Spain : proceedings
2017
/
8 p. : ill
http://dx.doi.org/10.1109/ReCoSoC.2017.8016156
book article
2
book article
Mixed-level identification of fault redundancy in microprocessors
Oyeniran, Adeboye Stephen
;
Ubar, Raimund-Johannes
;
Jenihhin, Maksim
;
Gürsoy, Cemil Cem
;
Raik, Jaan
LATS 2019 : 20th IEEE Latin American Test Symposium : Santiago, Chile, March 11th - 13th 2019
2019
/
6 p. : ill
https://doi.org/10.1109/LATW.2019.8704591
book article
Number of records 2, displaying
1 - 2
keyword
97
1.
processor core testing
2.
processor testing
3.
RISC processor testing
4.
crypto processor
5.
digital signal processor (DSP)
6.
multicore processor
7.
multi-processor
8.
multi-processor system-on-chip
9.
Muti-Processor System on Chip (MPSoC)
10.
processor designs
11.
processor-centric board
12.
processor-centric board test
13.
core collection
14.
core loss
15.
core losses
16.
core shell heterostructures
17.
core short-circuit
18.
core/shell
19.
core-less induction furnace
20.
core-shell nanoparticles
21.
cpu core
22.
crypto core
23.
ferromagnetic core
24.
firn core
25.
many-core
26.
Ohesaare core
27.
sediment core records
28.
toroidal magnetic core
29.
accelerated testing
30.
acoustomechanical testing
31.
anaerobic testing
32.
aspect-oriented testing
33.
at-speed testing
34.
benchmark testing
35.
Berridge testing
36.
cancer genomic testing
37.
compliance testing
38.
compositional testing
39.
computer aided testing
40.
conformance testing
41.
courses on electronic testing and design
42.
cybersecurity testing
43.
D. non-destructive testing
44.
design field testing
45.
eddy current testing
46.
erosion testing
47.
fatigue testing
48.
fire testing
49.
hierarchical testing
50.
hypotheses testing
51.
integration testing
52.
laboratory scale testing
53.
load testing
54.
macro mechanical testing and green surface tribology
55.
material testing
56.
measurement and testing
57.
mechanical testing
58.
memory testing
59.
metamorphic testing
60.
microprocessor testing
61.
model based testing
62.
model-based mutation testing
63.
model-based testing
64.
mutation testing
65.
network-testing
66.
non destructive testing
67.
nondestructive testing
68.
non-destructive testing
69.
on-site testing
70.
pin on disc wear testing
71.
PMU calibration testing
72.
PMU testing
73.
point-of-care testing
74.
real-time HiL testing
75.
regression testing
76.
robustness testing
77.
scenario testing
78.
scratch testing
79.
security testing
80.
small-scale fire testing
81.
software testing
82.
software-in-the-loop (SIL) testing
83.
stand-alone testing
84.
stress-testing
85.
substation testing methods
86.
system testing
87.
tensile testing
88.
testing
89.
testing methods
90.
testing of digital devices
91.
testing of generator
92.
testing of phasor measurement units
93.
two-dimensional array testing
94.
wafer testing
95.
wear testing
96.
vibration testing
97.
virtual testing
×
vaste
starts with
ends with
containes
sort
Relevance
ascending
descending
year of publication
author
TTÜ department
subject term
series
name of the person
keyword
Otsing
Valikud
0
year of publication
AND
OR
NOT
author
AND
OR
NOT
TTÜ department
AND
OR
NOT
subject term
AND
OR
NOT
series
AND
OR
NOT
name of the person
AND
OR
NOT
keyword
AND
OR
NOT