On the reuse of TLM mutation analysis at RTL
statement of authorship
Valerio Guarnieri, ... Hanno Hantson, Jaan Raik, Maksim Jenihhin, Raimund Ubar [et al.]
journal volume number month
Vol. 28, 4
year of publication
pages
p. 435-448 : ill
keyword
ISSN
0923-8174
notes
Bibliogr.: 35 ref
language
inglise
Guarnieri, V., Hantson, H., Raik, J., Jenihhin, M., Ubar, R. On the reuse of TLM mutation analysis at RTL // Journal of electronic testing : theory and applications (2012) Vol. 28, 4, p. 435-448 : ill.