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Brik, Marina (author)

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1

book article

A proposal for optimisation of low-powered FSM testingBrik, Marina; Fomina, Jelena; Ubar, Raimund-JohannesProceedings of IEEE East-West Design & Test Workshop (EWDTW'05) : Odessa, Ukraine, September 15-19, 20052005 / p. 15-20

book article
2

book article

An improved test generation approach for sequential circuits using decision diagramsBrik, Marina; Ubar, Raimund-JohannesBEC'98 : the 6th Biennial Conference on Electronics and Microsystems Technology, October 7-9, 1998, Tallinn, Estonia : proceedings1998 / p. 155-158: ill

book article
3

book article

A benchmark suite for evaluating the efficiency of test toolsKruus, Helena; Ubar, Raimund-Johannes; Ellervee, Peeter; Gorev, Maksim; Pesonen, Vadim; Devadze, Sergei; Orasson, Elmet; Brik, Marina; Min, Mart; Annus, Paul; Kruus, Margus; Meigas, KaljuBEC 2012 : 2012 13th Biennial Baltic Electronics Conference : proceedings of the 13th Biennial Baltic Electronics Conference : October 3-5, 2012, Tallinn, Estonia2012 / p. 85-88 : ill

book article
4

book

Combinatorial algorithms of discrete mathematicsZakrevskij, Arkadij; Pottosin, Yu.; Cheremisinova, L.2008 http://www.ester.ee/record=b2350865*est

book
5

journal article

Defect-oriented mixed-level fault simulation in digital systemsUbar, Raimund-Johannes; Raik, Jaan; Ivask, Eero; Brik, MarinaFacta Universitatis [Niš]. Series electronics and energetics2002 / 1, April, p. 123-136 : ill

journal article
6

book article

Diagnostic modeling of microprocessors with high-level decision diagramsUbar, Raimund-Johannes; Raik, Jaan; Jutman, Artur; Jenihhin, Maksim; Brik, Marina; Istenberg, Martin; Wuttke, Heinz-DietrichBEC 2008 : 2008 International Biennial Baltic Electronics Conference : proceedings of the 11th Biennial Baltic Electronics Conference : Tallinn University of Technology : October 6-8, 2008, Tallinn, Estonia2008 / p. 147-150 : ill

book article
7

book article

E-learning of digital logicRobal, Tarmo; Brik, Marina; Aarna, MargitEWME 2006 proceedings : 6th International Workshop on Microelectronics Education : 8-9 June, 2006, Stockholm, Sweden2006 / p. 120-123 : ill

book article
8

book article

Functional test generation for finite state machinesUbar, Raimund-Johannes; Brik, Marina; Jutman, Artur; Raik, Jaan; Bengtsson, Tomas; Kumar, ShashiBEC 2006 : 2006 International Baltic Electronics Conference : Tallinn University of Technology, October 2-4, 2006, Tallinn, Estonia : proceedings of the 10th Biennial Baltic Electronics Conference2006 / p. 205-208 : ill

book article
9

book article

GA-based test generation for sequential circuitsBrik, Marina; Raik, Jaan; Ubar, Raimund-Johannes; Ivask, EeroProceedings of East–West Design & Test Workshop (EWDTW’04) : Yalta, Alushta, Crimea, Ukraine, September 23-26, 20042004 / p. 30-34

book article
10

book article

Hardware close programming for freshmenKruus, Helena; Brik, Marina; Kruus, Margus; Ruberg, Priit; Viies, Vladimir; Ellervee, Peeter10th European Workshop on Microelectronics Education : EWME 2014 : May 14-16, 2014, Tallinn, Estonia2014 / p. 93-96 : ill

book article
11

book article

A hierarchical automatic test pattern generator based on using alternative graphsBrik, Marina; Jervan, Gert; Markus, Antti; Raik, Jaan; Ubar, Raimund-JohannesProceedings of the 4th International Workshop Mixed Design of Integrated Circuits and Systems : MIXDES'97 : Poznan, Poland, 12-14 June 19971997 / p. 415-420

book article
12

book article

Hierarchical concurrent test generation for synchronous sequential circuitsUbar, Raimund-Johannes; Brik, MarinaProceedings of the 7th International Conference Mixed Design of Integrated Circuits and Systems : MIXDES 2000 : Gdynia, Poland, 15-17 June 20002000 / p. 533-538 : ill

book article
13

book article

Hierarchical fault simulation for finite state machinesBrik, Marina; Raik, Jaan; Ubar, Raimund-JohannesThe 7th Biennial Conference on Electronics and Microsystem Technology "Baltic Electronics Conference" : BEC 2000 : October 8 - 11, 2000, Tallinn, Estonia : conference proceedings2000 / p. 145-148 : ill

book article
14

book article

Hierarchical fault simulation in digital systemsUbar, Raimund-Johannes; Raik, Jaan; Ivask, Eero; Brik, MarinaInternational Symposium on Signals, Circuits and Systems : SCS 2001 : July 10-11, 2001, Iasi, Romania : proceedings2001 / p. 181-184 : ill

book article
15

journal article

Hierarchical physical defect reasoning in digital circuitsKostin, Sergei; Ubar, Raimund-Johannes; Raik, Jaan; Brik, MarinaEstonian journal of engineering2011 / 3, p. 185-200

journal article
16

book article

Hierarchical test generation for digital systemsBrik, Marina; Jervan, Gert; Markus, Antti; Raik, Jaan; Ubar, Raimund-JohannesMixed design of integrated circuits and systems1998 / p. 131-136: ill

book article
17

book article

Hierarchical test generation for finite state machinesBrik, Marina; Ubar, Raimund-JohannesBEC : Baltic Electronics Conference : proceedings of the 4th Biennial Conference, October 9-14, 1994, Tallinn (Estonia). 11994 / p. 319-324: ill

book article
18

book article

High level fault modeling in digital systemsUbar, Raimund-Johannes; Aarna, Margit; Brik, Marina; Raik, JaanSynergies between Information and Automation : 49. Internationales Wissenschaftliches Kolloquium, 27.-30.9.2004, Technische Universität Ilmenau, Germany. Volume 22004 / p. 486-491

book article
19

dissertation

Investigation and development of test generation methods for control part of digital systemsBrik, Marina2002 http://www.ester.ee/record=b1688656*est

dissertation
20

book article

Mixed-level defect simulation in data-paths of digital systemsUbar, Raimund-Johannes; Raik, Jaan; Ivask, Eero; Brik, Marina23rd International Conference on Microelectronics : MIEL 2002, Niš, Yugoslavia, 12-15 May 2002 : proceedings. Volume 22002 / p. 617-620 : ill https://ieeexplore.ieee.org/document/1003333

book article
21

journal article

Mixed-level test generator for digital systemsBrik, Marina; Jervan, Gert; Markus, Antti; Paomets, Priidu; Raik, Jaan; Ubar, Raimund-JohannesProceedings of the Estonian Academy of Sciences. Engineering1997 / 4, p. 271-282 : ill

journal article
22

book article

Multi-level fault simulation of digital systems on decision diagramsUbar, Raimund-Johannes; Raik, Jaan; Ivask, Eero; Brik, MarinaThe First IEEE International Workshop on Electronic Design, Test and Applications : DELTA 2002, 29-31 January 2002, Christchurch, New Zealand : proceedings2002 / p. 86-91 : ill

book article
23

book article

Multi-level test generation and fault diagnosis for finite state machinesUbar, Raimund-Johannes; Brik, MarinaDependable computing : proceedings / EDCC-2, Second European Dependable Computing Conference, Taormina, Italy, October 2-4, 19961996 / p. 264-281: ill

book article
24

book article

A new approach to state encoding of low power FSMFomina, Jelena; Brik, Marina; Sudnitsõn, Aleksander; Vasiliev, RomanProceedings of IEEE East-West Design & Test Workshop : EWDTW'05 : Ukraine2005 / p. 21-26

book article
25

book article

On using genetic algorithm for test generationBrik, Marina; Raik, Jaan; Ubar, Raimund-Johannes; Ivask, EeroBEC 2004 : proceedings of the 9th Biennial Baltic Electronics Conference : October 3-6, 2004, Tallinn, Estonia2004 / p. 233-236 : ill

book article

Number of records 33, displaying 1 - 25

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1. Brik, Marina 1965
2. Aghayan, Marina 1987
3. Arensburger, Marina 1909-1993
4. Järvis, Marina 1975
5. Kempinen, Marina
6. Krapivina, Marina 1974
7. Kravets, Marina 1978
8. Krichevskaya, Marina
9. Kritševskaja, Marina 1974
10. Kudrjašova, Marina 1963
11. Lozovskaja, Marina
12. Neverdinova, Marina 1959
13. Nikitina, Marina 1965
14. Rauk, Marina 1963
15. Rõuk, Marina
16. Seero, Marina 1929-2011
17. Sergejeva, Marina 1954
18. Taul, Marina 1960
19. Teras, Marina 1968
20. Toompuu, Marina 1971
21. Trapido, Marina 1952
22. Tsibanova, Marina
23. Wertsinski, Marina

1. Aghayan, Marina
2. Da Rocha Meneses, Lisandra Marina
3. Järvis, Marina
4. Kaljurand, Marina
5. Kostina, Marina
6. Kritševskaja, Marina, 1974-
7. Kudrjašova, Marina
8. Kuznetsova, Marina
9. Teras, Marina
10. Toompuu, Marina
11. Trapido, Marina, 1952-

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