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book article

A CAD system for teaching digital testUbar, Raimund-Johannes; Ivask, Eero; Paomets, Priidu; Raik, JaanBEC : Baltic Electronics Conference : proceedings of the 4th Biennial Conference, October 9-14, 1994, Tallinn (Estonia). 11994 / p. 369-372: ill

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book article

Collaborative distributed computing in the field of digital electronics testingIvask, Eero; Devadze, Sergei; Ubar, Raimund-JohannesBalanced Automation Systems for Future Manufacturing Networks : 9th IFIP WG 5.5 International Conference : BASYS 2010 : Valencia, Spain, July 21-23, 2010 : proceedings2010 / p. 145-152

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book article

Collaborative distributed fault simulation for digital electronic circuitsIvask, Eero; Devadze, Sergei; Ubar, Raimund-JohannesIntelligent Distributed Computing IV : proceedings of the 4th International Symposium on Intelligent Distributed Computing - IDC 2010 : Tangier, Morocco, September 20102010 / p. 67-76

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book article

Comparison of genetic and random techniques for test pattern generationIvask, Eero; Raik, Jaan; Ubar, Raimund-JohannesBEC'98 : the 6th Biennial Conference on Electronics and Microsystems Technology, October 7-9, 1998, Tallinn, Estonia : proceedings1998 / p. 163-166: ill

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journal article

Defect-oriented mixed-level fault simulation in digital systemsUbar, Raimund-Johannes; Raik, Jaan; Ivask, Eero; Brik, MarinaFacta Universitatis [Niš]. Series electronics and energetics2002 / 1, April, p. 123-136 : ill

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book article

Defect-oriented test generation and fault simulation in the environment of MOSCITOSchneider, Andre; Diener, Karl-Heinz; Gramatova, Elena; Fisherova, Maria; Ivask, Eero; Ubar, Raimund-Johannes; Pleskacz, Witold A.; Kuzmicz, W.BEC 2002 : proceedings of the 8th Biennial Baltic Electronics Conference : October 6-9, 2002, Tallinn, Estonia2002 / p. 303-306 : ill

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book article

Digital design flow with test activitiesDiener, Karl-Heinz; Elst, G.; Ivask, Eero; Jervan, Gert; Peng, Z.; Raik, Jaan; Ubar, Raimund-JohannesVILAB User Forum2000 / [11] p

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dissertation

Digital test in WEB-based environmentIvask, Eero2006 https://www.ester.ee/record=b2158119*est

dissertation

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book article

Distributed approach for genetic test generation in the field of digital electronicsIvask, Eero; Raik, Jaan; Ubar, Raimund-JohannesIntelligent Distributed Computing, Systems and Applications : proceedings of the 2nd International Symposium on Intelligent Distributed Computing : IDC 2008 : Catania, Italy, 20082008 / p. 127-136

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book article

Distributed approach for parallel exact critical path tracing fault simulationIvask, Eero; Devadze, Sergei; Ubar, Raimund-JohannesMIXDES 2010 : 17th International Conference "Mixed Design of Integrated Circuits and Systems" : June 24-26, 2010, Wroclaw, Poland2010 / p. 471-476 : ill

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journal article

Distributed approach for parallel exact critical path tracing fault simulationIvask, Eero; Devadze, Sergei; Ubar, Raimund-JohannesInternational journal of microelectronics and computer science2010 / p. 165-174 : ill

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journal article

Distributed fault simulation with collaborative load balancing for VLSI circuitsIvask, Eero; Devadze, Sergei; Ubar, Raimund-JohannesScalable computing : practice and experience2011 / p. 153-163 : ill

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book article

Fault oriented test pattern generation for sequential circuits using Genetic AlgorithmsIvask, Eero; Raik, Jaan; Ubar, Raimund-JohannesThe 7th Biennial Conference on Electronics and Microsystem Technology "Baltic Electronics Conference" : BEC 2000 : October 8 - 11, 2000, Tallinn, Estonia : conference proceedings2000 / p. 129-132 : ill

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book article

Fault oriented test pattern generation for sequential circuits using genetic algorithmsIvask, Eero; Raik, Jaan; Ubar, Raimund-JohannesIEEE European Test Workshop2000 / p. 319-320

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book article

FPGA design flow with automated test generationElst, G.; Diener, Karl-Heinz; Ivask, Eero; Raik, Jaan; Ubar, Raimund-JohannesProc. of German 11th Workshop on Test Technology and Reliability of Circuits and Systems : Potsdam, 19991999 / p. 120-123

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book article

GA-based test generation for sequential circuitsBrik, Marina; Raik, Jaan; Ubar, Raimund-Johannes; Ivask, EeroProceedings of East–West Design & Test Workshop (EWDTW’04) : Yalta, Alushta, Crimea, Ukraine, September 23-26, 20042004 / p. 30-34

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journal article

Geneetilised algoritmidIvask, EeroA & A1999 / 1, lk. 33-39: ill

journal article

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book article

Hierarchical fault simulation in digital systemsUbar, Raimund-Johannes; Raik, Jaan; Ivask, Eero; Brik, MarinaInternational Symposium on Signals, Circuits and Systems : SCS 2001 : July 10-11, 2001, Iasi, Romania : proceedings2001 / p. 181-184 : ill

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book article

Improved VHDL input for high-level synthesis tool xTractorEllervee, Peeter; Ivask, Eero; Kruus, MargusBEC 2006 : 2006 International Baltic Electronics Conference : Tallinn University of Technology, October 2-4, 2006, Tallinn, Estonia : proceedings of the 10th Biennial Baltic Electronics Conference2006 / p. 87-90 : ill

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book article

Integrated design and test generation under Internet based environment MOSCITOSchneider, Andre; Ivask, Eero; Ubar, Raimund-JohannesEuromicro Symposium on Digital System Design : Architectures, Methods and Tools : September 4-6, 2002, Dortmund, Germany : proceedings2002 / p. 187-194 : ill http://dx.doi.org/10.1109/DSD.2002.1115368

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book article

Integration of digital test tools to the internet-based environment MOSCITOSchneider, Andre; Diener, Karl-Heinz; Elst, Günter; Ivask, Eero; Raik, Jaan; Ubar, Raimund-JohannesSCI 2003 : the 7th World Multiconference on Systemics, Cybernetics and Informatics : July 27-30, 2003, Orlando, Florida, USA : proceedings. Volume VIII, Applications of Informatics and Cybernetics in Science and Engineering2003 / p. 136-141 : ill

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book article

Internet based test generation and fault simulationIvask, Eero; Ubar, Raimund-Johannes; Raik, Jaan; Schneider, AndreIEEE Design and Diagnostics of Electronic Circuits and Systems - IEEE DDECS 2001 : Fourth International Workshop on IEEE Design and Diagnostics of Electronic Circuits and Systems : Györ, Hungary, April 18-20, 20012001 / p. 57-60 : ill

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book article

Internet-based collaborative test generation with MOSCITO [Electronic resource]Schneider, Andre; Ivask, Eero; Miklos, P.; Raik, Jaan; Diener, Karl-Heinz; Ubar, Raimund-Johannes; Cibakova, Tatiana; Gramatova, ElenaSIGDA publications on CD-ROM : DATE'02 : Design, Automation and Test in Europe, Paris, France, March 4-8, 20022002 / [6] p. [CD-ROM] https://www.cecs.uci.edu/~papers/date07/PAPERS/2002/DATE02/PDFFILES/02E_2.PDF

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book article

Internet-based testability-driven test generation in the virtual environment MOSCITOSchneider, Andre; Diener, Karl-Heinz; Elst, G.; Ivask, Eero; Raik, Jaan; Ubar, Raimund-JohannesInternational Federation for Information Processing IFIP : International Workshop on IP-Based SoC Design 2002 : proceedings : Grenoble, October 30-31, 20022002 / p. 357-362 : ill http://publica.fraunhofer.de/dokumente/N-287433.html

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book article

Internet-basierter Systementwurf mit MOSCITOSchneider, Andre; Schneider, Peter; Gramatova, Elena; Ivask, EeroEntwurf Integrierter Schaltungen : 10. E.I.S.-Workshop : Präsentationen der ITG-Fachtagung : vom 3. bis 5. April 2001 in Dresden2001 / S. 295-296 : Ill

book article

Ivask, Eero (author)

types of item

author 40

CV 12

name of the person 10

subject term 1