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Ubar, Raimund-Johannes 1941
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301
journal article
Guest editorial
Lande, Tor Sverre
;
Ubar, Raimund-Johannes
Analog integrated circuits and signal processing
1999
/
1, p. 5-6
journal article
302
journal article
[H. Bleeker, P.Van Den Eijnden, F.De Jong. Boundary-scan test. Boston : Kluwer Academic, 1993. 225 p. : book review]
Ubar, Raimund-Johannes
Engineering applications of artificial intelligence
1994
/
p. 86-87
https://www.ester.ee/record=b1200126*est
journal article
303
book
Handbook of testing electronic systems
Novak, Ondrej
;
Gramatova, Elena
;
Ubar, Raimund-Johannes
;
Jutman, Artur
;
Raik, Jaan
2005
https://www.ester.ee/record=b2102523*est
book
304
newspaper article
Hea teaduse odav väljamüük
Ubar, Raimund-Johannes
Postimees
2017
/
lk. 6
https://teadus.postimees.ee/4343295/raimund-ubar-hea-teaduse-odav-valjamuuk
newspaper article
305
book article
Hierarchical analysis of short defects between metal lines in CMOS IC
Pleskacz, Witold A.
;
Jenihhin, Maksim
;
Raik, Jaan
;
Rakowski, Michal
;
Ubar, Raimund-Johannes
;
Kuzmicz, Wieslaw
Proceedings : 11th EUROMICRO Conference on Digital System Design : Architectures, Methods and Tools : (DSD 2008) : September 3-5, 2008, Parma, Italy
2008
/
p. 729-734 : ill
book article
306
book article
Hierarchical approach to test generation for digital systems at system, circuit and defect levels
Ubar, Raimund-Johannes
45. Internationales Wissenschaftliches Kolloquium, 04.-06.10.2000 : Tagungsband
2000
/
S. 711-716 : Ill
book article
307
journal article
Hierarchical approaches to test generation and fault simulation
Ubar, Raimund-Johannes
Radioelectronics and informatics
2003
/
p. 204
journal article
308
book article
A hierarchical automatic test pattern generator based on using alternative graphs
Brik, Marina
;
Jervan, Gert
;
Markus, Antti
;
Raik, Jaan
;
Ubar, Raimund-Johannes
Proceedings of the 4th International Workshop Mixed Design of Integrated Circuits and Systems : MIXDES'97 : Poznan, Poland, 12-14 June 1997
1997
/
p. 415-420
book article
309
book article
Hierarchical calculation of malicious faults for evaluating the fault-tolerance
Ubar, Raimund-Johannes
;
Devadze, Sergei
;
Jenihhin, Maksim
;
Raik, Jaan
;
Jervan, Gert
;
Ellervee, Peeter
Proceedings : Fourth IEEE International Symposium on Electronic Design, Test and Applications : [DELTA 2008] : 23-25 January 2008, Hong Kong, SAR, China
2008
/
p. 222-227 : ill
book article
310
book article
Hierarchical concurrent test generation for synchronous sequential circuits
Ubar, Raimund-Johannes
;
Brik, Marina
Proceedings of the 7th International Conference Mixed Design of Integrated Circuits and Systems : MIXDES 2000 : Gdynia, Poland, 15-17 June 2000
2000
/
p. 533-538 : ill
book article
311
book article
Hierarchical defect level test quality analysis
Blyzniuk, M.
;
Cibakova, Tatiana
;
Gramatova, Elena
;
Kuzmicz, W.
;
Lobur, M.
;
Pleskacz, Witold A.
;
Raik, Jaan
;
Ubar, Raimund-Johannes
VILAB User Forum
2000
/
[11] p
book article
312
book article
Hierarchical defect-oriented fault simulation for digital circuits
Blyzniuk, M.
;
Cibakova, Tatiana
;
Gramatova, Elena
;
Kuzmicz, W.
;
Lobur, M.
;
Pleskacz, Witold A.
;
Raik, Jaan
;
Ubar, Raimund-Johannes
IEEE European Test Workshop : 23-26 May 2000, Cascais, Portugal : ETW 2000 : proceedings
2000
/
p. 69-74 : ill
book article
313
book article
Hierarchical defect-oriented fault simulation for digital circuits
Blyzniuk, M.
;
Cibakova, Tatiana
;
Gramatova, Elena
;
Kuzmicz, W.
;
Lobur, M.
;
Pleskacz, Witold A.
;
Raik, Jaan
;
Ubar, Raimund-Johannes
IEEE European Test Workshop
2000
/
p. 151-156
https://ieeexplore.ieee.org/document/873781
book article
314
book article
Hierarchical design error diagnosis in combinational circuits by stuck-at fault test patterns
Ubar, Raimund-Johannes
;
Jutman, Artur
Proceedings of the 6th International Conference on Mixed Design of Integrated Circuits and Systems : MIXDES'99 : Krakow, Poland, 17-19 June 1999
1999
/
p. 437-442 : ill
book article
315
book article
Hierarchical fault diagnosis in embedded digital systems with multi-level decision diagrams [Electronic resource]
Ubar, Raimund-Johannes
;
Evartson, Teet
;
Lensen, Harri
;
Aarna, Margit
5th International Conference on Industrial Automation = Cinquieme Conference Internationale sur l'Automatisation Industrielle : June 11-13, 2007, Montreal, Canada
2007
/
[6] p. [CD-ROM]
book article
316
book article
Hierarchical fault simulation for finite state machines
Brik, Marina
;
Raik, Jaan
;
Ubar, Raimund-Johannes
The 7th Biennial Conference on Electronics and Microsystem Technology "Baltic Electronics Conference" : BEC 2000 : October 8 - 11, 2000, Tallinn, Estonia : conference proceedings
2000
/
p. 145-148 : ill
book article
317
book article
Hierarchical fault simulation in digital systems
Ubar, Raimund-Johannes
;
Raik, Jaan
;
Ivask, Eero
;
Brik, Marina
International Symposium on Signals, Circuits and Systems : SCS 2001 : July 10-11, 2001, Iasi, Romania : proceedings
2001
/
p. 181-184 : ill
book article
318
book article
Hierarchical identification of NBTI-critical gates in nanoscale logic
Kostin, Sergei
;
Raik, Jaan
;
Ubar, Raimund-Johannes
;
Jenihhin, Maksim
LATW2014 : 15th IEEE Latin-American Test Workshop : Fortaleza, Brazil, March 12th-15th, 2014
2014
/
[6] p. : ill
book article
319
book article
Hierarchical identification of untestable faults in sequential circuits
Raik, Jaan
;
Ubar, Raimund-Johannes
;
Krivenko, Anna
;
Kruus, Margus
10th Euromicro Conference on Digital System Design Architectures, Methods and Tools, DSD 2007 : 29-31 August 2007, Lübeck, Germany : proceedings
2007
/
p. 668-671 : ill
http://dx.doi.org/10.1109/DSD.2007.4341539
book article
320
journal article
Hierarchical physical defect reasoning in digital circuits
Kostin, Sergei
;
Ubar, Raimund-Johannes
;
Raik, Jaan
;
Brik, Marina
Estonian journal of engineering
2011
/
3, p. 185-200
journal article
321
book article
Hierarchical test generation based on alternative graph model
Ubar, Raimund-Johannes
Proceedings of the Second Workshop on Hierarchical Test Generation : Microelectronics Technology Park, Duisburg, Germany, September 25-26, 1995
1995
/
p. 18
book article
322
journal article
Hierarchical test generation for combinational circuits with real defects coverage
Cibakova, Tatiana
;
Fischerova, Maria
;
Gramatova, Elena
;
Kuzmicz, W.
;
Pleskacz, Witold A.
;
Raik, Jaan
;
Ubar, Raimund-Johannes
Microelectronics reliability
2002
/
p. 1141-1149 : ill
journal article
323
book article
Hierarchical test generation for complex digital systems with control and data processing parts
Ubar, Raimund-Johannes
;
Raik, Jaan
"Test, Assembly and Packaging" : SEMICON Technical Symposium : Singapur, May 3-6, 1999
1999
/
p. 43-52
book article
324
book article
Hierarchical test generation for digital systems
Brik, Marina
;
Jervan, Gert
;
Markus, Antti
;
Raik, Jaan
;
Ubar, Raimund-Johannes
Mixed design of integrated circuits and systems
1998
/
p. 131-136: ill
book article
325
book article
Hierarchical test generation for digital systems based on combining bottom-up and top-down approaches
Raik, Jaan
;
Ubar, Raimund-Johannes
World Multiconference on Systemics, Cybernetics and Informatics, July 12-16, 1998, Orlando, Florida : proceedings. Vol. 1
1998
/
p. 374-381: ill
book article
Number of records 810, displaying
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56
1.
Ubar, Raimund-Johannes
2.
Hagelberg, Raimund
3.
Räämet, Raimund
4.
Aare, Johannes
5.
Avik, Eduard Johannes
6.
Bauer, Johannes
7.
Bender, Naatan Johannes
8.
Buchmann, Johannes
9.
Deelstra, Johannes
10.
Ehala, Johannes
11.
Engelmayer, Johannes
12.
Gotzmann, Johannes
13.
Helander, Johannes
14.
Hint, Johannes
15.
Hüsse, Johannes
16.
Johannes, Anu
17.
Johannes, Ellen
18.
Johannes, Ille
19.
Johannes, Kaljo-Mihkel
20.
Järv, Johannes
21.
Kadak, Johannes
22.
Kajander, Aleksi Oskar Johannes
23.
Karstensen, Johannes
24.
Kerkhoven, Eduard Johannes
25.
Kiivet, Johannes
26.
Krimmer, Robert Johannes
27.
Kukebal, Johannes
28.
Meitre, Johannes
29.
Miller, Johannes
30.
Mühlman, Johannes
31.
Norberg, Johannes
32.
Notermans, Antonius Johannes Hubertus
33.
Ortlepp, Johannes
34.
Parikas, Johannes
35.
Pello, Johannes
36.
Pervik, Johannes-Eduard
37.
Piiper, Johannes
38.
Presmann, Johannes
39.
Putk, Aksel-Johannes
40.
Pätsch, Johannes
41.
Saar, Johannes
42.
Sautter, Johannes
43.
Sinisalo, Touko Johannes
44.
Steinbrunn, Johannes
45.
Sutt, Johannes
46.
Zeiringer, Johannes Paul
47.
Taimsalu, Johannes
48.
Talu, Martin Johannes
49.
Tammekänd, Johannes
50.
Tilk, Johannes
51.
Tralla, Johannes
52.
Veerus, Johannes
53.
Vibur, Johannes Ferdinand
54.
Vind, Johannes
55.
Voll, Johannes
56.
Voltri, Johannes
CV
56
1.
Ubar, Raimund-Johannes 1941
2.
Räämet, Raimund 1918-2004
3.
Aare, Johannes 1915-2000
4.
Ahrenschild, Johannes (-1936)
5.
Alaots, Johannes
6.
Aljak, Arnold Johannes
7.
Allik, Erich-Johannes
8.
Avik, Eduard Johannes
9.
Drechsler, Wolfgang Johannes Max
10.
Ehala, Johannes 1986
11.
Hint, Johannes 1914-1985
12.
Johannes, Ille 1939
13.
Johannson, Johannes
14.
Johanson, Johannes
15.
Juhans, Johannes 1874-1956
16.
Kajander, Aleksi Oskar Johannes 1994
17.
Kiiwet, Johannes
18.
Kiivet, Johannes 1879-1967
19.
Kivit, Johannes
20.
Kollist, Johannes 1884-1937
21.
Kollist, Johannes Theodor
22.
Korv, August Johannes 1911-1981
23.
Krimmer, Robert Johannes
24.
Käpp, Martin Johannes
25.
Langel, Johannes 1900-1985
26.
Langell, Johannes
27.
Livländer, Robert Johannes
28.
Madise, Johannes 1920
29.
Meitre, Johannes 1906-1978
30.
Messer, Johannes
31.
Muru, Johannes 1995
32.
Mäll, Johannes 1911-1981
33.
Mühlman, Johannes
34.
Mühlmann, Johannes 1888-1936
35.
Notermans, Antonius Johannes Hubertus 1959
36.
Nuudi, Johannes 1895-1975
37.
Palo, Johannes 1925-1960
38.
Pals, Johannes 1903-1941
39.
Pello, Johannes 1958
40.
Pervik, Johannes 1892-1958
41.
Presmann, Johannes 1942
42.
Putk, Aksel-Johannes 1928-1999
43.
Püümann, Mait Johannes
44.
Roes, Johannes 1914
45.
Russwurm, Johannes
46.
Russvurm, Johannes 1855-1939
47.
Russvurm, Johannes Carl Gysbert Immanuel
48.
Sakeus, Johannes 1880-1934
49.
Taimsalu, Johannes 1891-1942
50.
Teiman, Johannes
51.
Teimann, Johannes Rudolf (kuni 22.05.1935)
52.
Tomson, Johannes
53.
Tuulre, Feliks Johannes 1908-1987
54.
Veerus, Johannes Voldemar 1897-1972
55.
Verus, Johannes Voldemar
56.
Vuhk, Oskar Johannes
name of the person
27
1.
Ubar, Raimund-Johannes, 1941-
2.
Hagelberg, Raimund, 1927-2012
3.
Räämet, Raimund, 1918-2004
4.
Aare, Johannes, 1915-2000
5.
Aavik, Johannes, 1880-1973
6.
Avik, Eduard Johannes, 1891-1942
7.
Bender, Naatan Johannes
8.
Granö, Johannes Gabriel
9.
Hint, Johannes, 1914-1985
10.
Johannes Paulus II, paavst, 1920-2005
11.
Kert, Johannes
12.
Kiivet, Johannes, 1879-1967
13.
Kollist, Johannes
14.
Käis, Johannes
15.
Lang, Johannes
16.
Maide, Johannes Voldemar
17.
Mossov, Johannes
18.
Pals, Johannes, 1903-1941
19.
Pello, Johannes
20.
Putk, Aksel-Johannes
21.
Rammul, Aleksander Johannes, 1875-1949
22.
Steinbrunn, Johannes
23.
Taimsalu, Johannes, 1891-1942
24.
Talu, Martin Johannes
25.
Veerus, Johannes Voldemar, 1897-1972
26.
Veski, Johannes Voldemar, 1873-1968
27.
Voll, Johannes
subject term
1
1.
Johannes Mittus, vasevalamise tööstus
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