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Ivask, Eero (TTÜ author)
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1
book article
A CAD system for teaching digital test
Ubar, Raimund-Johannes
;
Ivask, Eero
;
Paomets, Priidu
;
Raik, Jaan
BEC : Baltic Electronics Conference : proceedings of the 4th Biennial Conference, October 9-14, 1994, Tallinn (Estonia). 1
1994
/
p. 369-372: ill
book article
2
book article
Collaborative distributed computing in the field of digital electronics testing
Ivask, Eero
;
Devadze, Sergei
;
Ubar, Raimund-Johannes
Balanced Automation Systems for Future Manufacturing Networks : 9th IFIP WG 5.5 International Conference : BASYS 2010 : Valencia, Spain, July 21-23, 2010 : proceedings
2010
/
p. 145-152
book article
3
book article
Collaborative distributed fault simulation for digital electronic circuits
Ivask, Eero
;
Devadze, Sergei
;
Ubar, Raimund-Johannes
Intelligent Distributed Computing IV : proceedings of the 4th International Symposium on Intelligent Distributed Computing - IDC 2010 : Tangier, Morocco, September 2010
2010
/
p. 67-76
book article
4
book article
Comparison of genetic and random techniques for test pattern generation
Ivask, Eero
;
Raik, Jaan
;
Ubar, Raimund-Johannes
BEC'98 : the 6th Biennial Conference on Electronics and Microsystems Technology, October 7-9, 1998, Tallinn, Estonia : proceedings
1998
/
p. 163-166: ill
book article
5
journal article
Defect-oriented mixed-level fault simulation in digital systems
Ubar, Raimund-Johannes
;
Raik, Jaan
;
Ivask, Eero
;
Brik, Marina
Facta Universitatis [Niš]. Series electronics and energetics
2002
/
1, April, p. 123-136 : ill
journal article
6
book article
Defect-oriented test generation and fault simulation in the environment of MOSCITO
Schneider, Andre
;
Diener, Karl-Heinz
;
Gramatova, Elena
;
Fisherova, Maria
;
Ivask, Eero
;
Ubar, Raimund-Johannes
;
Pleskacz, Witold A.
;
Kuzmicz, W.
BEC 2002 : proceedings of the 8th Biennial Baltic Electronics Conference : October 6-9, 2002, Tallinn, Estonia
2002
/
p. 303-306 : ill
book article
7
book article
Digital design flow with test activities
Diener, Karl-Heinz
;
Elst, G.
;
Ivask, Eero
;
Jervan, Gert
;
Peng, Z.
;
Raik, Jaan
;
Ubar, Raimund-Johannes
VILAB User Forum
2000
/
[11] p
book article
8
dissertation
Digital test in WEB-based environment
Ivask, Eero
2006
https://www.ester.ee/record=b2158119*est
dissertation
9
book article
Distributed approach for genetic test generation in the field of digital electronics
Ivask, Eero
;
Raik, Jaan
;
Ubar, Raimund-Johannes
Intelligent Distributed Computing, Systems and Applications : proceedings of the 2nd International Symposium on Intelligent Distributed Computing : IDC 2008 : Catania, Italy, 2008
2008
/
p. 127-136
book article
10
book article
Distributed approach for parallel exact critical path tracing fault simulation
Ivask, Eero
;
Devadze, Sergei
;
Ubar, Raimund-Johannes
MIXDES 2010 : 17th International Conference "Mixed Design of Integrated Circuits and Systems" : June 24-26, 2010, Wroclaw, Poland
2010
/
p. 471-476 : ill
book article
11
journal article
Distributed approach for parallel exact critical path tracing fault simulation
Ivask, Eero
;
Devadze, Sergei
;
Ubar, Raimund-Johannes
International journal of microelectronics and computer science
2010
/
p. 165-174 : ill
journal article
12
journal article
Distributed fault simulation with collaborative load balancing for VLSI circuits
Ivask, Eero
;
Devadze, Sergei
;
Ubar, Raimund-Johannes
Scalable computing : practice and experience
2011
/
p. 153-163 : ill
journal article
13
book article
Fault oriented test pattern generation for sequential circuits using Genetic Algorithms
Ivask, Eero
;
Raik, Jaan
;
Ubar, Raimund-Johannes
The 7th Biennial Conference on Electronics and Microsystem Technology "Baltic Electronics Conference" : BEC 2000 : October 8 - 11, 2000, Tallinn, Estonia : conference proceedings
2000
/
p. 129-132 : ill
book article
14
book article
Fault oriented test pattern generation for sequential circuits using genetic algorithms
Ivask, Eero
;
Raik, Jaan
;
Ubar, Raimund-Johannes
IEEE European Test Workshop
2000
/
p. 319-320
book article
15
book article
FPGA design flow with automated test generation
Elst, G.
;
Diener, Karl-Heinz
;
Ivask, Eero
;
Raik, Jaan
;
Ubar, Raimund-Johannes
Proc. of German 11th Workshop on Test Technology and Reliability of Circuits and Systems : Potsdam, 1999
1999
/
p. 120-123
book article
16
book article
GA-based test generation for sequential circuits
Brik, Marina
;
Raik, Jaan
;
Ubar, Raimund-Johannes
;
Ivask, Eero
Proceedings of East–West Design & Test Workshop (EWDTW’04) : Yalta, Alushta, Crimea, Ukraine, September 23-26, 2004
2004
/
p. 30-34
book article
17
journal article
Geneetilised algoritmid
Ivask, Eero
A & A
1999
/
1, lk. 33-39: ill
journal article
18
book article
Hierarchical fault simulation in digital systems
Ubar, Raimund-Johannes
;
Raik, Jaan
;
Ivask, Eero
;
Brik, Marina
International Symposium on Signals, Circuits and Systems : SCS 2001 : July 10-11, 2001, Iasi, Romania : proceedings
2001
/
p. 181-184 : ill
book article
19
book article
Improved VHDL input for high-level synthesis tool xTractor
Ellervee, Peeter
;
Ivask, Eero
;
Kruus, Margus
BEC 2006 : 2006 International Baltic Electronics Conference : Tallinn University of Technology, October 2-4, 2006, Tallinn, Estonia : proceedings of the 10th Biennial Baltic Electronics Conference
2006
/
p. 87-90 : ill
book article
20
book article
Integrated design and test generation under Internet based environment MOSCITO
Schneider, Andre
;
Ivask, Eero
;
Ubar, Raimund-Johannes
Euromicro Symposium on Digital System Design : Architectures, Methods and Tools : September 4-6, 2002, Dortmund, Germany : proceedings
2002
/
p. 187-194 : ill
http://dx.doi.org/10.1109/DSD.2002.1115368
book article
21
book article
Integration of digital test tools to the internet-based environment MOSCITO
Schneider, Andre
;
Diener, Karl-Heinz
;
Elst, Günter
;
Ivask, Eero
;
Raik, Jaan
;
Ubar, Raimund-Johannes
SCI 2003 : the 7th World Multiconference on Systemics, Cybernetics and Informatics : July 27-30, 2003, Orlando, Florida, USA : proceedings. Volume VIII, Applications of Informatics and Cybernetics in Science and Engineering
2003
/
p. 136-141 : ill
book article
22
book article
Internet based test generation and fault simulation
Ivask, Eero
;
Ubar, Raimund-Johannes
;
Raik, Jaan
;
Schneider, Andre
IEEE Design and Diagnostics of Electronic Circuits and Systems - IEEE DDECS 2001 : Fourth International Workshop on IEEE Design and Diagnostics of Electronic Circuits and Systems : Györ, Hungary, April 18-20, 2001
2001
/
p. 57-60 : ill
book article
23
book article
Internet-based collaborative test generation with MOSCITO [Electronic resource]
Schneider, Andre
;
Ivask, Eero
;
Miklos, P.
;
Raik, Jaan
;
Diener, Karl-Heinz
;
Ubar, Raimund-Johannes
;
Cibakova, Tatiana
;
Gramatova, Elena
SIGDA publications on CD-ROM : DATE'02 : Design, Automation and Test in Europe, Paris, France, March 4-8, 2002
2002
/
[6] p. [CD-ROM]
https://www.cecs.uci.edu/~papers/date07/PAPERS/2002/DATE02/PDFFILES/02E_2.PDF
book article
24
book article
Internet-based testability-driven test generation in the virtual environment MOSCITO
Schneider, Andre
;
Diener, Karl-Heinz
;
Elst, G.
;
Ivask, Eero
;
Raik, Jaan
;
Ubar, Raimund-Johannes
International Federation for Information Processing IFIP : International Workshop on IP-Based SoC Design 2002 : proceedings : Grenoble, October 30-31, 2002
2002
/
p. 357-362 : ill
http://publica.fraunhofer.de/dokumente/N-287433.html
book article
25
book article
Internet-basierter Systementwurf mit MOSCITO
Schneider, Andre
;
Schneider, Peter
;
Gramatova, Elena
;
Ivask, Eero
Entwurf Integrierter Schaltungen : 10. E.I.S.-Workshop : Präsentationen der ITG-Fachtagung : vom 3. bis 5. April 2001 in Dresden
2001
/
S. 295-296 : Ill
book article
Number of records 39, displaying
1 - 25
previous
1
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author
40
1.
Ivask, Eero
2.
Ivask, Angela
3.
Ivask, Anu
4.
Ivask, Jekaterina
5.
Ivask, Jüri
6.
Ivask, K.
7.
Ivask, Kaire
8.
Ivask, M.
9.
Ivask, Mari
10.
Ivask, Pille
11.
Ivask, Signe
12.
Jüri Ivask
13.
Ahola, Eero
14.
Alev, Eero
15.
Castren, Eero
16.
Eero, Kersti
17.
Eero, L.
18.
Eero, Margit
19.
Eero, Peeter
20.
Haapanen, Eero
21.
Haldre, Eero
22.
Kajosaari, Eero
23.
Kiipli, Eero
24.
Kontturi, Eero
25.
Loone, Eero
26.
Loonurm, Eero
27.
Merilind, Eero
28.
Naaber, Eero
29.
Nigumann, Eero
30.
Rannak, Eero
31.
Saarijärvi, Eero
32.
Salonen, Eero-Matti
33.
Semjonov, Eero
34.
Tohver, Eero
35.
Tuhkanen, Eero
36.
Tuominen, Eero
37.
Valge, Eero
38.
Vasar, Eero
39.
Väljaots, Eero
40.
Ülavere, Eero
CV
12
1.
Ivask, Eero 1971
2.
Ivask, Angela 1975
3.
Ivask, Jekaterina
4.
Ivask, Jüri 1961
5.
Ivask, Kaire 1964
6.
Ivask, Mari 1951
7.
Haldre, Eero 1961
8.
Muna, Eero 1912-1982
9.
Rannak, Eero 1907-1972
10.
Tohver, Eero 1973
11.
Tuhkanen, Eero 1979
12.
Uustalu, Eero 1967
name of the person
10
1.
Ivask, Angela
2.
Ivask, Jüri, 1961-
3.
Ivask, Mari, 1951-
4.
Endjärv, Eero
5.
Epner, Eero
6.
Kajosaari, Eero, 1927-
7.
Tuhkanen, Eero
8.
Vasar, Eero
9.
Veiderma, Eero
10.
Väljaots, Eero
subject term
1
1.
EERO. Kanada heategevusorganisatsioon
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