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Defect-oriented test generation and fault simulation in the environment of MOSCITO (title)
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book article
Defect-oriented test generation and fault simulation in the environment of MOSCITO
Schneider, Andre
;
Diener, Karl-Heinz
;
Gramatova, Elena
;
Fisherova, Maria
;
Ivask, Eero
;
Ubar, Raimund-Johannes
;
Pleskacz, Witold A.
;
Kuzmicz, W.
BEC 2002 : proceedings of the 8th Biennial Baltic Electronics Conference : October 6-9, 2002, Tallinn, Estonia
2002
/
p. 303-306 : ill
book article
Number of records 1, displaying
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keyword
27
1.
test generation and fault diagnosis
2.
Fault Injection Simulation
3.
fault simulation
4.
fault simulation with critical path tracing
5.
high-level fault simulation
6.
Parallel Fault Simulation with Critical Path Backtracing
7.
parallel fault-simulation
8.
adaptive test strategy generation
9.
automated test pattern generation
10.
automatic test case generation
11.
automatic test pattern generation
12.
automatic test program generation
13.
behaviour level test generation
14.
functional test generation
15.
Hierarchical Multi-level Test Generation
16.
high-level test data generation
17.
highlevel test generation
18.
implementation-independent test generation
19.
offline test generation
20.
provably correct test generation
21.
test generation
22.
Test Group Generation for Detecting Multiple Faults
23.
test program generation
24.
CoCoViLa simulation environment
25.
intelligent simulation environment
26.
automated test environment
27.
similar material simulation test
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