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fault simulation (keyword)
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1
book article
Accelerating transient fault injection campaigns by using Dynamic HDL Slicing
Bagbaba, Ahmet Cagri
;
Jenihhin, Maksim
;
Raik, Jaan
;
Sauer, Christian
2019 IEEE Nordic Circuits and Systems Conference (NORCAS) : NORCHIP and International Symposium of System-on-Chip (SoC), 29-30 October 2019, Helsinki, Finland : proceedings in IEEE Xplore
2019
/
7 p. : ill
https://doi.org/10.1109/NORCHIP.2019.8906932
book article
Related publications
1
Methods to optimize functional safety assessment for automotive integrated circuits = Meetodid autotööstuse kiipide funktsionaalse ohutuse hindamise optimeerimiseks
2
book article
Conditional fault collapsing in digital circuits with shared structurally synthesized BDDs [Online resource]
Jürimägi, Lembit
;
Ubar, Raimund-Johannes
BEC 2018 : 2018 16th Biennial Baltic Electronics Conference (BEC) : proceedings of the 16th Biennial Baltic Electronics Conference, October 8-10, 2018
2018
/
4 p. : ill
https://doi.org/10.1109/BEC.2018.8600967
book article
3
book article
DeepAxe : a framework for exploration of approximation and reliability trade-offs in DNN accelerators
Taheri, Mahdi
;
Riazati, Mohamad
;
Ahmadilivani, Mohammad Hasan
;
Jenihhin, Maksim
;
Daneshtalab, Masoud
;
Raik, Jaan
;
Sjödin, Mikael
;
Lisper, Björn
2023 24th International Symposium on Quality Electronic Design (ISQED)
2023
/
8 p. : ill
https://doi.org/10.1109/ISQED57927.2023.10129353
book article
Related publications
1
Methods for reliability assessment and enhancement of deep neural networks hardware accelerators = Süvanärvivõrkude riistvara kiirendite töökindluse hindamine ja täiustamine
4
journal article
Distributed approach for parallel exact critical path tracing fault simulation
Ivask, Eero
;
Devadze, Sergei
;
Ubar, Raimund-Johannes
International journal of microelectronics and computer science
2010
/
p. 165-174 : ill
journal article
5
journal article
Distributed fault simulation with collaborative load balancing for VLSI circuits
Ivask, Eero
;
Devadze, Sergei
;
Ubar, Raimund-Johannes
Scalable computing : practice and experience
2011
/
p. 153-163 : ill
journal article
6
book article
Efficient fault injection based on dynamic HDL slicing technique
Bagbaba, Ahmet Cagri
;
Jenihhin, Maksim
;
Raik, Jaan
;
Sauer, Christian
2019 IEEE 25th International Symposium on On-Line Testing and Robust System Design (IOLTS 2019) : 1-3 July 2019, Greece
2019
/
p. 52-53 : ill
https://doi.org/10.1109/IOLTS.2019.8854419
book article
Related publications
1
Methods to optimize functional safety assessment for automotive integrated circuits = Meetodid autotööstuse kiipide funktsionaalse ohutuse hindamise optimeerimiseks
7
book article EST
/
book article ENG
Exploration of Activation Fault Reliability in Quantized Systolic Array-Based DNN Accelerators
Taheri, Mahdi
;
Cherezova, Natalia
;
Ansari, Mohammad Saeed
;
Jenihhin, Maksim
;
Mahani, Ali
;
Daneshtalab, Masoud
;
Raik, Jaan
Proceedings of the Twenty Fifth International Symposium on Quality ElectronicDesign : ISQED 2024
2024
/
8 p. : ill
https://ieeexplore.ieee.org/stamp/stamp.jsp?arnumber=10528372
https://doi.org/10.1109/ISQED60706.2024.10528372
Conference proceedings at Scopus
Article at Scopus
Article at WOS
book article EST
/
book article ENG
Related publications
1
Methods for reliability assessment and enhancement of deep neural networks hardware accelerators = Süvanärvivõrkude riistvara kiirendite töökindluse hindamine ja täiustamine
8
book article
Fast RTL fault simulation using decision diagrams and bitwise set operations
Reinsalu, Uljana
;
Raik, Jaan
;
Ubar, Raimund-Johannes
;
Ellervee, Peeter
2011 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) : 3-5 October 2011, Vancouver, Canada
2011
/
p. 164-170
https://ieeexplore.ieee.org/document/6104440
book article
9
journal article
High-Level Implementation-Independent Functional Software-Based Self-Test for RISC Processors
Oyeniran, Adeboye Stephen
;
Ubar, Raimund-Johannes
;
Jenihhin, Maksim
;
Raik, Jaan
Journal of electronic testing : theory and applications
2020
/
p. 87-103
https://doi.org/10.1007/s10836-020-05856-7
journal article
10
book article
High-level test data generation for software based self-test in microprocessors
Oyeniran, Adeboye Stephen
;
Jasnetski, Artjom
;
Tšertov, Anton
;
Ubar, Raimund-Johannes
2017 6th Mediterranean Conference on Embedded Computing (MECO) : including ECYPS'2017 : proceedings : research monograph : Bar, Montenegro, June 11th-15th, 2017
2017
/
p. 86-91 : ill
https://doi.org/10.1109/MECO.2017.7977167
book article
11
book article
Modeling sequential circuits with shared structurally synthesized BDDs
Ubar, Raimund-Johannes
;
Marenkov, Mihhail
;
Mironov, Dmitri
;
Viies, Vladimir
Proceedings of 2014 9th International Design & Test Symposium (IDT) : Sheraton Club des Pins Hotel, Algiers, Algeria, December 16-18, 2014
2014
/
p. 130-135 : ill
book article
12
book article
SAFFIRA: a Framework for Assessing the Reliability of Systolic-Array-Based DNN Accelerators
Taheri, Mahdi
;
Daneshtalab, Masoud
;
Raik, Jaan
;
Jenihhin, Maksim
;
Pappalardo, Salvatore
;
Jimenez, Paul
;
Deveautour, Bastien
;
Bosio, Alberto
2024 27th International Symposium on Design & Diagnostics of Electronic Circuits & Systems (DDECS) : 03-05 April 2024, Kielce, Poland
2024
/
p. 19–24 : ill
https://doi.org/10.1109/DDECS60919.2024.10508925
Article at Scopus
Article at WOS
book article
Related publications
1
Methods for reliability assessment and enhancement of deep neural networks hardware accelerators = Süvanärvivõrkude riistvara kiirendite töökindluse hindamine ja täiustamine
13
book article
Shared Structurally Synthesized BDDs for speeding-up parallel pattern simulation in digital circuits
Ubar, Raimund-Johannes
;
Jürimägi, Lembit
;
Raik, Jaan
2015 Nordic Circuits and Systems Conference (NORCAS) : NORCHIP & International Symposium on System-on-Chip (SoC) : 1st IEEE NORCAS Conference : 26-28 October 2015, Oslo, Norway
2015
/
[4] p. : ill
http://dx.doi.org/10.1109/NORCHIP.2015.7364406
book article
14
book article EST
/
book article ENG
Special session: reliability assessment recipes for DNN accelerators
Ahmadilivani, Mohammad Hasan
;
Bosio, Alberto
;
Deveautour, Bastien
;
Dos Santos, Fernando Fernandes
;
Guerrero-Balaguera, Juan-David
;
Jenihhin, Maksim
;
Kritikakou, Angeliki
;
Sierra, Robert Limas
;
Raik, Jaan
;
Taheri, Mahdi
42nd IEEE VLSI Test Symposium, VTS 2024 : proceedings
2024
/
11 p. : ill
https://doi.org/10.1109/VTS60656.2024.10538707
Conference proceedings at Scopus
Article at Scopus
Article at WOS
book article EST
/
book article ENG
Related publications
1
Methods for reliability assessment and enhancement of deep neural networks hardware accelerators = Süvanärvivõrkude riistvara kiirendite töökindluse hindamine ja täiustamine
15
book article
Teaching digital system test
Oyeniran, Adeboye Stephen
;
Ubar, Raimund-Johannes
;
Kruus, Margus
The 27th EAEEIE Annual Conference : June 7-9, 2017, Grenoble
2017
/
[6] p
book article
16
book article
A tool set for teaching design-for-testability of digital circuits
Kostin, Sergei
;
Orasson, Elmet
;
Ubar, Raimund-Johannes
EWME 2016 : 11th European Workshop on Microelectronics Education : May 11-13, 2016, Southampton, UK
2016
/
[6] p. : ill
https://doi.org/10.1109/EWME.2016.7496466
book article
Number of records 16, displaying
1 - 16
keyword
200
1.
fault simulation
2.
fault simulation with critical path tracing
3.
high-level fault simulation
4.
Parallel Fault Simulation with Critical Path Backtracing
5.
parallel fault-simulation
6.
Fault Injection Simulation
7.
AI-based fault detection
8.
asynchronous fault detection
9.
automatic fault diagnosis
10.
bearing fault diagnosis
11.
bi-directional fault monitoring devices
12.
conditional fault collapsing
13.
control fault models
14.
critical path fault tracing
15.
cross-layer fault tolerance
16.
cross-layered fault management
17.
extended fault class
18.
fault currents
19.
fault analysis
20.
fault analysis model
21.
fault classification
22.
fault classification
23.
fault collapsing
24.
fault compensation
25.
fault coverage
26.
fault current and voltage measurements
27.
Fault current limite
28.
fault current limiter
29.
fault detection
30.
fault detection and classification
31.
fault detection and diagnoses
32.
fault detection and diagnosis
33.
fault detection and diagnostics (FDD)
34.
fault diagnosis
35.
fault diagnostic
36.
fault diagnostic resolution
37.
fault diagnostics
38.
fault dignosis
39.
fault effects
40.
fault emulation
41.
fault equivalence and dominance
42.
fault handling
43.
fault handling strategy
44.
fault indicator
45.
fault injection
46.
fault Interruption
47.
fault localization
48.
fault location
49.
fault management
50.
fault masking
51.
fault modeling
52.
fault models
53.
fault monitoring
54.
fault prediction
55.
fault protection
56.
fault redundancy
57.
fault resilience
58.
fault ride through
59.
Fault ride through enhancement
60.
fault seeding
61.
fault signal
62.
fault simulastion
63.
fault tolerance
64.
fault tolerant
65.
fault tolerant computer systems
66.
fault tolerant control
67.
fault tolerant operation
68.
fault tolerant router design
69.
fault tolerant systems
70.
fault tree analysis
71.
fault-injection attack
72.
fault-plane solution
73.
fault-resilience
74.
fault-resistant
75.
fault-ride-through (FRT)
76.
fault-tolerance
77.
fault-tolerant
78.
Fault-tolerant (FT) converters
79.
fault-tolerant control
80.
fault-tolerant converter
81.
functional fault model
82.
high-level control fault model
83.
high-level fault coverage
84.
high-level fault model
85.
high-level functional fault model
86.
hybrid fault detection
87.
Katun fault
88.
low-level fault redundancy
89.
no fault found
90.
No-Fault-Found
91.
open circuit fault
92.
photovoltaic fault detection algorithms
93.
PV fault classification
94.
short circuit fault
95.
spectrum-based fault localization
96.
stacking fault
97.
stuck-at fault model
98.
test generation and fault diagnosis
99.
transient fault mitigation
100.
transmission lines fault
101.
annual energy simulation
102.
back traced simulation
103.
building energy simulation
104.
building simulation
105.
casting simulation
106.
CFD simulation
107.
circuit simulation
108.
CoCoViLa simulation environment
109.
computer simulation
110.
computer simulation environments
111.
cooling simulation
112.
co-simulation
113.
data simulation
114.
digital real time simulation
115.
digital shipping simulation
116.
dynamic simulation
117.
electric field simulation
118.
emergency simulation
119.
energy simulation
120.
energy simulation software
121.
environmental performance assessment and simulation
122.
finite element method (FEM) simulation
123.
finite element simulation
124.
fluid flow simulation
125.
FMS modelling and simulation
126.
fullscale simulation
127.
gait simulation
128.
hardware-in-the loop simulation
129.
Hardware-in-the-Loop simulation
130.
hospital simulation
131.
hot/cold pressing and finite element model simulation
132.
hygrothermal simulation
133.
impact scenario simulation
134.
impact-abrasive simulation
135.
intelligent simulation
136.
intelligent simulation environment
137.
LES (large eddy simulation) method
138.
logic models and simulation
139.
logic simulation
140.
long-term simulation
141.
magnetics field simulation
142.
Mathematical simulation
143.
MATLAB simulation
144.
medical simulation
145.
meso-scale simulation
146.
MICA2 simulation
147.
model building and simulation
148.
modeling and simulation
149.
modelling and simulation
150.
Monte Carlo simulation
151.
Monte Carlo simulation (MCS)
152.
multi agent simulation
153.
multiscale simulation
154.
Multi-valued Simulation for Hazard Detection in Digital Circuits
155.
numerical simulation
156.
parallel simulation
157.
phase diagram simulation
158.
power system simulation
159.
process simulation
160.
ray-tracing simulation
161.
real time simulation
162.
real-time simulation
163.
register transfer and gate level simulation
164.
response simulation
165.
rheology simulation
166.
Siemens Tecnomatix Plant Simulation (STPS) platform
167.
signal simulation
168.
signal simulation and modeling
169.
similar material simulation test
170.
simulation
171.
simulation analysis
172.
simulation and analysis
173.
simulation applications
174.
simulation based static optimization
175.
simulation based TMY
176.
simulation model
177.
simulation modeling
178.
simulation models
179.
simulation of air change
180.
simulation of energy consumption
181.
simulation software "Delphin"
182.
simulation trace
183.
simulation training
184.
simulationbased decision support
185.
simulation-based verification
186.
spinach simulation
187.
SUMO simulation
188.
supply chain simulation
189.
system level simulation
190.
systems simulation
191.
TD-DFT simulation
192.
urban simulation
193.
validation of simulation model
194.
wear simulation
195.
vehicle simulation
196.
whole building simulation
197.
visual simulation
198.
3D simulation
199.
5G New Radio simulation
200.
(co-)simulation
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