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Evolutionary approach to the functional test generation for digital circuits (title)
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book article
Evolutionary approach to the functional test generation for digital circuits
Skobtsov, Y.A.
;
Ivanov, D.E.
;
Skobtsov, V.Y.
;
Ubar, Raimund-Johannes
BEC 2004 : proceedings of the 9th Biennial Baltic Electronics Conference : October 3-6, 2004, Tallinn, Estonia
2004
/
p. 229-232 : ill
book article
Number of records 1, displaying
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keyword
24
1.
functional test generation
2.
functional self-test
3.
digital circuits
4.
digital circuits and systems
5.
Multi-valued Simulation for Hazard Detection in Digital Circuits
6.
Structural Decision Diagrams for Modeling Digital Circuits
7.
adaptive test strategy generation
8.
automated test pattern generation
9.
automatic test case generation
10.
automatic test pattern generation
11.
automatic test program generation
12.
behaviour level test generation
13.
Hierarchical Multi-level Test Generation
14.
high-level test data generation
15.
highlevel test generation
16.
implementation-independent test generation
17.
offline test generation
18.
provably correct test generation
19.
test generation
20.
test generation and fault diagnosis
21.
Test Group Generation for Detecting Multiple Faults
22.
test program generation
23.
digital test
24.
Digital test and testable design
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