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book article
BIST analyzer : a training platform for SoC testing [Electronic resource]
Jutman, Artur
;
Tšertov, Anton
;
Tšepurov, Anton
;
Aleksejev, Igor
;
Ubar, Raimund-Johannes
;
Wuttke, Heinz-Dietrich
37th Annual Frontiers in Education Conference : Global Engineering : Knowledge Without Borders, Opportunities Without Passports : Milwaukee, Wisconsin, October 10-13, 2007
2007
/
p. S3H-8-S3H-13 : ill. [CD-ROM]
http://dx.doi.org/10.1109/FIE.2007.4418125
book article
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keyword
98
1.
courses on electronic testing and design
2.
design field testing
3.
electronic design automation
4.
nano-electronic systems design
5.
ADR regulations training courses
6.
correspondence courses
7.
DG training courses
8.
education courses
9.
educational courses
10.
IT education elective courses
11.
open online courses
12.
optional courses
13.
retraining courses
14.
self-study courses
15.
technical courses
16.
design methodology and human-centred design
17.
accelerated testing
18.
acoustomechanical testing
19.
anaerobic testing
20.
aspect-oriented testing
21.
assessment and testing
22.
at-speed testing
23.
benchmark testing
24.
Berridge testing
25.
burst testing
26.
cancer genomic testing
27.
compliance testing
28.
compositional testing
29.
computer aided testing
30.
cone heater testing
31.
conformance testing
32.
cybersecurity testing
33.
D. non-destructive testing
34.
deformation testing
35.
destructive testing
36.
eddy current testing
37.
eddy current testing (ECT)
38.
erosion testing
39.
fabric testing
40.
fatigue testing
41.
fire testing
42.
hierarchical testing
43.
hypotheses testing
44.
Implementation-Independent Testing of Microprocessors
45.
integration testing
46.
laboratory scale testing
47.
load testing
48.
macro mechanical testing and green surface tribology
49.
material testing
50.
materials testing
51.
measurement and testing
52.
mechanical testing
53.
memory testing
54.
metamorphic testing
55.
microprocessor testing
56.
model based testing
57.
model-based mutation testing
58.
model-based testing
59.
mutation testing
60.
network-testing
61.
non destructive testing
62.
nondestructive testing
63.
non-destructive testing
64.
on-site testing
65.
pin on disc wear testing
66.
PMU calibration testing
67.
PMU testing
68.
point-of-care testing
69.
processor core testing
70.
processor testing
71.
real-time HiL testing
72.
regression testing
73.
RISC processor testing
74.
robustness testing
75.
safety and security testing
76.
scenario testing
77.
scratch testing
78.
security testing
79.
shear testing
80.
small-scale fire testing
81.
software testing
82.
software-in-the-loop (SIL) testing
83.
stand-alone testing
84.
stress-testing
85.
substation testing methods
86.
system testing
87.
tensile testing
88.
testing
89.
testing methods
90.
testing of digital devices
91.
testing of generator
92.
testing of phasor measurement units
93.
two-dimensional array testing
94.
ultrasonic testing
95.
wafer testing
96.
wear testing
97.
vibration testing
98.
virtual testing
TalTech department
1
1.
Testing and Calibration Centre of TUT
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