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book article
BIST analyzer : a training platform for SoC testing [Electronic resource]
Jutman, Artur
;
Tšertov, Anton
;
Tšepurov, Anton
;
Aleksejev, Igor
;
Ubar, Raimund-Johannes
;
Wuttke, Heinz-Dietrich
37th Annual Frontiers in Education Conference : Global Engineering : Knowledge Without Borders, Opportunities Without Passports : Milwaukee, Wisconsin, October 10-13, 2007
2007
/
p. S3H-8-S3H-13 : ill. [CD-ROM]
http://dx.doi.org/10.1109/FIE.2007.4418125
book article
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keyword
102
1.
courses on electronic testing and design
2.
design field testing
3.
electronic design automation
4.
nano-electronic systems design
5.
ADR regulations training courses
6.
correspondence courses
7.
DG training courses
8.
education courses
9.
educational courses
10.
IT education elective courses
11.
open online courses
12.
optional courses
13.
retraining courses
14.
self-study courses
15.
technical courses
16.
design methodology and human-centred design
17.
accelerated testing
18.
acoustomechanical testing
19.
anaerobic testing
20.
aspect-oriented testing
21.
assessment and testing
22.
at-speed testing
23.
benchmark testing
24.
Berridge testing
25.
burst testing
26.
cancer genomic testing
27.
compliance testing
28.
compositional testing
29.
computer aided testing
30.
cone heater testing
31.
conformance testing
32.
cybersecurity testing
33.
D. non-destructive testing
34.
deformation testing
35.
destructive testing
36.
eddy current testing
37.
eddy current testing (ECT)
38.
erosion testing
39.
fabric testing
40.
fatigue testing
41.
fire testing
42.
hierarchical testing
43.
hypotheses testing
44.
Implementation-Independent Testing of Microprocessors
45.
integration testing
46.
laboratory scale testing
47.
load testing
48.
macro mechanical testing and green surface tribology
49.
material testing
50.
materials testing
51.
measurement and testing
52.
mechanical testing
53.
memory testing
54.
metamorphic testing
55.
microprocessor testing
56.
model based testing
57.
model-based mutation testing
58.
model-based testing
59.
multi-scenario testing
60.
mutation testing
61.
network-testing
62.
non destructive testing
63.
nondestructive testing
64.
non-destructive testing
65.
non-destructive testing (NDT)
66.
On-site drug testing
67.
on-site testing
68.
pin on disc wear testing
69.
PMU calibration testing
70.
PMU testing
71.
point-of-care testing
72.
processor core testing
73.
processor testing
74.
real-time HiL testing
75.
regression testing
76.
RISC processor testing
77.
robustness testing
78.
safety and security testing
79.
scenario testing
80.
Scenario-Based Testing
81.
scratch testing
82.
security testing
83.
shear testing
84.
small-scale fire testing
85.
software testing
86.
software-in-the-loop (SIL) testing
87.
stand-alone testing
88.
stress-testing
89.
substation testing methods
90.
system testing
91.
tensile testing
92.
testing
93.
testing methods
94.
testing of digital devices
95.
testing of generator
96.
testing of phasor measurement units
97.
two-dimensional array testing
98.
ultrasonic testing
99.
wafer testing
100.
wear testing
101.
vibration testing
102.
virtual testing
TalTech department
1
1.
Testing and Calibration Centre of TUT
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