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High-level test data generation for software based self-test in microprocessors (title)
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book article
High-level test data generation for software based self-test in microprocessors
Oyeniran, Adeboye Stephen
;
Jasnetski, Artjom
;
Tšertov, Anton
;
Ubar, Raimund-Johannes
2017 6th Mediterranean Conference on Embedded Computing (MECO) : including ECYPS'2017 : proceedings : research monograph : Bar, Montenegro, June 11th-15th, 2017
2017
/
p. 86-91 : ill
https://doi.org/10.1109/MECO.2017.7977167
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keyword
36
1.
high-level test data generation
2.
Automated Synthesis of Software-based Self-test
3.
software based self-test
4.
software-based self-test
5.
software-based self-test (SBST)
6.
behaviour level test generation
7.
Hierarchical Multi-level Test Generation
8.
high-level synthesis for test
9.
adaptive test strategy generation
10.
automated test pattern generation
11.
automatic test case generation
12.
automatic test pattern generation
13.
automatic test program generation
14.
built-in self-test
15.
functional self-test
16.
functional test generation
17.
highlevel test generation
18.
implementation-independent test generation
19.
logic built-in self-test
20.
offline test generation
21.
provably correct test generation
22.
self-test
23.
self-test architectures
24.
test generation
25.
test generation and fault diagnosis
26.
Test Group Generation for Detecting Multiple Faults
27.
test program generation
28.
system level test
29.
high-speed serial link test
30.
FPGA based test
31.
rtioco-based timed test sequences
32.
logic level and high level BDDs
33.
self learning software
34.
extreme penetration level of non synchronous generation
35.
software level TMR
36.
software security level
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