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Ubar, Raimund-Johannes (TTÜ author)
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651
journal article
10th IEEE European Test Symposium
Ubar, Raimund-Johannes
;
Prinetto, Paolo
;
Raik, Jaan
IEEE journal of design & test of computers
2005
/
p. 480-481 : phot
http://dx.doi.org/10.1109/MDT.2005.106
journal article
652
book article
"Tervis ruudus", ehk, Tippkeskuse CEBE lugu
Ubar, Raimund-Johannes
Teadusmõte Eestis (X). Tehnikateadused. 3 : [artiklikogumik]
2019
/
lk. 200-215 : ill., fot
https://www.ester.ee/record=b5208765*est
book article
653
book article
Test configurations for diagnosing faulty links in NoC switches
Raik, Jaan
;
Ubar, Raimund-Johannes
;
Govind, Vineeth
12th IEEE European Test Symposium ETS 2007 : 20-24 May 2007, Freiburg, Germany : proceedings
2007
/
p. 29-34 : ill
http://dx.doi.org/10.1109/ETS.2007.41
book article
654
book article
Test configurations for diagnosing faulty links in NoC switches
Raik, Jaan
;
Ubar, Raimund-Johannes
;
Govind, Vineeth
Info- ja kommunikatsioonitehnoloogia doktorikooli IKTDK teise aastakonverentsi artiklite kogumik : 11.-12. mai 2007, Viinistu kunstimuuseum
2007
/
lk. 33-37 : ill
book article
655
book article
Test cost minimization for hybrid BIST
Jervan, Gert
;
Peng, Zebo
;
Ubar, Raimund-Johannes
IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems : 25-27 October 2000, Yamanashi, Japan : proceedings
2000
/
p. 283-298 : ill
book article
656
journal article
Test cover calculation in digital systems with word-level decision diagrams
Ubar, Raimund-Johannes
;
Raik, Jaan
;
Ivask, Eero
;
Brik, Marina
Вестник Томского государственного университета
2002
/
с. 315-319 : ил
journal article
657
book article
Test generation : a hierarchical approach
Jervan, Gert
;
Ubar, Raimund-Johannes
;
Peng, Z.
;
Eles, Petru
System-level test and validation of hardware/software systems
2005
/
p. 67-81 : ill
book article
658
book article
Test generation for digital systems
Ubar, Raimund-Johannes
Digest of papers - FTCS 13th Annual International Symposium on Fault-Tolerant Computing, June 28 - 30, 1983, Milano, Italy
1983
/
p. 374-377
book article
659
book article
Test generation for digital systems at functional level
Ubar, Raimund-Johannes
;
Kuchcinski, Ktzysztof
;
Peng, Z.
Research report LiTH-IDA-R-90-06, Linköping University, Sweden
1990
/
p. 1-21
book article
660
book article
Test generation for digital systems based on alternative graphs
Ubar, Raimund-Johannes
Dependable Computing - EDCC-1 : First European Dependable Computing Conference, Berlin, Germany, October 1994 : proceedings
1994
/
p. 151-164: ill
book article
661
book article
Test generation for finite state machines
Ubar, Raimund-Johannes
;
Brik, Marina
BEC'96 : the 5th Biennial Baltic Electronics Conference, October 7-11, 1996, Tallinn, Estonia : proceedings
1996
/
p. 233-236: ill
book article
662
book article
Test generation for microprocessor control mechanisms
Lohuaru, Tõnu
;
Ubar, Raimund-Johannes
FTSD-10 : Deseta Mezdunarodnaja Konferencija "Nadezdnost i Diagnostika na ECM. Mikrokompjutri i Sistemi", Varna, Bulgaria, 1987 = 10th International Conference on Fault-Tolerant Systems and Diagnostics (1987)
1987
/
p. 305-311
book article
663
book article
Test generation for microprocessors on alternative graphs
Alango, Villem
;
Kont, Toomas
;
Ubar, Raimund-Johannes
33. Internationales Wissenschaftliches Kolloquium : 24.-28.10.1988. H.3 Vortragsreihe B, technische und angewandte Informatik/Computertechnik
1988
/
p. 11-14
book article
664
book article
Test generation techniques and algorithms
Ubar, Raimund-Johannes
;
Gramatova, Elena
;
Fisherova, Maria
Handbook of testing electronic systems
2005
/
p. 99-173 : ill
book article
665
book article
Test generation with structurally synthesized BDD models
Raik, Jaan
;
Ubar, Raimund-Johannes
Proceedings of the 5th Electronic Devices and Systems Conference, Brno, June 11-12, 1998
1998
/
p. 66-68
book article
666
journal article
Test methods for crosstalk-induced delay and glitch faults in network-on-chip interconnects implementing asynchronous communication protocols
Bengtsson, Tomas
;
Kumar, Shashi
;
Ubar, Raimund-Johannes
;
Jutman, Artur
;
Peng, Zebo
IET computers and digital techniques
2008
/
6, p. 445-460
journal article
667
book article
Test pattern generation for microprocessor systems on the alternative graph model
Ubar, Raimund-Johannes
Proceedings of the 3rd Symposium of the IMEKO Technical Committee on Technical Diagnostics (TC10), held in Moscow, October 3 - 5, 1983
1985
/
p. 403-410
book article
668
book article
Test set minimization using bipartite graphs
Markus, Antti
;
Raik, Jaan
;
Ubar, Raimund-Johannes
BEC'98 : the 6th Biennial Conference on Electronics and Microsystems Technology, October 7-9, 1998, Tallinn, Estonia : proceedings
1998
/
p. 175-178: ill
book article
669
journal article
Test synthesis with alternative graphs
Ubar, Raimund-Johannes
IEEE design & test of computers
1996
/
Spring, p. 48-57: ill
journal article
670
journal article
Test system for fault detection and diagnosis in microprocessor control devices
Ubar, Raimund-Johannes
;
Lohuaru, Tõnu
;
Männisalu, Mati
;
Pukk, P.
;
Vanamölder, E.
Tallinna Tehnikaülikooli Toimetised
1990
/
lk. 63-77: ill
journal article
671
journal article
Test time minimization for hybrid BIST of core-based systems
Jervan, Gert
;
Eles, Petru
;
Peng, Zebo
;
Ubar, Raimund-Johannes
;
Jenihhin, Maksim
Journal of computer science and technology
2006
/
6, p. 907-912 : ill
https://link.springer.com/article/10.1007/s11390-006-0907-x
journal article
672
book article
Test time minimization for hybrid BIST of core-based systems
Jervan, Gert
;
Eles, Petru
;
Peng, Zebo
;
Ubar, Raimund-Johannes
;
Jenihhin, Maksim
12th Asian Test Symposium (ATS 2003) : 17-19 November 2003, Xian, China
2003
/
p. 318-325 : ill
book article
673
book article
Test time minimization for hybrid BIST with test pattern broadcasting
Ubar, Raimund-Johannes
;
Jenihhin, Maksim
;
Jervan, Gert
;
Peng, Zebo
IEEE NORCHIP 2003 : 21 Norchip Conference : Riga, Latvia, 10-11 November 2003 : proceedings
2003
/
p. 112-116 : ill
book article
674
book article
Testability analysis for efficient register-transfer level test generation [Electronic resource]
Nõmmeots, Tanel
;
Raik, Jaan
;
Ubar, Raimund-Johannes
9th International Conference MIXDES 2002 : Mixed Design of Integrated Circuits and Systems, Wroclaw, Poland, 20-22 June 2002
2002
/
[4] p. [CD-ROM]
book article
675
book article
Testability calculation for digital circuits with decision diagrams
Ubar, Raimund-Johannes
3rd IEEE Latin American Test Workshop : LATW'02, Montevideu, Uruguay, February 10-13, 2002 : digest of papers
2002
/
p. 137-143 : ill
book article
Number of records 830, displaying
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author
56
1.
Ubar, Raimund-Johannes
2.
Hagelberg, Raimund
3.
Räämet, Raimund
4.
Aare, Johannes
5.
Avik, Eduard Johannes
6.
Bauer, Johannes
7.
Bender, Naatan Johannes
8.
Buchmann, Johannes
9.
Deelstra, Johannes
10.
Ehala, Johannes
11.
Engelmayer, Johannes
12.
Gotzmann, Johannes
13.
Helander, Johannes
14.
Hint, Johannes
15.
Hüsse, Johannes
16.
Johannes, Anu
17.
Johannes, Ellen
18.
Johannes, Ille
19.
Johannes, Kaljo-Mihkel
20.
Järv, Johannes
21.
Kadak, Johannes
22.
Kajander, Aleksi Oskar Johannes
23.
Karstensen, Johannes
24.
Kerkhoven, Eduard Johannes
25.
Kiivet, Johannes
26.
Krimmer, Robert Johannes
27.
Kukebal, Johannes
28.
Meitre, Johannes
29.
Miller, Johannes
30.
Mühlman, Johannes
31.
Norberg, Johannes
32.
Notermans, Antonius Johannes Hubertus
33.
Ortlepp, Johannes
34.
Parikas, Johannes
35.
Pello, Johannes
36.
Pervik, Johannes-Eduard
37.
Piiper, Johannes
38.
Presmann, Johannes
39.
Putk, Aksel-Johannes
40.
Pätsch, Johannes
41.
Saar, Johannes
42.
Sautter, Johannes
43.
Sinisalo, Touko Johannes
44.
Steinbrunn, Johannes
45.
Sutt, Johannes
46.
Zeiringer, Johannes Paul
47.
Taimsalu, Johannes
48.
Talu, Martin Johannes
49.
Tammekänd, Johannes
50.
Tilk, Johannes
51.
Tralla, Johannes
52.
Veerus, Johannes
53.
Vibur, Johannes Ferdinand
54.
Vind, Johannes
55.
Voll, Johannes
56.
Voltri, Johannes
CV
56
1.
Ubar, Raimund-Johannes 1941
2.
Räämet, Raimund 1918-2004
3.
Aare, Johannes 1915-2000
4.
Ahrenschild, Johannes (-1936)
5.
Alaots, Johannes
6.
Aljak, Arnold Johannes
7.
Allik, Erich-Johannes
8.
Avik, Eduard Johannes
9.
Drechsler, Wolfgang Johannes Max
10.
Ehala, Johannes 1986
11.
Hint, Johannes 1914-1985
12.
Johannes, Ille 1939
13.
Johannson, Johannes
14.
Johanson, Johannes
15.
Juhans, Johannes 1874-1956
16.
Kajander, Aleksi Oskar Johannes 1994
17.
Kiiwet, Johannes
18.
Kiivet, Johannes 1879-1967
19.
Kivit, Johannes
20.
Kollist, Johannes 1884-1937
21.
Kollist, Johannes Theodor
22.
Korv, August Johannes 1911-1981
23.
Krimmer, Robert Johannes
24.
Käpp, Martin Johannes
25.
Langel, Johannes 1900-1985
26.
Langell, Johannes
27.
Livländer, Robert Johannes
28.
Madise, Johannes 1920
29.
Meitre, Johannes 1906-1978
30.
Messer, Johannes
31.
Muru, Johannes 1995
32.
Mäll, Johannes 1911-1981
33.
Mühlman, Johannes
34.
Mühlmann, Johannes 1888-1936
35.
Notermans, Antonius Johannes Hubertus 1959
36.
Nuudi, Johannes 1895-1975
37.
Palo, Johannes 1925-1960
38.
Pals, Johannes 1903-1941
39.
Pello, Johannes 1958
40.
Pervik, Johannes 1892-1958
41.
Presmann, Johannes 1942
42.
Putk, Aksel-Johannes 1928-1999
43.
Püümann, Mait Johannes
44.
Roes, Johannes 1914
45.
Russwurm, Johannes
46.
Russvurm, Johannes 1855-1939
47.
Russvurm, Johannes Carl Gysbert Immanuel
48.
Sakeus, Johannes 1880-1934
49.
Taimsalu, Johannes 1891-1942
50.
Teiman, Johannes
51.
Teimann, Johannes Rudolf (kuni 22.05.1935)
52.
Tomson, Johannes
53.
Tuulre, Feliks Johannes 1908-1987
54.
Veerus, Johannes Voldemar 1897-1972
55.
Verus, Johannes Voldemar
56.
Vuhk, Oskar Johannes
name of the person
27
1.
Ubar, Raimund-Johannes, 1941-
2.
Hagelberg, Raimund, 1927-2012
3.
Räämet, Raimund, 1918-2004
4.
Aare, Johannes, 1915-2000
5.
Aavik, Johannes, 1880-1973
6.
Avik, Eduard Johannes, 1891-1942
7.
Bender, Naatan Johannes
8.
Granö, Johannes Gabriel
9.
Hint, Johannes, 1914-1985
10.
Johannes Paulus II, paavst, 1920-2005
11.
Kert, Johannes
12.
Kiivet, Johannes, 1879-1967
13.
Kollist, Johannes
14.
Käis, Johannes
15.
Lang, Johannes
16.
Maide, Johannes Voldemar
17.
Mossov, Johannes
18.
Pals, Johannes, 1903-1941
19.
Pello, Johannes
20.
Putk, Aksel-Johannes
21.
Rammul, Aleksander Johannes, 1875-1949
22.
Steinbrunn, Johannes
23.
Taimsalu, Johannes, 1891-1942
24.
Talu, Martin Johannes
25.
Veerus, Johannes Voldemar, 1897-1972
26.
Veski, Johannes Voldemar, 1873-1968
27.
Voll, Johannes
subject term
1
1.
Johannes Mittus, vasevalamise tööstus
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