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Ubar, Raimund-Johannes (TalTech author)
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226
journal article
Elektroonika kompetentsuskeskus Tallinna Tehnikaülikooli juures
Ubar, Raimund-Johannes
Arvutustehnika ja Andmetöötlus
1994
/
2, lk. 33-36 ; 3, lk. 28-33
journal article
227
journal article
Elektroonika kompetentsuskeskus Tallinna Tehnikaülikoolis
Ubar, Raimund-Johannes
Sõnumileht
1996
/
13. veebr., lk. 17
journal article
228
journal article
Elektroonika kompetentsuskeskusest Tallinna Tehnikaülikooli juures
Ubar, Raimund-Johannes
Arvutustehnika ja Andmetöötlus
1996
/
1, lk. 2-4
journal article
229
book article
Elektroonika kui Eesti innovatsioonisüsteemi infrastruktuur
Min, Mart
;
Rang, Toomas
;
Ubar, Raimund-Johannes
Eesti teadlaste kongress, 11.-15. augustini 1996. a. Tallinnas : ettekannete kokkuvõtted
1996
/
lk. 265
https://www.ester.ee/record=b1052731*est
book article
230
journal article
Elektroonikadisaini uued paradigmad
Ubar, Raimund-Johannes
A & A
1998
/
5, lk. 5-10
journal article
231
journal article
Elektroonikatööstuse 50 miljonit
Ubar, Raimund-Johannes
Luup
1999
/
1, lk. 23-25: ill
journal article
232
book article
Embedded diagnosis in digital systems
Ubar, Raimund-Johannes
;
Kostin, Sergei
;
Raik, Jaan
2008 26th International Conference on Microelectronics : Niš, Serbia, 11-14 May 2008 : proceedings. Vol. 2
2008
/
p. 421-424 : ill
book article
233
journal article
Embedded fault diagnosis in digital systems with BIST
Ubar, Raimund-Johannes
;
Kostin, Sergei
;
Raik, Jaan
Microprocessors and microsystems
2008
/
5/6, p. 279-287 : ill
journal article
234
book article
Energy minimization for hybrid BIST in a system-on-chip test environment
Ubar, Raimund-Johannes
;
Shchenova, Tatjana
;
Jervan, Gert
;
Peng, Zebo
European Test Symposium : ETS 2005 : 22-25 May 2005, Tallinn, Estonia : proceedings
2005
/
p. 2-7 : ill
book article
235
book article
Enhancing hierarchical ATPG with a functional fault model for multiplexers [Electronic resource]
Raik, Jaan
;
Ubar, Raimund-Johannes
7th IEEE Workshop on Design and Diagnostics of Electronic Circuits and Systems : April 18-21, 2004, Stará Lesná, Slovakia : proceedings
2004
/
p. 219-222 : ill. [CD-ROM]
https://www.semanticscholar.org/paper/Enhancing-Hierarchical-Atpg-with-a-Functional-Fault-Raik-Ubar/b42e913ac070fd774df97bd644c4e6220704f8d4
book article
236
journal article
Environment for FPGA-based fault emulation
Ellervee, Peeter
;
Raik, Jaan
;
Tammemäe, Kalle
;
Ubar, Raimund-Johannes
Proceedings of the Estonian Academy of Sciences. Engineering
2006
/
3-2, p. 323-335 : ill
journal article
237
book article
Environment for innovative university research training in the field of digital test
Oyeniran, Adeboye Stephen
;
Ademilua, Tolulope
;
Kruus, Margus
;
Ubar, Raimund-Johannes
2021 30th Annual Conference of the European Association for Education in Electrical and Information Engineering (EAEEIE)
2021
https://doi.org/10.1109/EAEEIE50507.2021.9531003
book article
238
journal article EST
/
journal article ENG
Environment for the analysis of functional self-test quality in digital systems
Ubar, Raimund-Johannes
;
Kostin, Sergei
;
Kruus, Helena
;
Aarna, Margit
;
Devadze, Sergei
Proceedings of the Estonian Academy of Sciences
2014
/
p. 151-162 : ill
https://artiklid.elnet.ee/record=b2673964*est
https://doi.org/10.3176/proc.2014.2.05
Journal metrics at Scopus
Article at Scopus
Journal metrics at WOS
Article at WOS
journal article EST
/
journal article ENG
239
book article
Equivalent transformations of structurally synthesized BDDs and applications
Jürimägi, Lembit
;
Ubar, Raimund-Johannes
;
Viies, Vladimir
2019 8th Mediterranean Conference on Embedded Computing (MECO)
2019
/
6 p. : ill
https://doi.org/10.1109/MECO.2019.8760283
book article
240
book article
Evolutionary approach to test generation for functional BIST
Skobtsov, Y.A.
;
Ivanov, D.E.
;
Skobtsov, V.Y.
;
Ubar, Raimund-Johannes
;
Raik, Jaan
Informal Digest of Papers : 10 IEEE European Test Symposium : Tallinn, Estonia, May 22-25, 2005
2005
/
p. 151-155 : ill
https://artiklid.elnet.ee/record=b1018764*est
book article
241
book article
Evolutionary approach to the functional test generation for digital circuits
Skobtsov, Y.A.
;
Ivanov, D.E.
;
Skobtsov, V.Y.
;
Ubar, Raimund-Johannes
BEC 2004 : proceedings of the 9th Biennial Baltic Electronics Conference : October 3-6, 2004, Tallinn, Estonia
2004
/
p. 229-232 : ill
book article
242
journal article
Exact parallel critical path fault tracing to speed-up fault simulation in sequential circuits
Kõusaar, Jaak
;
Ubar, Raimund-Johannes
;
Kostin, Sergei
;
Devadze, Sergei
;
Raik, Jaan
International journal of microelectronics and computer science
2018
/
p. 9−18
https://ijmcs.dmcs.pl/web/guest/vol.-9-no.-1
https://ijmcs.dmcs.pl/documents/10630/345460/IJMCS_1_2018_2.pdf
journal article
243
book article
Exact static compaction of independent test sequences
Raik, Jaan
;
Jutman, Artur
;
Ubar, Raimund-Johannes
BEC 2002 : proceedings of the 8th Biennial Baltic Electronics Conference : October 6-9, 2002, Tallinn, Estonia
2002
/
p. 315-318 : ill
book article
244
book article
Exact static compaction of sequential circuit tests using branch-and-bound and search state registration
Raik, Jaan
;
Jutman, Artur
;
Ubar, Raimund-Johannes
ETW'02 : 7th IEEE European Test Workshop, Gorfu Greece, May 26-29, 2002 : informal digest
2002
/
p. 19-20
https://www.researchgate.net/publication/250423148_Exact_Static_Compaction_of_Sequential_Circuit_Tests_Using_Branch_and-Bound_and_Search_State_Registration
book article
245
book article
Experimental comparison of different diagnosis algorithms in the BIST environment
Ubar, Raimund-Johannes
;
Kostin, Sergei
;
Raik, Jaan
;
Kruus, Margus
Proceedings of the 16th IASTED International Conference on Applied Simulation and Modelling : August 29-31, 2007, Palma de Mallorca, Spain
2007
/
p. 271-276 : ill
book article
246
book article
Exploiting high-level descriptions for circuits fault tolerance assessments
Benso, A.
;
Prinetto, Paolo
;
Rebaudengo, M.
;
Sonza Reorda, Matteo
;
Raik, Jaan
;
Ubar, Raimund-Johannes
1997 IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems, Paris, October 20-22, 1997
1997
/
p. 212-216
https://ieeexplore.ieee.org/document/628327
book article
247
book article
Explorations in low area overhead DfT techniques for sequential BIST
Raik, Jaan
;
Raidma, Rein
;
Ubar, Raimund-Johannes
IEEE NORCHIP 2003 : 21 Norchip Conference : Riga, Latvia, 10-11 November 2003 : proceedings
2003
/
p. 220-223 : ill
book article
248
book article
An external diagnosis method for network-on-a-chip
Raik, Jaan
;
Govind, Vineeth
;
Ubar, Raimund-Johannes
IEEE/ACM Design Automation and Test in Europe, Workshop on Diagnostic Services in Networks-on-Chips - Test, Debug and On-line Monitoring : April 16-20, 2007, Nice, France
2007
/
[2] p. : ill
book article
249
book article
Fast and efficient static compaction of test sequences based on greedy algorithms
Raik, Jaan
;
Jutman, Artur
;
Ubar, Raimund-Johannes
IEEE Design and Diagnostics of Electronic Circuits and Systems - IEEE DDECS 2001 : Fourth International Workshop on IEEE Design and Diagnostics of Electronic Circuits and Systems : Györ, Hungary, April 18-20, 2001
2001
/
p. 117-122
https://slideplayer.com/slide/9971880/#google_vignette
book article
250
book article
Fast and efficient static compaction of test sequences using bipartite graph representations
Markus, Antti
;
Raik, Jaan
;
Ubar, Raimund-Johannes
ECS'99 : proceedings of the 2nd Electronic Circuits and Systems Conference : September 6-8, 1999, Bratislava, Slovakia
1999
/
p. 17-20
book article
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CV
66
1.
Ubar, Raimund-Johannes
2.
Palm, Raimund
3.
Räämet, Raimund 1918-2004
4.
Aare, Johannes 1915-2000
5.
Aavik, Eduard-Johannes
6.
Ahrenschild, Johannes (-1936)
7.
Alaots, Johannes
8.
Aljak, Arnold Johannes
9.
Allik, Erich-Johannes
10.
Avik, Eduard Johannes 1891-1942
11.
Drechsler, Wolfgang Johannes Max
12.
Ehala, Johannes
13.
Hint, Johannes 1914-1985
14.
Johannes, Ille
15.
Johannson, Johannes
16.
Johanson, Johannes
17.
Juhans, Johannes 1874-1956
18.
Kajander, Aleksi Oskar Johannes
19.
Kiiwet, Johannes
20.
Kiivet, Johannes 1879-1967
21.
Kivit, Johannes
22.
Kollist, Johannes 1884-1937
23.
Kollist, Johannes Theodor
24.
Korv, August Johannes 1911-1981
25.
Krimmer, Robert Johannes
26.
Käpp, Martin Johannes
27.
Langel, Johannes 1900-1985
28.
Langell, Johannes
29.
Livländer, Robert Johannes
30.
Lutsar, Richard-Johannes
31.
Madise, Johannes 1920-?
32.
Maltenek, Evald Leonhard Johannes
33.
Matsulevitš, Johannes
34.
Meitre, Johannes 1906-1978
35.
Messer, Johannes
36.
Muru, Johannes
37.
Mäll, Johannes 1911-1981
38.
Mühlman, Johannes
39.
Mühlmann, Johannes 1888-1936
40.
Notermans, Antonius Johannes Hubertus
41.
Nuudi, Johannes 1895-1975
42.
Palo, Johannes 1925-1960
43.
Pals, Johannes 1903-1941
44.
Pello, Johannes
45.
Pervik, Johannes 1892-1958
46.
Pervik, Johannes-Eduard
47.
Presmann, Johannes 1942-2013
48.
Putk, Aksel-Johannes 1928-1999
49.
Püümann, Mait Johannes
50.
Renter, Olav-Johannes
51.
Roes, Johannes
52.
Russwurm, Johannes
53.
Russvurm, Johannes 1855-1939
54.
Russvurm, Johannes Carl Gysbert Immanuel
55.
Sakeus, Johannes 1880-1934
56.
Soosaar, Arvid Johannes
57.
Taimsalu, Johannes 1891-1942
58.
Teiman, Johannes
59.
Teimann, Johannes Rudolf (kuni 22.05.1935)
60.
Tomson, Johannes
61.
Tuulre, Feliks Johannes 1908-1987
62.
Veerus, Johannes
63.
Veerus, Johannes Voldemar 1897-1972
64.
Weisberg, Karl-Johannes
65.
Verus, Johannes Voldemar
66.
Vuhk (Vuht), Oskar Johannes
author
58
1.
Ubar, Raimund-Johannes
2.
Hagelberg, Raimund
3.
Räämet, Raimund
4.
Aare, Johannes
5.
Allas, Johannes-Emmanuel
6.
Avik, Eduard Johannes
7.
Bauer, Johannes
8.
Bender, Naatan Johannes
9.
Buchmann, Johannes
10.
Deelstra, Johannes
11.
Edvardsson, Johannes
12.
Ehala, Johannes
13.
Engelmayer, Johannes
14.
Gotzmann, Johannes
15.
Helander, Johannes
16.
Hint, Johannes
17.
Hüsse, Johannes
18.
Johannes, Anu
19.
Johannes, Ellen
20.
Johannes, Ille
21.
Johannes, Kaljo-Mihkel
22.
Järv, Johannes
23.
Kadak, Johannes
24.
Kajander, Aleksi Oskar Johannes
25.
Karstensen, Johannes
26.
Kerkhoven, Eduard Johannes
27.
Kiivet, Johannes
28.
Krimmer, Robert Johannes
29.
Kukebal, Johannes
30.
Meitre, Johannes
31.
Miller, Johannes
32.
Mühlman, Johannes
33.
Norberg, Johannes
34.
Notermans, Antonius Johannes Hubertus
35.
Ortlepp, Johannes
36.
Parikas, Johannes
37.
Pello, Johannes
38.
Pervik, Johannes-Eduard
39.
Piiper, Johannes
40.
Presmann, Johannes
41.
Putk, Aksel-Johannes
42.
Pätsch, Johannes
43.
Saar, Johannes
44.
Sautter, Johannes
45.
Sinisalo, Touko Johannes
46.
Steinbrunn, Johannes
47.
Sutt, Johannes
48.
Zeiringer, Johannes Paul
49.
Taimsalu, Johannes
50.
Talu, Martin Johannes
51.
Tammekänd, Johannes
52.
Tilk, Johannes
53.
Tralla, Johannes
54.
Veerus, Johannes
55.
Vibur, Johannes Ferdinand
56.
Vind, Johannes
57.
Voll, Johannes
58.
Voltri, Johannes
name of the person
28
1.
Ubar, Raimund-Johannes, 1941-
2.
Hagelberg, Raimund, 1927-2012
3.
Räämet, Raimund, 1918-2004
4.
Aare, Johannes, 1915-2000
5.
Aavik, Johannes, 1880-1973
6.
Avik, Eduard Johannes, 1891-1942
7.
Bender, Naatan Johannes
8.
Erm, Johannes, 1998-
9.
Granö, Johannes Gabriel
10.
Hint, Johannes, 1914-1985
11.
Johannes Paulus II, paavst, 1920-2005
12.
Kert, Johannes
13.
Kiivet, Johannes, 1879-1967
14.
Kollist, Johannes
15.
Käis, Johannes
16.
Lang, Johannes
17.
Maide, Johannes Voldemar
18.
Mossov, Johannes
19.
Pals, Johannes, 1903-1941
20.
Pello, Johannes
21.
Putk, Aksel-Johannes
22.
Rammul, Aleksander Johannes, 1875-1949
23.
Steinbrunn, Johannes
24.
Taimsalu, Johannes, 1891-1942
25.
Talu, Martin Johannes
26.
Veerus, Johannes Voldemar, 1897-1972
27.
Veski, Johannes Voldemar, 1873-1968
28.
Voll, Johannes
subject term
1
1.
Johannes Mittus, vasevalamise tööstus
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