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On test generation for microprocessors for extended class of functional faults (title)
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book article ENG
On test generation for microprocessors for extended class of functional faults
Oyeniran, Adeboye Stephen
;
Ubar, Raimund-Johannes
;
Jenihhin, Maksim
;
Raik, Jaan
VLSI-SoC: New technology enabler : 27th IFIP WG 10.5/IEEE International Conference on Very Large Scale Integration, VLSI-SoC 2019 Cusco, Peru, October 6–9, 2019 : Revised and Extended Selected Papers
2020
/
p. 21-44
https://doi.org/10.1007/978-3-030-53273-4
Conference proceedings at Scopus
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book article EST
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keyword
20
1.
Test Group Generation for Detecting Multiple Faults
2.
functional test generation
3.
extended fault class
4.
non-robust and functional sensitization of delay faults
5.
functional self-test
6.
adaptive test strategy generation
7.
automated test pattern generation
8.
automatic test case generation
9.
automatic test pattern generation
10.
automatic test program generation
11.
behaviour level test generation
12.
Hierarchical Multi-level Test Generation
13.
high-level test data generation
14.
highlevel test generation
15.
implementation-independent test generation
16.
offline test generation
17.
provably correct test generation
18.
test generation
19.
test generation and fault diagnosis
20.
test program generation
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