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Comparison of genetic and random techniques for test pattern generation (title)
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book article
Comparison of genetic and random techniques for test pattern generation
Ivask, Eero
;
Raik, Jaan
;
Ubar, Raimund-Johannes
BEC'98 : the 6th Biennial Conference on Electronics and Microsystems Technology, October 7-9, 1998, Tallinn, Estonia : proceedings
1998
/
p. 163-166: ill
book article
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keyword
19
1.
automated test pattern generation
2.
automatic test pattern generation
3.
pattern Generation
4.
test-pattern
5.
adaptive test strategy generation
6.
automatic test case generation
7.
automatic test program generation
8.
behaviour level test generation
9.
functional test generation
10.
Hierarchical Multi-level Test Generation
11.
high-level test data generation
12.
highlevel test generation
13.
implementation-independent test generation
14.
offline test generation
15.
provably correct test generation
16.
test generation
17.
test generation and fault diagnosis
18.
Test Group Generation for Detecting Multiple Faults
19.
test program generation
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