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Sequential circuit test generation using decision diagram models (title)
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book article
Sequential circuit test generation using decision diagram models
Raik, Jaan
;
Ubar, Raimund-Johannes
Design, Automation and Test in Europe : DATE : Conference and Exhibition 1999 : Munich, Germany, March 9-12, 1999 : proceedings
1999
/
p. 736-740: ill
https://www.cs.york.ac.uk/rts/docs/SIGDA-Compendium-1994-2004/papers/1999/date99/pdffiles/11e_1.pdf
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keyword
20
1.
high-level decision diagram
2.
structurally synthesized binary decision diagram (SSBDD)
3.
second generation of tribology models
4.
adaptive test strategy generation
5.
automated test pattern generation
6.
automatic test case generation
7.
automatic test pattern generation
8.
automatic test program generation
9.
behaviour level test generation
10.
functional test generation
11.
Hierarchical Multi-level Test Generation
12.
high-level test data generation
13.
highlevel test generation
14.
implementation-independent test generation
15.
offline test generation
16.
provably correct test generation
17.
test generation
18.
test generation and fault diagnosis
19.
Test Group Generation for Detecting Multiple Faults
20.
test program generation
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