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Handbook of testing electronic systems (source)
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1
book article
Defects, faults and fault models
Gramatova, Elena
;
Fisherova, Maria
;
Ubar, Raimund-Johannes
;
Pleskacz, Witold A.
Handbook of testing electronic systems
2005
/
p. 26-96 : ill
book article
2
book article
Test generation techniques and algorithms
Ubar, Raimund-Johannes
;
Gramatova, Elena
;
Fisherova, Maria
Handbook of testing electronic systems
2005
/
p. 99-173 : ill
book article
3
book article
Testing tools
Jutman, Artur
Handbook of testing electronic systems
2005
/
p. 361-365 : ill
book article
4
book article
Testing tools
Raik, Jaan
Handbook of testing electronic systems
2005
/
p. 373-378 : ill
book article
Number of records 4, displaying
1 - 4
keyword
79
1.
courses on electronic testing and design
2.
Electronic Document and Records Management Systems (EDRMS)
3.
electronic payment systems
4.
nano-electronic systems design
5.
handbook
6.
MIL-HDBK-217F handbook
7.
accelerated testing
8.
acoustomechanical testing
9.
anaerobic testing
10.
aspect-oriented testing
11.
at-speed testing
12.
benchmark testing
13.
Berridge testing
14.
cancer genomic testing
15.
compliance testing
16.
compositional testing
17.
computer aided testing
18.
conformance testing
19.
cybersecurity testing
20.
D. non-destructive testing
21.
design field testing
22.
destructive testing
23.
eddy current testing
24.
erosion testing
25.
fatigue testing
26.
fire testing
27.
hierarchical testing
28.
hypotheses testing
29.
integration testing
30.
laboratory scale testing
31.
load testing
32.
macro mechanical testing and green surface tribology
33.
material testing
34.
materials testing
35.
measurement and testing
36.
mechanical testing
37.
memory testing
38.
metamorphic testing
39.
microprocessor testing
40.
model based testing
41.
model-based mutation testing
42.
model-based testing
43.
mutation testing
44.
network-testing
45.
non destructive testing
46.
nondestructive testing
47.
non-destructive testing
48.
on-site testing
49.
pin on disc wear testing
50.
PMU calibration testing
51.
PMU testing
52.
point-of-care testing
53.
processor core testing
54.
processor testing
55.
real-time HiL testing
56.
regression testing
57.
RISC processor testing
58.
robustness testing
59.
scenario testing
60.
scratch testing
61.
security testing
62.
small-scale fire testing
63.
software testing
64.
software-in-the-loop (SIL) testing
65.
stand-alone testing
66.
stress-testing
67.
substation testing methods
68.
system testing
69.
tensile testing
70.
testing
71.
testing methods
72.
testing of digital devices
73.
testing of generator
74.
testing of phasor measurement units
75.
two-dimensional array testing
76.
wafer testing
77.
wear testing
78.
vibration testing
79.
virtual testing
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