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Handbook of testing electronic systems (source)
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1
book article
Defects, faults and fault models
Gramatova, Elena
;
Fisherova, Maria
;
Ubar, Raimund-Johannes
;
Pleskacz, Witold A.
Handbook of testing electronic systems
2005
/
p. 26-96 : ill
book article
2
book article
Test generation techniques and algorithms
Ubar, Raimund-Johannes
;
Gramatova, Elena
;
Fisherova, Maria
Handbook of testing electronic systems
2005
/
p. 99-173 : ill
book article
3
book article
Testing tools
Jutman, Artur
Handbook of testing electronic systems
2005
/
p. 361-365 : ill
book article
4
book article
Testing tools
Raik, Jaan
Handbook of testing electronic systems
2005
/
p. 373-378 : ill
book article
Number of records 4, displaying
1 - 4
keyword
95
1.
courses on electronic testing and design
2.
Electronic Document and Records Management Systems (EDRMS)
3.
electronic payment systems
4.
nano-electronic systems design
5.
handbook
6.
MIL-HDBK-217F handbook
7.
accelerated testing
8.
acoustomechanical testing
9.
anaerobic testing
10.
aspect-oriented testing
11.
assessment and testing
12.
at-speed testing
13.
benchmark testing
14.
Berridge testing
15.
burst testing
16.
cancer genomic testing
17.
circuit testing
18.
compliance testing
19.
compositional testing
20.
computer aided testing
21.
cone heater testing
22.
conformance testing
23.
cybersecurity testing
24.
D. non-destructive testing
25.
deformation testing
26.
design field testing
27.
destructive testing
28.
eddy current testing
29.
eddy current testing (ECT)
30.
erosion testing
31.
fabric testing
32.
fatigue testing
33.
fire testing
34.
hierarchical testing
35.
hypotheses testing
36.
Implementation-Independent Testing of Microprocessors
37.
integration testing
38.
laboratory scale testing
39.
load testing
40.
macro mechanical testing and green surface tribology
41.
material testing
42.
materials testing
43.
measurement and testing
44.
mechanical testing
45.
memory testing
46.
metamorphic testing
47.
microprocessor testing
48.
model based testing
49.
model-based mutation testing
50.
model-based testing
51.
multi-scenario testing
52.
mutation testing
53.
network-testing
54.
non destructive testing
55.
nondestructive testing
56.
non-destructive testing
57.
non-destructive testing (NDT)
58.
On-site drug testing
59.
on-site testing
60.
pin on disc wear testing
61.
PMU calibration testing
62.
PMU testing
63.
point-of-care testing
64.
processor core testing
65.
processor testing
66.
real-time HiL testing
67.
regression testing
68.
RISC processor testing
69.
robustness testing
70.
safety and security testing
71.
scenario testing
72.
Scenario-Based Testing
73.
scratch testing
74.
security testing
75.
shear testing
76.
small-scale fire testing
77.
software testing
78.
software-in-the-loop (SIL) testing
79.
stand-alone testing
80.
stress-testing
81.
substation testing methods
82.
system testing
83.
tensile testing
84.
testing
85.
testing methods
86.
testing of digital devices
87.
testing of generator
88.
testing of phasor measurement units
89.
two-dimensional array testing
90.
ultrasonic testing
91.
wafer testing
92.
wear testing
93.
well testing
94.
vibration testing
95.
virtual testing
TalTech department
1
1.
Testing and Calibration Centre of TUT
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