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Handbook of testing electronic systems (source)
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1
book article
Defects, faults and fault models
Gramatova, Elena
;
Fisherova, Maria
;
Ubar, Raimund-Johannes
;
Pleskacz, Witold A.
Handbook of testing electronic systems
2005
/
p. 26-96 : ill
book article
2
book article
Test generation techniques and algorithms
Ubar, Raimund-Johannes
;
Gramatova, Elena
;
Fisherova, Maria
Handbook of testing electronic systems
2005
/
p. 99-173 : ill
book article
3
book article
Testing tools
Jutman, Artur
Handbook of testing electronic systems
2005
/
p. 361-365 : ill
book article
4
book article
Testing tools
Raik, Jaan
Handbook of testing electronic systems
2005
/
p. 373-378 : ill
book article
Number of records 4, displaying
1 - 4
keyword
93
1.
courses on electronic testing and design
2.
Electronic Document and Records Management Systems (EDRMS)
3.
electronic payment systems
4.
nano-electronic systems design
5.
handbook
6.
MIL-HDBK-217F handbook
7.
accelerated testing
8.
acoustomechanical testing
9.
anaerobic testing
10.
aspect-oriented testing
11.
assessment and testing
12.
at-speed testing
13.
benchmark testing
14.
Berridge testing
15.
burst testing
16.
cancer genomic testing
17.
compliance testing
18.
compositional testing
19.
computer aided testing
20.
cone heater testing
21.
conformance testing
22.
cybersecurity testing
23.
D. non-destructive testing
24.
deformation testing
25.
design field testing
26.
destructive testing
27.
eddy current testing
28.
eddy current testing (ECT)
29.
erosion testing
30.
fabric testing
31.
fatigue testing
32.
fire testing
33.
hierarchical testing
34.
hypotheses testing
35.
Implementation-Independent Testing of Microprocessors
36.
integration testing
37.
laboratory scale testing
38.
load testing
39.
macro mechanical testing and green surface tribology
40.
material testing
41.
materials testing
42.
measurement and testing
43.
mechanical testing
44.
memory testing
45.
metamorphic testing
46.
microprocessor testing
47.
model based testing
48.
model-based mutation testing
49.
model-based testing
50.
multi-scenario testing
51.
mutation testing
52.
network-testing
53.
non destructive testing
54.
nondestructive testing
55.
non-destructive testing
56.
non-destructive testing (NDT)
57.
On-site drug testing
58.
on-site testing
59.
pin on disc wear testing
60.
PMU calibration testing
61.
PMU testing
62.
point-of-care testing
63.
processor core testing
64.
processor testing
65.
real-time HiL testing
66.
regression testing
67.
RISC processor testing
68.
robustness testing
69.
safety and security testing
70.
scenario testing
71.
Scenario-Based Testing
72.
scratch testing
73.
security testing
74.
shear testing
75.
small-scale fire testing
76.
software testing
77.
software-in-the-loop (SIL) testing
78.
stand-alone testing
79.
stress-testing
80.
substation testing methods
81.
system testing
82.
tensile testing
83.
testing
84.
testing methods
85.
testing of digital devices
86.
testing of generator
87.
testing of phasor measurement units
88.
two-dimensional array testing
89.
ultrasonic testing
90.
wafer testing
91.
wear testing
92.
vibration testing
93.
virtual testing
TalTech department
1
1.
Testing and Calibration Centre of TUT
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