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Handbook of testing electronic systems (source)
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1
book article
Defects, faults and fault models
Gramatova, Elena
;
Fisherova, Maria
;
Ubar, Raimund-Johannes
;
Pleskacz, Witold A.
Handbook of testing electronic systems
2005
/
p. 26-96 : ill
book article
2
book article
Test generation techniques and algorithms
Ubar, Raimund-Johannes
;
Gramatova, Elena
;
Fisherova, Maria
Handbook of testing electronic systems
2005
/
p. 99-173 : ill
book article
3
book article
Testing tools
Jutman, Artur
Handbook of testing electronic systems
2005
/
p. 361-365 : ill
book article
4
book article
Testing tools
Raik, Jaan
Handbook of testing electronic systems
2005
/
p. 373-378 : ill
book article
Number of records 4, displaying
1 - 4
keyword
91
1.
courses on electronic testing and design
2.
Electronic Document and Records Management Systems (EDRMS)
3.
electronic payment systems
4.
nano-electronic systems design
5.
handbook
6.
MIL-HDBK-217F handbook
7.
accelerated testing
8.
acoustomechanical testing
9.
anaerobic testing
10.
aspect-oriented testing
11.
assessment and testing
12.
at-speed testing
13.
benchmark testing
14.
Berridge testing
15.
burst testing
16.
cancer genomic testing
17.
compliance testing
18.
compositional testing
19.
computer aided testing
20.
cone heater testing
21.
conformance testing
22.
cybersecurity testing
23.
D. non-destructive testing
24.
deformation testing
25.
design field testing
26.
destructive testing
27.
eddy current testing
28.
eddy current testing (ECT)
29.
erosion testing
30.
fabric testing
31.
fatigue testing
32.
fire testing
33.
hierarchical testing
34.
hypotheses testing
35.
Implementation-Independent Testing of Microprocessors
36.
integration testing
37.
laboratory scale testing
38.
load testing
39.
macro mechanical testing and green surface tribology
40.
material testing
41.
materials testing
42.
measurement and testing
43.
mechanical testing
44.
memory testing
45.
metamorphic testing
46.
microprocessor testing
47.
model based testing
48.
model-based mutation testing
49.
model-based testing
50.
mutation testing
51.
network-testing
52.
non destructive testing
53.
nondestructive testing
54.
non-destructive testing
55.
non-destructive testing (NDT)
56.
On-site drug testing
57.
on-site testing
58.
pin on disc wear testing
59.
PMU calibration testing
60.
PMU testing
61.
point-of-care testing
62.
processor core testing
63.
processor testing
64.
real-time HiL testing
65.
regression testing
66.
RISC processor testing
67.
robustness testing
68.
safety and security testing
69.
scenario testing
70.
scratch testing
71.
security testing
72.
shear testing
73.
small-scale fire testing
74.
software testing
75.
software-in-the-loop (SIL) testing
76.
stand-alone testing
77.
stress-testing
78.
substation testing methods
79.
system testing
80.
tensile testing
81.
testing
82.
testing methods
83.
testing of digital devices
84.
testing of generator
85.
testing of phasor measurement units
86.
two-dimensional array testing
87.
ultrasonic testing
88.
wafer testing
89.
wear testing
90.
vibration testing
91.
virtual testing
TalTech department
1
1.
Testing and Calibration Centre of TUT
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