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Functional test generation for finite state machines (title)
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book article
Functional test generation for finite state machines
Ubar, Raimund-Johannes
;
Brik, Marina
;
Jutman, Artur
;
Raik, Jaan
;
Bengtsson, Tomas
;
Kumar, Shashi
BEC 2006 : 2006 International Baltic Electronics Conference : Tallinn University of Technology, October 2-4, 2006, Tallinn, Estonia : proceedings of the 10th Biennial Baltic Electronics Conference
2006
/
p. 205-208 : ill
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keyword
24
1.
finite-state machines
2.
functional test generation
3.
finite state machine
4.
Finite State Machine - FSM
5.
hierarchical finite state machine
6.
Algorithmic State Machines (ASMs)
7.
functional state of the muscles -tiredness
8.
functional self-test
9.
adaptive test strategy generation
10.
automated test pattern generation
11.
automatic test case generation
12.
automatic test pattern generation
13.
automatic test program generation
14.
behaviour level test generation
15.
Hierarchical Multi-level Test Generation
16.
high-level test data generation
17.
highlevel test generation
18.
implementation-independent test generation
19.
offline test generation
20.
provably correct test generation
21.
test generation
22.
test generation and fault diagnosis
23.
Test Group Generation for Detecting Multiple Faults
24.
test program generation
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