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Constraint-based test pattern generation at the register-transfer level (title)
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book article
Constraint-based test pattern generation at the register-transfer level
Viilukas, Taavi
;
Raik, Jaan
;
Jenihhin, Maksim
;
Ubar, Raimund-Johannes
;
Krivenko, Anna
Proceedings of the 13th IEEE Symposium on Design and Diagnostics of Electronic Circuits and Systems : April 14-16, 2010, Vienna, Austria
2010
/
p. 352-357 : ill
http://dx.doi.org/10.1109/DDECS.2010.5491752
book article
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keyword
29
1.
register transfer and gate level simulation
2.
Register Transfer Level - RTL
3.
register transfer level modeling decision diagams
4.
register-transfer level
5.
automated test pattern generation
6.
automatic test pattern generation
7.
behaviour level test generation
8.
Hierarchical Multi-level Test Generation
9.
high-level test data generation
10.
gate and register transfer levels
11.
pattern Generation
12.
test-pattern
13.
extreme penetration level of non synchronous generation
14.
adaptive test strategy generation
15.
automatic test case generation
16.
automatic test program generation
17.
functional test generation
18.
highlevel test generation
19.
implementation-independent test generation
20.
offline test generation
21.
provably correct test generation
22.
test generation
23.
test generation and fault diagnosis
24.
Test Group Generation for Detecting Multiple Faults
25.
test program generation
26.
high-level synthesis for test
27.
system level test
28.
Activity-based demand generation
29.
template based sql generation
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