An approach for verification assertions reuse in RTL test pattern generation (title)

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  • book article
    An approach for verification assertions reuse in RTL test pattern generationJenihhin, Maksim; Raik, Jaan; Fujiwara, Hideo; Ubar, Raimund-Johannes; Viilukas, TaaviDigest of papers : IEEE 11th Workshop on RTL and High Level Testing : WRTLT'10 : December 5-6, 2010, Shanghai, China2010 / p. 107-110 : ill
    book article
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