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Handbook of testing electronic systems (source)
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1
book article
Defects, faults and fault models
Gramatova, Elena
;
Fisherova, Maria
;
Ubar, Raimund-Johannes
;
Pleskacz, Witold A.
Handbook of testing electronic systems
2005
/
p. 26-96 : ill
book article
2
book article
Test generation techniques and algorithms
Ubar, Raimund-Johannes
;
Gramatova, Elena
;
Fisherova, Maria
Handbook of testing electronic systems
2005
/
p. 99-173 : ill
book article
3
book article
Testing tools
Jutman, Artur
Handbook of testing electronic systems
2005
/
p. 361-365 : ill
book article
4
book article
Testing tools
Raik, Jaan
Handbook of testing electronic systems
2005
/
p. 373-378 : ill
book article
Number of records 4, displaying
1 - 4
keyword
77
1.
courses on electronic testing and design
2.
Electronic Document and Records Management Systems (EDRMS)
3.
electronic payment systems
4.
nano-electronic systems design
5.
handbook
6.
MIL-HDBK-217F handbook
7.
accelerated testing
8.
acoustomechanical testing
9.
anaerobic testing
10.
aspect-oriented testing
11.
at-speed testing
12.
benchmark testing
13.
Berridge testing
14.
cancer genomic testing
15.
compliance testing
16.
compositional testing
17.
computer aided testing
18.
conformance testing
19.
cybersecurity testing
20.
D. non-destructive testing
21.
design field testing
22.
eddy current testing
23.
erosion testing
24.
fatigue testing
25.
fire testing
26.
hierarchical testing
27.
hypotheses testing
28.
integration testing
29.
laboratory scale testing
30.
load testing
31.
macro mechanical testing and green surface tribology
32.
material testing
33.
measurement and testing
34.
mechanical testing
35.
memory testing
36.
metamorphic testing
37.
microprocessor testing
38.
model based testing
39.
model-based mutation testing
40.
model-based testing
41.
mutation testing
42.
network-testing
43.
non destructive testing
44.
nondestructive testing
45.
non-destructive testing
46.
on-site testing
47.
pin on disc wear testing
48.
PMU calibration testing
49.
PMU testing
50.
point-of-care testing
51.
processor core testing
52.
processor testing
53.
real-time HiL testing
54.
regression testing
55.
RISC processor testing
56.
robustness testing
57.
scenario testing
58.
scratch testing
59.
security testing
60.
small-scale fire testing
61.
software testing
62.
software-in-the-loop (SIL) testing
63.
stand-alone testing
64.
stress-testing
65.
substation testing methods
66.
system testing
67.
tensile testing
68.
testing
69.
testing methods
70.
testing of digital devices
71.
testing of generator
72.
testing of phasor measurement units
73.
two-dimensional array testing
74.
wafer testing
75.
wear testing
76.
vibration testing
77.
virtual testing
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