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32726
book article
Hidden champions from Estonia
Riisalu, Rein
;
Leppiman, Anu
Hidden champions in CEE and dynamically changing environments : research report
2011
/
p. 35-40
book article
32727
book article
Hidden champions of Estonia
Riisalu, Rein
;
Leppiman, Anu
Hidden champions in CEE and Turkey : carving out a global Niche
2013
/
p. 183-199 : tab
book article
32728
journal article EST
/
journal article ENG
The hidden power of emotions : How psychological factors influence skill development in smart technology adoption
Gerli, Paolo
;
Clement, Jessica
;
Esposito, Giovanni
;
Mora, Luca
;
Crutzen, Nathalie
Technological Forecasting and Social Change
2022
/
Article nr. 121721
https://doi.org/10.1016/j.techfore.2022.121721
Journal metrics at Scopus
Article at Scopus
Journal metrics at WOS
Article at WOS
journal article EST
/
journal article ENG
32729
book article
Hidden secrets of transverse coastal upwelling jets revealed using a synergy of data in the Gulf of Finland, Baltic Sea
Delpeche-Ellmann, Nicole Camille
;
Soomere, Tarmo
Abstracts : [BSSC 2019]
2019
/
p. 112
https://www.su.se/polopoly_fs/1.446756.1566224624!/menu/standard/file/abstracts_A5_ny.pdf
book article
32730
book article
A hierarchical algorithm for moving vehicle identification based on acoustic noise analysis
Astapov, Sergei
;
Riid, Andri
Proceedings of the 19th International Conference Mixed Design of Integrated Circuits and Systems : MIXDES 2012 : Warsaw, Poland, 24-26 May, 2012
2012
/
p. 467-472 : ill
https://ieeexplore.ieee.org/document/6226235
book article
32731
book article
A hierarchical algorithm of acoustic noise analysis for moving vehicle detection and classification
Astapov, Sergei
Info- ja kommunikatsioonitehnoloogia doktorikooli IKTDK viienda aastakonverentsi artiklite kogumik : 25.-26. novembril 2011, Nelijärve
2011
/
p. 51-54 : ill
https://www.ester.ee/record=b2734740*est
book article
32732
book article
Hierarchical analysis of short defects between metal lines in CMOS IC
Pleskacz, Witold A.
;
Jenihhin, Maksim
;
Raik, Jaan
;
Rakowski, Michal
;
Ubar, Raimund-Johannes
;
Kuzmicz, Wieslaw
Proceedings : 11th EUROMICRO Conference on Digital System Design : Architectures, Methods and Tools : (DSD 2008) : September 3-5, 2008, Parma, Italy
2008
/
p. 729-734 : ill
https://ieeexplore.ieee.org/document/4669309
book article
32733
book article
A hierarchical approach for devising area efficient concurrent online checkers
Niazmand, Behrad
;
Azad, Siavoosh Payandeh
;
Ghasempouri, Tara
;
Raik, Jaan
;
Jervan, Gert
Proceedings 2nd IEEE International Test Conference in Asia : ITC-Asia 2018, 15-17 August 2018, Harbin, China
2018
/
p. 139-144 : ill
https://doi.org/10.1109/ITC-Asia.2018.00034
book article
32734
book article
Hierarchical approach to test generation for digital systems at system, circuit and defect levels
Ubar, Raimund-Johannes
45. Internationales Wissenschaftliches Kolloquium, 04.-06.10.2000 : Tagungsband
2000
/
S. 711-716 : Ill
book article
32735
journal article
Hierarchical approaches to test generation and fault simulation
Ubar, Raimund-Johannes
Radioelectronics and informatics
2003
/
p. 204
journal article
32736
book article
Hierarchical attention network to manage processing resources of CPSs
Tammemäe, Kalle
SelPhyS Program
2017
https://www.ict.tuwien.ac.at/selphys2017/program
book article
32737
book article
A hierarchical automatic test pattern generator based on using alternative graphs
Brik, Marina
;
Jervan, Gert
;
Markus, Antti
;
Raik, Jaan
;
Ubar, Raimund-Johannes
Proceedings of the 4th International Workshop Mixed Design of Integrated Circuits and Systems : MIXDES'97 : Poznan, Poland, 12-14 June 1997
1997
/
p. 415-420
book article
32738
book article
Hierarchical calculation of malicious faults for evaluating the fault-tolerance
Ubar, Raimund-Johannes
;
Devadze, Sergei
;
Jenihhin, Maksim
;
Raik, Jaan
;
Jervan, Gert
;
Ellervee, Peeter
Proceedings : Fourth IEEE International Symposium on Electronic Design, Test and Applications : [DELTA 2008] : 23-25 January 2008, Hong Kong, SAR, China
2008
/
p. 222-227 : ill
https://ieeexplore.ieee.org/document/4459544
book article
32739
journal article
Hierarchical conceptual clustering based on quantile method for identifying microscopic details in distributional data
Umbleja, Kadri
;
Ichino, Manabu
;
Yaguchi, Hiroyuki
Advances in data analysis and classification
2020
/
30 p. : ill
https://doi.org/10.1007/s11634-020-00411-w
journal article
32740
book article
Hierarchical concurrent test generation for synchronous sequential circuits
Ubar, Raimund-Johannes
;
Brik, Marina
Proceedings of the 7th International Conference Mixed Design of Integrated Circuits and Systems : MIXDES 2000 : Gdynia, Poland, 15-17 June 2000
2000
/
p. 533-538 : ill
book article
32741
book article
Hierarchical defect level test quality analysis
Blyzniuk, M.
;
Cibakova, Tatiana
;
Gramatova, Elena
;
Kuzmicz, W.
;
Lobur, M.
;
Pleskacz, Witold A.
;
Raik, Jaan
;
Ubar, Raimund-Johannes
VILAB User Forum
2000
/
[11] p
book article
32742
book article
Hierarchical defect-oriented fault simulation for digital circuits
Blyzniuk, M.
;
Cibakova, Tatiana
;
Gramatova, Elena
;
Kuzmicz, W.
;
Lobur, M.
;
Pleskacz, Witold A.
;
Raik, Jaan
;
Ubar, Raimund-Johannes
IEEE European Test Workshop
2000
/
p. 151-156
https://ieeexplore.ieee.org/document/873781
book article
32743
book article
Hierarchical defect-oriented fault simulation for digital circuits
Blyzniuk, M.
;
Cibakova, Tatiana
;
Gramatova, Elena
;
Kuzmicz, W.
;
Lobur, M.
;
Pleskacz, Witold A.
;
Raik, Jaan
;
Ubar, Raimund-Johannes
IEEE European Test Workshop : 23-26 May 2000, Cascais, Portugal : ETW 2000 : proceedings
2000
/
p. 69-74 : ill
https://ieeexplore.ieee.org/document/873781
book article
32744
book article
Hierarchical design error diagnosis in combinational circuits by stuck-at fault test patterns
Ubar, Raimund-Johannes
;
Jutman, Artur
Proceedings of the 6th International Conference on Mixed Design of Integrated Circuits and Systems : MIXDES'99 : Krakow, Poland, 17-19 June 1999
1999
/
p. 437-442 : ill
https://www.sciencedirect.com/science/article/pii/S0026271499002036
book article
32745
book article
A hierarchical Dirichlet process model for joint part-of-speech and morphology induction
Sirts, Kairit
;
Alumäe, Tanel
NAACL HLT 2012 : the 2012 Conference of the North American Chapter of the Association for Computational Linguistics : Human Language Technologies : proceedings of the conference : June 3-8, 2012, Montreal, Canada
2012
/
p. 407-416 : ill
https://www.researchgate.net/publication/262277910_A_hierarchical_Dirichlet_process_model_for_joint_part-of-speech_and_morphology_induction
book article
32746
book article
Hierarchical fault diagnosis in embedded digital systems with multi-level decision diagrams [Electronic resource]
Ubar, Raimund-Johannes
;
Evartson, Teet
;
Lensen, Harri
;
Aarna, Margit
5th International Conference on Industrial Automation = Cinquieme Conference Internationale sur l'Automatisation Industrielle : June 11-13, 2007, Montreal, Canada
2007
/
[6] p. [CD-ROM]
book article
32747
book article
Hierarchical fault simulation for finite state machines
Brik, Marina
;
Raik, Jaan
;
Ubar, Raimund-Johannes
The 7th Biennial Conference on Electronics and Microsystem Technology "Baltic Electronics Conference" : BEC 2000 : October 8 - 11, 2000, Tallinn, Estonia : conference proceedings
2000
/
p. 145-148 : ill
book article
32748
book article
Hierarchical fault simulation in digital systems
Ubar, Raimund-Johannes
;
Raik, Jaan
;
Ivask, Eero
;
Brik, Marina
International Symposium on Signals, Circuits and Systems : SCS 2001 : July 10-11, 2001, Iasi, Romania : proceedings
2001
/
p. 181-184 : ill
book article
32749
book article
Hierarchical identification of NBTI-critical gates in nanoscale logic
Kostin, Sergei
;
Raik, Jaan
;
Ubar, Raimund-Johannes
;
Jenihhin, Maksim
LATW2014 : 15th IEEE Latin-American Test Workshop : Fortaleza, Brazil, March 12th-15th, 2014
2014
/
[6] p. : ill
book article
32750
book article
Hierarchical identification of untestable faults in sequential circuits
Raik, Jaan
;
Ubar, Raimund-Johannes
;
Krivenko, Anna
;
Kruus, Margus
10th Euromicro Conference on Digital System Design Architectures, Methods and Tools, DSD 2007 : 29-31 August 2007, Lübeck, Germany : proceedings
2007
/
p. 668-671 : ill
http://dx.doi.org/10.1109/DSD.2007.4341539
book article
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