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1

artikkel kogumikus

A new modified berger code for concurrent error detectionMaamar, Ali H.; Russel, GordonBEC'96 : the 5th Biennial Baltic Electronics Conference, October 7-11, 1996, Tallinn, Estonia : proceedings1996 / p. 187-190: ill

artikkel kogumikus

2

artikkel kogumikus

A VLSI implementation of RSA and IDEA encryption engineBuldas, Ahto; Põldre, JüriProceedings [of the] 15th NORCHIP Conference, Tallinn, 10-11 November 19971997 / p. 281-288: ill

artikkel kogumikus

3

artikkel kogumikus

An efficient systolic array algorithm for memory-based VLSI array implementation of DSTChiper, Doru-FlorinBEC'96 : the 5th Biennial Baltic Electronics Conference, October 7-11, 1996, Tallinn, Estonia : proceedings1996 / p. 265-268: ill

artikkel kogumikus

4

dissertatsioon

At-speed testing and test quality evaluation for high-performance pipelined systems Töökiirusel testimine ja testi kvaliteedi hindamine kõrgjõudlus-konveierarhitektuuriga süsteemideleGorev, Maksim2015 https://digi.lib.ttu.ee/i/?3953

dissertatsioon

5

artikkel kogumikus

Automatic test generation system for VLSIJervan, Gert; Markus, Antti; Raik, Jaan; Ubar, Raimund-JohannesProceedings of the First Electronic Circuits and Systems Conference : Bratislava, Slovakia, September 4-5, 19971997 / p. 255-258

artikkel kogumikus

6

artikkel kogumikus

Behavior modeling of faulty complex VLSIs : why and how?Leveugle, R.BEC'98 : the 6th Biennial Conference on Electronics and Microsystems Technology, October 7-9, 1998, Tallinn, Estonia : proceedings1998 / p. 191-194: ill

artikkel kogumikus

7

artikkel kogumikus

CAD of CCD VLSIZaycev, S.N.; Kanunnikov, A.I.; Pugachev, A.A.; Shilin, V.A.Automation, simulation & measurement : ASM'91 : 3rd biennal conference, Tallinn, October 7-11, 1991. Section S / Tallinn Technical University1992 / p. 120-122: ill

artikkel kogumikus

8

artikkel kogumikus

Compaction of decision diagrams for describing multi-process VHDL descriptionsLeveugle, R.; Saucier, Gabriele; Ubar, Raimund-JohannesBEC'98 : the 6th Biennial Conference on Electronics and Microsystems Technology, October 7-9, 1998, Tallinn, Estonia : proceedings1998 / p. 195-198: ill

artikkel kogumikus

9

dissertatsioon

Control intensive digital system synthesisTammemäe, Kalle1997 http://www.ester.ee/record=b1060033*est

dissertatsioon

10

artikkel kogumikus

Current conveyor based structures for continuous-time MOS filtersPiccirilli, Maria CristinaBEC'96 : the 5th Biennial Baltic Electronics Conference, October 7-11, 1996, Tallinn, Estonia : proceedings1996 / p. 359-362: ill

artikkel kogumikus

11

artikkel kogumikus

DeepHLS: A complete toolchain for automatic synthesis of deep neural networks to FPGARiazati, Mohammad; Daneshtalab, Masoud; Sjodin, Mikael; Lisper, BjornICECS 2020 - 27th IEEE International Conference on Electronics, Circuits and Systems, November 23-25, 2020, Virtual Conference : Proceedings2020 / 4 p https://doi.org/10.1109/ICECS49266.2020.9294881

artikkel kogumikus

12

artikkel kogumikus

Defect-oriented BIST quality analysisKruus, Helena; Ubar, Raimund-Johannes; Raik, JaanBEC 2010 : 2010 12th Biennial Baltic Electronics Conference : proceedings of the 12th Biennial Baltic Electronics Conference : Tallinn University of Technology, October 4-6, 2010, Tallinn, Estonia2010 / p. 153-156 : ill

artikkel kogumikus

13

dissertatsioon

Dependability improvements of NoC-based systems = Töökindluse parandamine kiipvõrkudel põhinevates süsteemidesNiazmand, Behrad2018 https://digi.lib.ttu.ee/i/?9879 https://www.ester.ee/record=b4907650*est

dissertatsioon

14

artikkel ajakirjas

Design error diagnosis with re-synthesis in combinational circuitsUbar, Raimund-JohannesJournal of electronic testing : theory and applications2003 / 1, p. 73-82 : ill https://link.springer.com/article/10.1023/A:1021948013402

artikkel ajakirjas

15

artikkel kogumikus

Design obfuscation versus testFarahmandi, Farimah; Sinanoglu, Ozgur; Blanton, Ronald; Pagliarini, Samuel Nascimento2020 IEEE European Test Symposium (ETS) : ETS 2020, May 25 - 29, 2020, Tallinn, Estonia2020 / 10 p https://doi.org/10.1109/ETS48528.2020.9131590

artikkel kogumikus

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artikkel kogumikus

Design space exploration and optimisation for NoC-based timing sensitive systemsTagel, Mihkel; Ellervee, Peeter; Jervan, GertBEC 2010 : 2010 12th Biennial Baltic Electronics Conference : proceedings of the 12th Biennial Baltic Electronics Conference : Tallinn University of Technology, October 4-6, 2010, Tallinn, Estonia2010 / p. 177-180 : ill

artikkel kogumikus

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artikkel kogumikus

Digital logic simulation with compressed BDDsUbar, Raimund-Johannes; Mironov, Dmitri; Devadze, Sergei; Raik, JaanProceedings : 2011 IEEE International Conference on Computer Science and Automation Engineering : June 10-12, 2011, Shanghai, China2011 / p. 105-109 : ill https://ieeexplore.ieee.org/document/5952643

artikkel kogumikus

18

dissertatsioon

Digital test in WEB-based environmentIvask, Eero2006 https://www.ester.ee/record=b2158119*est

dissertatsioon

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artikkel kogumikus

Fault diagnosis of VLSI devices using alternative graph representationUbar, Raimund-JohannesProceedings of the 8th Symposium on Microcomputer and Microprocessor Applications, Budapest, October 12-14, 1994. Vol. 11994 / p. 34-44

artikkel kogumikus

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artikkel kogumikus

Functional test generation for finite state machinesUbar, Raimund-Johannes; Brik, Marina; Jutman, Artur; Raik, Jaan; Bengtsson, Tomas; Kumar, ShashiBEC 2006 : 2006 International Baltic Electronics Conference : Tallinn University of Technology, October 2-4, 2006, Tallinn, Estonia : proceedings of the 10th Biennial Baltic Electronics Conference2006 / p. 205-208 : ill

artikkel kogumikus

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artikkel kogumikus

A general approach to synthesis of the finite-state machine logical structure in the sum-of-products formChapenko, V.; Fritsnovich, G.; Kalnberzin, A.; Lange, E.BEC : Baltic Electronics Conference : proceedings of the 4th Biennial Conference, October 9-14, 1994, Tallinn (Estonia). 21994 / p. 385-390 https://www.ester.ee/record=b2150914*est

artikkel kogumikus

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artikkel kogumikus

Graph embedding in boolean hypercubeFomina, Jelena; Zakrevskij, ArkadijBEC 2006 : 2006 International Baltic Electronics Conference : Tallinn University of Technology, October 2-4, 2006, Tallinn, Estonia : proceedings of the 10th Biennial Baltic Electronics Conference2006 / p. 131-134 : ill

artikkel kogumikus

23

artikkel kogumikus

Hierarchical test generation for finite state machinesBrik, Marina; Ubar, Raimund-JohannesBEC : Baltic Electronics Conference : proceedings of the 4th Biennial Conference, October 9-14, 1994, Tallinn (Estonia). 11994 / p. 319-324: ill

artikkel kogumikus

24

dissertatsioon

High-level synthesis of control and memory intensive applications : thesis submitted to the Royal Institute of Technology in partial fulfillment of the requirements for the degree of Doctor of TechnologyEllervee, Peeter2000

dissertatsioon

25

dissertatsioon

Hybrid built-in self-test : methods and tools for analysis and optimization of BIST = Sisseehitatud hübriidne isetestimine : meetodid ja vahendid analüüsiks ning optimeerimiseksOrasson, Elmet2007 https://www.ester.ee/record=b2305436*est

dissertatsioon

VLSI-ahelad (märksõna)

teaviku laadid

märksõna 4

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