Otsing - TalTech teadusportaal

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226

artikkel kogumikus

ForewordUbar, Raimund-Johannes; Prinetto, Paolo; Al-Hashimi, BashirInformal Digest of Papers : 10 IEEE European Test Symposium : Tallinn, Estonia, May 22-25, 20052005 / p. III

artikkel kogumikus

227

raamat

Formal Techniques for Networked and Distributed Systems - FORTE 2007 : 27th IFIP WG 6.1 International Conference : Tallinn, Estonia, June 27-29, 2007 : proceedingsDerrick, John; Vain, Jüri2007 https://www.ester.ee/record=b2286028*est

raamat

228

artikkel kogumikus

FPGA design flow with automated test generationElst, G.; Diener, Karl-Heinz; Ivask, Eero; Raik, Jaan; Ubar, Raimund-JohannesProc. of German 11th Workshop on Test Technology and Reliability of Circuits and Systems : Potsdam, 19991999 / p. 120-123 https://masters.donntu.ru/2010/fknt/masyakin/library/article7.pdf

artikkel kogumikus

229

dissertatsioon

FPGA-based embedded virtual instrumentation = FPGA-sisesed virtuaalsed test- ja mõõtevahendidAleksejev, Igor2013 http://www.ester.ee/record=b2927687*est

dissertatsioon

230

artikkel ajakirjas

FPGA-based fault emulation of synchronous sequential circuitsEllervee, Peeter; Raik, Jaan; Tammemäe, Kalle; Ubar, Raimund-JohannesIET computers and digital techniques2007 / 2, p. 70-76 : ill https://ieeexplore.ieee.org/abstract/document/1423822

artikkel ajakirjas

231

artikkel ajakirjas

Fracture micromechanism of Cu-Cr-Zr system by "in-situ tensile test in SEM"Besterci, Michal; Ivan, Jozef; Kulu, Priit; Arensburger, Daniil; Velgosova, OksanaActa metallurgica Slovaca2000 / p. 20-24

artikkel ajakirjas

232

artikkel kogumikus

Fracture micromechanism of Cu-Cr-Zr system by "in-situ tensile test in SEM"Besterci, Michal; Ivan, Jozef; Kulu, Priit; Arensburger, DaniilProceedings of the 2nd International Conference, 27-29th April 2000, Tallinn, Estonia / DAAAM International Vienna, DAAAM National Estonia2000 / p. 193-196 : ill

artikkel kogumikus

233

artikkel kogumikus EST / artikkel kogumikus ENG

A framework for improving web application user interfaces through immediate evaluationMarenkov, Jevgeni; Robal, Tarmo; Kalja, AhtoDatabases and information systems IX : selected papers from the twelfth International Baltic Conference, DB&IS 20162016 / p. 283-296 : ill https://doi.org/10.3233/978-1-61499-714-6-283 Article collection metrics at Scopus Article at Scopus Article at WOS

artikkel kogumikus EST / artikkel kogumikus ENG

234

artikkel kogumikus

Fully synchronized acoustomechanical testing of skin : biomechanical measurements of nonclassical nonlinear parametersLints, Martin; Dos Santos, Serge; Kozena, Colette; Kus, Vaclav; Salupere, Andrus24th International Congress on Sound and Vibration 2017 (ICSV 24) : London, United Kingdom, 23-27 July 2017. Vol. 32017 / p. 1970-1977 : ill https://www.iiav.org/archives_icsv_last/2017_icsv24/content/papers/papers/full_paper_867_20170403135841549.pdf

artikkel kogumikus

235

artikkel ajakirjas

Functional self-test of high-performance pipe-lined signal processing architecturesGorev, Maksim; Ubar, Raimund-Johannes; Ellervee, Peeter; Devadze, Sergei; Raik, Jaan; Min, MartMicroprocessors and microsystems2015 / p. 909-918 : ill http://dx.doi.org/10.1016/j.micpro.2014.11.002

artikkel ajakirjas

236

artikkel kogumikus

Functional test generation for finite state machinesUbar, Raimund-Johannes; Brik, Marina; Jutman, Artur; Raik, Jaan; Bengtsson, Tomas; Kumar, ShashiBEC 2006 : 2006 International Baltic Electronics Conference : Tallinn University of Technology, October 2-4, 2006, Tallinn, Estonia : proceedings of the 10th Biennial Baltic Electronics Conference2006 / p. 205-208 : ill

artikkel kogumikus

237

artikkel kogumikus

Functional test program generation for digital systemsUbar, Raimund-Johannes; Dušina, Julia; Krupnova, Helena; Storožev, Sergei; Zaugarov, ViktorTestmethoden und Zuverlässigkeit von Schaltungen und Systemen : proceedings of the 6th workshop, Vaals (Niederlande), March 6-8, 19941994 / p. 14-18: ill

artikkel kogumikus

238

artikkel kogumikus

GA-based test generation for sequential circuitsBrik, Marina; Raik, Jaan; Ubar, Raimund-Johannes; Ivask, EeroProceedings of East–West Design & Test Workshop (EWDTW’04) : Yalta, Alushta, Crimea, Ukraine, September 23-26, 20042004 / p. 30-34

artikkel kogumikus

239

artikkel kogumikus

Generating optimal test cases for real-time systems using DIVINE model checkerPal, Deepak; Vain, JüriBEC 2016 : 2016 15th Biennial Baltic Electronics Conference : proceedings of the 15th Biennial Baltic Electronics Conference : Tallinn University of Technology, October 3-5, 2016, Tallinn, Estonia2016 / p. 99-102 : ill http://www.ester.ee/record=b2150914*est

artikkel kogumikus

240

artikkel kogumikus

Generation of tests for the localization of single gate design errors in combinational circuits using the stuck-at fault modelUbar, Raimund-Johannes; Borrione, DominiqueXI Brasilian Symposium on Integrated Circuit Design, September 30 - October 3, 1998, Rio de Janeiro, Brazil : proceedings1998 / p. 51-54 https://ieeexplore.ieee.org/document/715409

artikkel kogumikus

241

artikkel kogumikus

A generic synthesizable NoC switch with a scalable testbenchGovind, Vineeth; Raik, Jaan; Ubar, Raimund-JohannesBEC 2006 : 2006 International Baltic Electronics Conference : Tallinn University of Technology, October 2-4, 2006, Tallinn, Estonia : proceedings of the 10th Biennial Baltic Electronics Conference2006 / p. 91-94 : ill

artikkel kogumikus

242

artikkel ajakirjas EST / artikkel ajakirjas ENG

A global survey of standardization and industry practices of automotive cybersecurity validation and verification testing processes and toolsRoberts, Andrew; Marksteiner, Stefan; Soyturk, Mujdat; Yaman, Berkay; Yang, YiSAE international journal of connected and automated vehicles2023 / art. 12-07-02-0013 https://doi.org/10.4271/12-07-02-0013 Journal metrics at Scopus Article at Scopus

artikkel ajakirjas EST / artikkel ajakirjas ENG

243

artikkel kogumikus

Guardbands in random testingKemnitz, GünterBEC'96 : the 5th Biennial Baltic Electronics Conference, October 7-11, 1996, Tallinn, Estonia : proceedings1996 / p. 85-88: ill

artikkel kogumikus

244

artikkel ajakirjas

Guardbands in random testingKemnitz, GünterProceedings of the Estonian Academy of Sciences. Engineering1997 / 4, p. 260-270: ill

artikkel ajakirjas

245

raamat

Handbook of testing electronic systemsNovak, Ondrej; Gramatova, Elena; Ubar, Raimund-Johannes; Jutman, Artur; Raik, Jaan2005 https://www.ester.ee/record=b2102523*est

raamat

246

artikkel kogumikus

Hierarchical analysis of short defects between metal lines in CMOS ICPleskacz, Witold A.; Jenihhin, Maksim; Raik, Jaan; Rakowski, Michal; Ubar, Raimund-Johannes; Kuzmicz, WieslawProceedings : 11th EUROMICRO Conference on Digital System Design : Architectures, Methods and Tools : (DSD 2008) : September 3-5, 2008, Parma, Italy2008 / p. 729-734 : ill https://ieeexplore.ieee.org/document/4669309

artikkel kogumikus

247

artikkel kogumikus

Hierarchical approach to test generation for digital systems at system, circuit and defect levelsUbar, Raimund-Johannes45. Internationales Wissenschaftliches Kolloquium, 04.-06.10.2000 : Tagungsband2000 / S. 711-716 : Ill

artikkel kogumikus

248

artikkel kogumikus

A hierarchical automatic test pattern generator based on using alternative graphsBrik, Marina; Jervan, Gert; Markus, Antti; Raik, Jaan; Ubar, Raimund-JohannesProceedings of the 4th International Workshop Mixed Design of Integrated Circuits and Systems : MIXDES'97 : Poznan, Poland, 12-14 June 19971997 / p. 415-420

artikkel kogumikus

249

artikkel kogumikus

Hierarchical identification of untestable faults in sequential circuitsRaik, Jaan; Ubar, Raimund-Johannes; Krivenko, Anna; Kruus, Margus10th Euromicro Conference on Digital System Design Architectures, Methods and Tools, DSD 2007 : 29-31 August 2007, Lübeck, Germany : proceedings2007 / p. 668-671 : ill http://dx.doi.org/10.1109/DSD.2007.4341539

artikkel kogumikus

250

artikkel kogumikus

Hierarchical test generation based on alternative graph modelUbar, Raimund-JohannesProceedings of the Second Workshop on Hierarchical Test Generation : Microelectronics Technology Park, Duisburg, Germany, September 25-26, 19951995 / p. 18

artikkel kogumikus

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