Otsing - TalTech teadusportaal

kuva

reasta

201

artikkel ajakirjas

Fracture micromechanism of Cu-Cr-Zr system by "in-situ tensile test in SEM"Besterci, Michal; Ivan, Jozef; Kulu, Priit; Arensburger, Daniil; Velgosova, OksanaActa metallurgica Slovaca2000 / p. 20-24

artikkel ajakirjas

202

artikkel kogumikus

Fracture micromechanism of Cu-Cr-Zr system by "in-situ tensile test in SEM"Besterci, Michal; Ivan, Jozef; Kulu, Priit; Arensburger, DaniilProceedings of the 2nd International Conference, 27-29th April 2000, Tallinn, Estonia / DAAAM International Vienna, DAAAM National Estonia2000 / p. 193-196 : ill

artikkel kogumikus

203

artikkel kogumikus EST / artikkel kogumikus ENG

A framework for improving web application user interfaces through immediate evaluationMarenkov, Jevgeni; Robal, Tarmo; Kalja, AhtoDatabases and information systems IX : selected papers from the twelfth International Baltic Conference, DB&IS 20162016 / p. 283-296 : ill https://doi.org/10.3233/978-1-61499-714-6-283 Article collection metrics at Scopus Article at Scopus Article at WOS

artikkel kogumikus EST / artikkel kogumikus ENG

204

artikkel kogumikus

Fully synchronized acoustomechanical testing of skin : biomechanical measurements of nonclassical nonlinear parametersLints, Martin; Dos Santos, Serge; Kozena, Colette; Kus, Vaclav; Salupere, Andrus24th International Congress on Sound and Vibration 2017 (ICSV 24) : London, United Kingdom, 23-27 July 2017. Vol. 32017 / p. 1970-1977 : ill https://www.iiav.org/archives_icsv_last/2017_icsv24/content/papers/papers/full_paper_867_20170403135841549.pdf

artikkel kogumikus

205

artikkel ajakirjas

Functional self-test of high-performance pipe-lined signal processing architecturesGorev, Maksim; Ubar, Raimund-Johannes; Ellervee, Peeter; Devadze, Sergei; Raik, Jaan; Min, MartMicroprocessors and microsystems2015 / p. 909-918 : ill http://dx.doi.org/10.1016/j.micpro.2014.11.002

artikkel ajakirjas

206

artikkel kogumikus

Functional test generation for finite state machinesUbar, Raimund-Johannes; Brik, Marina; Jutman, Artur; Raik, Jaan; Bengtsson, Tomas; Kumar, ShashiBEC 2006 : 2006 International Baltic Electronics Conference : Tallinn University of Technology, October 2-4, 2006, Tallinn, Estonia : proceedings of the 10th Biennial Baltic Electronics Conference2006 / p. 205-208 : ill

artikkel kogumikus

207

artikkel kogumikus

Functional test program generation for digital systemsUbar, Raimund-Johannes; Dušina, Julia; Krupnova, Helena; Storožev, Sergei; Zaugarov, ViktorTestmethoden und Zuverlässigkeit von Schaltungen und Systemen : proceedings of the 6th workshop, Vaals (Niederlande), March 6-8, 19941994 / p. 14-18: ill

artikkel kogumikus

208

artikkel kogumikus

GA-based test generation for sequential circuitsBrik, Marina; Raik, Jaan; Ubar, Raimund-Johannes; Ivask, EeroProceedings of East–West Design & Test Workshop (EWDTW’04) : Yalta, Alushta, Crimea, Ukraine, September 23-26, 20042004 / p. 30-34

artikkel kogumikus

209

artikkel kogumikus

Generating optimal test cases for real-time systems using DIVINE model checkerPal, Deepak; Vain, JüriBEC 2016 : 2016 15th Biennial Baltic Electronics Conference : proceedings of the 15th Biennial Baltic Electronics Conference : Tallinn University of Technology, October 3-5, 2016, Tallinn, Estonia2016 / p. 99-102 : ill http://www.ester.ee/record=b2150914*est

artikkel kogumikus

210

artikkel kogumikus

A generic synthesizable NoC switch with a scalable testbenchGovind, Vineeth; Raik, Jaan; Ubar, Raimund-JohannesBEC 2006 : 2006 International Baltic Electronics Conference : Tallinn University of Technology, October 2-4, 2006, Tallinn, Estonia : proceedings of the 10th Biennial Baltic Electronics Conference2006 / p. 91-94 : ill

artikkel kogumikus

211

artikkel ajakirjas EST / artikkel ajakirjas ENG

A global survey of standardization and industry practices of automotive cybersecurity validation and verification testing processes and toolsRoberts, Andrew; Marksteiner, Stefan; Soyturk, Mujdat; Yaman, Berkay; Yang, YiSAE international journal of connected and automated vehicles2023 / art. 12-07-02-0013 https://doi.org/10.4271/12-07-02-0013 Journal metrics at Scopus Article at Scopus

artikkel ajakirjas EST / artikkel ajakirjas ENG

212

artikkel ajakirjas

Guardbands in random testingKemnitz, GünterProceedings of the Estonian Academy of Sciences. Engineering1997 / 4, p. 260-270: ill

artikkel ajakirjas

213

raamat

Handbook of testing electronic systemsNovak, Ondrej; Gramatova, Elena; Ubar, Raimund-Johannes; Jutman, Artur; Raik, Jaan2005 https://www.ester.ee/record=b2102523*est

raamat

214

artikkel kogumikus

Hierarchical analysis of short defects between metal lines in CMOS ICPleskacz, Witold A.; Jenihhin, Maksim; Raik, Jaan; Rakowski, Michal; Ubar, Raimund-Johannes; Kuzmicz, WieslawProceedings : 11th EUROMICRO Conference on Digital System Design : Architectures, Methods and Tools : (DSD 2008) : September 3-5, 2008, Parma, Italy2008 / p. 729-734 : ill https://ieeexplore.ieee.org/document/4669309

artikkel kogumikus

215

artikkel kogumikus

Hierarchical identification of untestable faults in sequential circuitsRaik, Jaan; Ubar, Raimund-Johannes; Krivenko, Anna; Kruus, Margus10th Euromicro Conference on Digital System Design Architectures, Methods and Tools, DSD 2007 : 29-31 August 2007, Lübeck, Germany : proceedings2007 / p. 668-671 : ill http://dx.doi.org/10.1109/DSD.2007.4341539

artikkel kogumikus

216

artikkel kogumikus

Hierarchical test generation based on alternative graph modelUbar, Raimund-JohannesProceedings of the Second Workshop on Hierarchical Test Generation : Microelectronics Technology Park, Duisburg, Germany, September 25-26, 19951995 / p. 18

artikkel kogumikus

217

artikkel ajakirjas

Hierarchical test generation for combinational circuits with real defects coverageCibakova, Tatiana; Fischerova, Maria; Gramatova, Elena; Kuzmicz, W.; Pleskacz, Witold A.; Raik, Jaan; Ubar, Raimund-JohannesMicroelectronics reliability2002 / p. 1141-1149 : ill https://www.sciencedirect.com/science/article/pii/S002627140200080X

artikkel ajakirjas

218

artikkel kogumikus

Hierarchical test generation for complex digital systems with control and data processing partsUbar, Raimund-Johannes; Raik, Jaan"Test, Assembly and Packaging" : SEMICON Technical Symposium : Singapur, May 3-6, 19991999 / p. 43-52

artikkel kogumikus

219

artikkel kogumikus

Hierarchical test generation for finite state machinesBrik, Marina; Ubar, Raimund-JohannesBEC : Baltic Electronics Conference : proceedings of the 4th Biennial Conference, October 9-14, 1994, Tallinn (Estonia). 11994 / p. 319-324: ill

artikkel kogumikus

220

artikkel kogumikus

Hierarchical test generation. SEMI show slidesUbar, Raimund-Johannes; Raik, Jaan"Test, Assembly and Packaging" : SEMICON Technical Symposium : Singapur, May 3-6, 19991999 / p. 53-64

artikkel kogumikus

221

dissertatsioon

Hierarchical test pattern generation and untestability identification techniques for synchronous sequential circuits = Hierarhilised testintegreerimise ja mittetestitavuse identifitseerimise meetodid sünkroonsetele järjestikskeemideleRannaste, Anna2010 https://www.ester.ee/record=b2637391*est

dissertatsioon

222

artikkel kogumikus

Hierarchical test synthesis for digital systems using alternative graph modelUbar, Raimund-JohannesQuantitative aspects of designing and validating dependable computing systems1995

artikkel kogumikus

223

artikkel ajakirjas

Hierarhilisest testigenereerimisest ja mittetestitavuse analüüsistRannaste, AnnaA & A2010 / 4, lk. 38-39 https://artiklid.elnet.ee/record=b2286481*est

artikkel ajakirjas

224

artikkel ajakirjas

High quality test generation for digital systemsUbar, Raimund-Johannes; Aarna, Margit; Kruus, Helena; Raik, JaanRomanian journal of information science and technology2005 / 1, p. 73-84 : ill

artikkel ajakirjas

225

artikkel kogumikus

High-level combined deterministic and pseudo-exhuastive test generation for RISC processorsOyeniran, Adeboye Stephen; Ubar, Raimund-Johannes; Jenihhin, Maksim; Gürsoy, Cemil Cem; Raik, Jaan2019 IEEE European Test Symposium (ETS) : proceedings2019 / 6 p. : ill https://doi.org/10.1109/ETS.2019.8791526

artikkel kogumikus

testimine (märksõna)

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