Searching - TalTech Research Portal

Publications
Profiles
Research Groups
Indexes
Help and information
Eesti keeles

Research Groups

Help and information

Searching

critical path identification (keyword)

—

—

—

—

Add criteria Advanced search filter

Clear

types of item

book ..

journal article ..

newspaper article ..

book article ..

dissertation ..

Open Access ..

Scientific publications ..

year

year of publication

Loading..

Loading..

TalTech department

Loading..

Loading..

Loading..

name of the person

Loading..

Loading..

Clear

Number of records 4
Look more.. (1/124)
Export

export all inquiry results (4)
Save TXT fail

print
Open for editing with marked entries my bookmarks

display

sort
1

book article

Hierarchical identification of NBTI-critical gates in nanoscale logicKostin, Sergei; Raik, Jaan; Ubar, Raimund-Johannes; Jenihhin, MaksimLATW2014 : 15th IEEE Latin-American Test Workshop : Fortaleza, Brazil, March 12th-15th, 20142014 / [6] p. : ill

book article
2

journal article EST / journal article ENG

Identification and rejuvenation of NBTI-critical logic paths in nanoscale circuitsJenihhin, Maksim; Squillero, Giovanni; Tihhomirov, Valentin; Kostin, Sergei; Raik, Jaan; Ubar, Raimund-JohannesJournal of electronic testing : theory and applications (JETTA)2016 / p. 273-289 : ill https://doi.org/10.1007/s10836-016-5589-x Journal metrics at Scopus Article at Scopus Journal metrics at WOS Article at WOS

journal article EST / journal article ENG
3

book article

Rejuvenation of nanoscale logic at NBTI-critical paths using evolutionary TPGPalermo, N.; Tihhomirov, Valentin; Copetti, Thiago; Jenihhin, Maksim; Raik, Jaan; Kostin, Sergei2015 16th Latin American Test Symposium (LATS 2015) : Puerto Vallarta, Mexico, 25-27 March 20152015 / [6] p. : ill http://dx.doi.org/10.1109/LATW.2015.7102405

book article
4

book article EST / book article ENG

Rejuvenation of NBTI-impacted processors using evolutionary generation of assembler programsPellerey, Francesco; Jenihhin, Maksim; Squillero, Giovanni; Raik, Jaan; Sonza Reorda, Matteo; Tihhomirov, Valentin; Ubar, Raimund-Johannes2016 IEEE 25th Asian Test Symposium : 21-24 November 2016, Hiroshima, Japan2016 / p. 304-309 : ill https://doi.org/10.1109/ATS.2016.57 Conference Proceedings at Scopus Article at Scopus Article at WOS

book article EST / book article ENG

Number of records 4, displaying 1 - 4

1. critical path identification
2. critical path
3. critical path fault tracing
4. critical path method
5. critical path tracing
6. fault simulation with critical path tracing
7. NBTI-critical path
8. Parallel Fault Simulation with Critical Path Backtracing
9. timing-critical path
10. path identification
11. critical area identification
12. control and data path tests
13. deformation path
14. development path
15. feasible path generation
16. helical path separation
17. human path rehabilitation
18. mean free path
19. minimal path
20. multi-path
21. NBTI-induced path delay estimation
22. path analyses
23. path dependency
24. path loss model
25. path planning
26. reaction path
27. shortest path
28. shortest-path
29. test path synthesis
30. tracking path
31. anatase critical particle size
32. critical communication
33. critical communications
34. critical computing
35. critical contextual empiricism
36. critical control points
37. critical data studies
38. critical disclosure analysis
39. critical discourse analysis
40. critical elements
41. Critical employees
42. critical evaluation
43. critical frequencies
44. critical health conditions
45. critical information infrastructure
46. critical infrastructure
47. critical infrastructure management
48. critical infrastructure protection
49. critical infrastructures
50. critical laboratory results
51. critical metals
52. critical micelle concentration
53. critical nodes
54. critical political economy
55. critical psychology
56. critical ratsionalism
57. Critical Raw Materials
58. Critical realism
59. critical research
60. critical review
61. critical Reynolds number
62. critical situations
63. critical success factors
64. critical success factors (CSF)
65. critical theory of technology
66. critical thinking
67. critical thinking in IT
68. critical-sized bone defects
69. critical-sized defects
70. lifecritical services
71. minor critical metals
72. mixed-critical system
73. NBTI-critical gate
74. optimized routing approach for critical and emergency networks
75. optimized routing approach for critical and emergency networks simulations
76. safety critical systems
77. safety-critical
78. safety-critical applications
79. timing-critical paths
80. Automatic identification system
81. automatic identification system (AIS)
82. Autonomous Identification System (AIS)
83. brand community identification
84. brand identification
85. brand origin identification
86. change point identification
87. closed-loop identification
88. defect identification
89. digital identification
90. electronic identification
91. eyewitness identification
92. identification
93. identification cards
94. identification of military objects
95. identification of unbalance voltage source
96. identification of voltage unbalance sources
97. identification patterns
98. identification problems
99. identification via heteroskedasticity
100. language identification
101. medicinal product identification
102. message identification
103. metaverse identification
104. model identification
105. mould identification
106. nonlinear model identification
107. parameter identification
108. patient identification techniques
109. phase identification
110. radio frequency identification
111. root identification
112. Satellite Autonomous Identification System (SAIS)
113. seismic signal identification
114. self-identification
115. speaker identification
116. species identification
117. structural identification
118. sustem identification
119. system identification
120. taxonomical identification
121. thermal behavior identification
122. threat identification
123. vehicle identification
124. yeast identification

match

sort

Otsing
Valikud 0

year of publication

author

TalTech department

subject term

series

name of the person

keyword

TalTech Library

Akadeemia tee 1

13519

TalTech homepage TalTech Library homepage Digital Collection of TalTech Library Digiteek Repository

6203551

data@taltech.ee

TalTech Raamatukogu