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1
book article
A scalable technique to identify true critical paths in sequential circuits
Ubar, Raimund-Johannes
;
Kostin, Sergei
;
Jenihhin, Maksim
;
Raik, Jaan
Proceedings 2017 IEEE 20th International Symposium on Design and Diagnotics of Electronic Circuit & Systems(DDECS) : April 19-21, 2017, Dresden, Germany
2017
/
p. 152-157 : ill
https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=7934553
book article
2
book article
A tool for random test generation targeting high diagnostic resolution
Osimiry, Emmanuel Ovie
;
Kostin, Sergei
;
Raik, Jaan
;
Ubar, Raimund-Johannes
BEC 2016 : 2016 15th Biennial Baltic Electronics Conference : proceedings of the 15th Biennial Baltic Electronics Conference : Tallinn University of Technology, October 3-5, 2016, Tallinn, Estonia
2016
/
p. 79-82 : ill
http://www.ester.ee/record=b2150914*est
book article
3
book article
A tool set for teaching design-for-testability of digital circuits
Kostin, Sergei
;
Orasson, Elmet
;
Ubar, Raimund-Johannes
EWME 2016 : 11th European Workshop on Microelectronics Education : May 11-13, 2016, Southampton, UK
2016
/
[6] p. : ill
http://dx.doi.org/10.1109/EWME.2016.7496466
book article
4
book article
About robustness of test patterns regarding multiple faults
Ubar, Raimund-Johannes
;
Kostin, Sergei
;
Raik, Jaan
LATW 2012 : 13th IEEE Latin-American Test Workshop proceedings : April 10th-13th, 2012, Quito, Ecuador
2012
/
p. 86-91 : ill
book article
5
journal article
Accurate dialysis dose evaluation and extrapolation algorithms during online optical dialysis monitoring
Fridolin, Ivo
;
Karai, Deniss
;
Kostin, Sergei
;
Ubar, Raimund-Johannes
IEEE transactions on biomedical engineering
2013
/
p. 1371-1377 : ill
journal article
6
book article
Accurate NBTI-induced gate delay modeling based on intensive SPICE simulations
Kostin, Sergei
;
Raik, Jaan
;
Ubar, Raimund-Johannes
;
Jenihhin, Maksim
MEDIAN Finale : Workshop on Manufacturable and Dependable Multicore Architectures at Nanoscale : November 10-11, 2015, Tallinn, Estonia
2015
/
p. 21-26 : ill
book article
7
book article
Block-level fault model-free debug and diagnosis in digital systems
Ubar, Raimund-Johannes
;
Kostin, Sergei
;
Raik, Jaan
Proceedings of the 12th EUROMICRO Conference on Digital System Design, Architectures, Methods and Tools : Patras, Greece, August 27-29, 2009
2009
/
p. 229-232
https://ieeexplore.ieee.org/document/5350128
book article
8
book article
Built-in self diagnosis with multiple signature analyzers in digital systems
Ubar, Raimund-Johannes
;
Kostin, Sergei
;
Raik, Jaan
Proceedings of the 9th IEEE Latin-American Test Workshop : LATW2008 : February 17-20, 2008, Puebla, Mexico
2008
/
p. 29-34 : ill
book article
9
book article
Calculation of the diagnosibility of digital circuits without using fault models
Ubar, Raimund-Johannes
;
Kostin, Sergei
;
Raik, Jaan
BEC 2008 : 2008 International Biennial Baltic Electronics Conference : proceedings of the 11th Biennial Baltic Electronics Conference : Tallinn University of Technology : October 6-8, 2008, Tallinn, Estonia
2008
/
p. 159-162 : ill
book article
10
book article
Combined fault-model free cause-effect and effect-cause fault diagnosis in block-level digital networks
Ubar, Raimund-Johannes
;
Kostin, Sergei
;
Raik, Jaan
ASQED'09 : 1st Asia Symposium on Quality Electronic Design : Kuala Lumpur, Malaisia, July 15-16, 2009
2009
/
p. 385-390
https://ieeexplore.ieee.org/document/5206232
book article
11
book article
Comparison of two approaches to improve functional BIST fault coverage
Kostin, Sergei
;
Ubar, Raimund-Johannes
;
Gorev, Maksim
;
Mägi, Gunnar
BEC 2014 : 2014 14th Biennial Baltic Electronics Conference : proceedings of the 14th Biennial Baltic Electronics Conference : Tallinn University of Technology, October 6-8, 2014, Tallinn, Estonia
2014
/
p. 105-108 : ill
book article
12
book article
Defect-oriented modul-level fault diagnosis in digital circuits
Kostin, Sergei
;
Ubar, Raimund-Johannes
;
Raik, Jaan
Proceedings of the 2011 IEEE Symposium on Design and Diagnostics of Electronic Circuits and Systems : April 13-15, 2011, Gottbus, Germany
2011
/
p. 81-86
book article
13
book article
DIAGNOZER : a laboratory tool for teaching research in diagnosis of electronic systems [Electronic resource]
Ubar, Raimund-Johannes
;
Kostin, Sergei
;
Jutman, Artur
;
Raik, Jaan
;
Wuttke, Heinz-Dietrich
2009 IEEE International Conference on Microelectronic Systems Education MSE '09 : 25-27 July 2009, San Francisco, California : [proceedings]
2009
/
p. 12-15 : ill. [CD-ROM]
http://dx.doi.org/10.1109/MSE.2009.5270842
book article
14
book article
E-learning environment for WEB-based study of testing
Ubar, Raimund-Johannes
;
Jutman, Artur
;
Raik, Jaan
;
Devadze, Sergei
;
Jenihhin, Maksim
;
Aleksejev, Igor
;
Tšepurov, Anton
;
Tšertov, Anton
;
Kostin, Sergei
;
Orasson, Elmet
;
Wuttke, Heinz-Dietrich
Proceedings of the 8th European Workshop on Microelectronics Education : EWME 2010 : Darmstadt, Germany, 10-12 May 2010
2010
/
p. 47-52 : ill
book article
15
book article
Embedded diagnosis in digital systems
Ubar, Raimund-Johannes
;
Kostin, Sergei
;
Raik, Jaan
2008 26th International Conference on Microelectronics : Niš, Serbia, 11-14 May 2008 : proceedings. Vol. 2
2008
/
p. 421-424 : ill
book article
16
book article
Embedded diagnosis in digital systems
Kostin, Sergei
Info- ja kommunikatsioonitehnoloogia doktorikooli IKTDK kolmanda aastakonverentsi artiklite kogumik : 25.-26. aprill 2008, Voore külalistemaja
2008
/
p. 81-84 : ill
book article
17
journal article
Embedded fault diagnosis in digital systems with BIST
Ubar, Raimund-Johannes
;
Kostin, Sergei
;
Raik, Jaan
Microprocessors and microsystems
2008
/
5/6, p. 279-287 : ill
journal article
18
journal article
Environment for the analysis of functional self-test quality in digital systems
Ubar, Raimund-Johannes
;
Kostin, Sergei
;
Kruus, Helena
;
Aarna, Margit
;
Devadze, Sergei
Proceedings of the Estonian Academy of Sciences
2014
/
p. 151-162 : ill
https://artiklid.elnet.ee/record=b2673964*est
journal article
19
journal article
Exact parallel critical path fault tracing to speed-up fault simulation in sequential circuits
Kõusaar, Jaak
;
Ubar, Raimund-Johannes
;
Kostin, Sergei
;
Devadze, Sergei
;
Raik, Jaan
International journal of microelectronics and computer science
2018
/
p. 9−18
https://ijmcs.dmcs.pl/web/guest/vol.-9-no.-1
https://ijmcs.dmcs.pl/documents/10630/345460/IJMCS_1_2018_2.pdf
journal article
20
book article
Experimental comparison of different diagnosis algorithms in the BIST environment
Ubar, Raimund-Johannes
;
Kostin, Sergei
;
Raik, Jaan
;
Kruus, Margus
Proceedings of the 16th IASTED International Conference on Applied Simulation and Modelling : August 29-31, 2007, Palma de Mallorca, Spain
2007
/
p. 271-276 : ill
book article
21
journal article EST
/
journal article ENG
Fast identification of true critical paths in sequential circuits
Ubar, Raimund-Johannes
;
Kostin, Sergei
;
Jenihhin, Maksim
;
Raik, Jaan
;
Jürimägi, Lembit
Microelectronics reliability
2018
/
p. 252-261 : ill
https://doi.org/10.1016/j.microrel.2017.11.027
Journal metrics at Scopus
Article at Scopus
Journal metrics at WOS
Article at WOS
journal article EST
/
journal article ENG
22
book article
Fault diagnosis in integrated circuits with BIST
Ubar, Raimund-Johannes
;
Kostin, Sergei
;
Raik, Jaan
;
Evartson, Teet
;
Lensen, Harri
10th Euromicro Conference on Digital System Design Architectures, Methods and Tools, DSD 2007 : 29-31 August 2007, Lübeck, Germany : proceedings
2007
/
p. 604-610 : ill
http://dx.doi.org/10.1109/DSD.2007.4341530
book article
23
book article
Fault diagnosis in the BIST environment based on bisection of detected faults
Ubar, Raimund-Johannes
;
Kostin, Sergei
;
Raik, Jaan
LATW2007 : 8th IEEE Latin-American Test Workshop : March 11-14, 2007, Cuzco, Peru
2007
/
[6] p. : ill
book article
24
book article
Gate-level modelling of NBTI-induced delays under process variations
Copetti, Thiago
;
Cardoso Medeiros, Guilherme
;
Bolzani Poehls, Leticia
;
Vargas, Fabian
;
Kostin, Sergei
;
Jenihhin, Maksim
;
Raik, Jaan
;
Ubar, Raimund-Johannes
LATS 2016 : 17th IEEE Latin-American Test Symposium, Foz do Iguacu, Brazil, 6th-9th April 2016
2016
/
p. 75-80 : ill
http://dx.doi.org/10.1109/LATW.2016.7483343
book article
25
book article
Hierarchical identification of NBTI-critical gates in nanoscale logic
Kostin, Sergei
;
Raik, Jaan
;
Ubar, Raimund-Johannes
;
Jenihhin, Maksim
LATW2014 : 15th IEEE Latin-American Test Workshop : Fortaleza, Brazil, March 12th-15th, 2014
2014
/
[6] p. : ill
book article
Number of records 45, displaying
1 - 25
previous
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author
78
1.
Kostin, Sergei
2.
Astapov, Sergei
3.
Avanessov, Sergei
4.
Balõbin, Sergei
5.
Bereznev, Sergei
6.
Bogatenkov, Sergei
7.
Bogovski, Sergei
8.
Bonomanko, Sergei
9.
Buatšidze, Sergei
10.
Demidov, Sergei
11.
Devadze, Sergei
12.
Dokelin, Sergei
13.
Dolgov, Sergei
14.
Dolin, Sergei
15.
Falko, Sergei
16.
Jakovlev, Sergei
17.
Jegorov, Sergei
18.
Jekimov, Sergei
19.
Jurkin, Sergei
20.
Kaganski, Sergei
21.
Khakalo, Sergei
22.
Kholodkevich, Sergei
23.
Kiparissov, Sergei
24.
Konstantinov, Sergei
25.
Kopanchuk, Sergei
26.
Kopantšuk, Sergei
27.
Kornilov, Sergei
28.
Kramarenko, Sergei
29.
Kulikov, Sergei
30.
Letunovitš, Sergei
31.
Linevitš, Sergei
32.
Lugovski, Sergei
33.
Lukaševitš, Sergei
34.
Melentjev, Sergei
35.
Metlev, Sergei
36.
Mihhailov, Sergei
37.
Missenjov, Sergei
38.
Nazarenko, Sergei
39.
Odintsov, Sergei
40.
Ovsjanski, Sergei
41.
Pavlov, Sergei
42.
Pravkin, Sergei
43.
Preis, Sergei
44.
Roshtshin, Sergei
45.
Rudenja, Sergei
46.
Sabanov, Sergei
47.
Sazhin, Sergei
48.
Seeland, Sergei
49.
Shvarev, Sergei
50.
Silvestrov, Sergei
51.
Slepuhhov, Sergei
52.
Sokolov, Sergei
53.
Soldatov, Sergei
54.
Storojev, Sergei
55.
Storožev, Sergei
56.
Strik, Sergei
57.
Studzinsky, Sergei
58.
Zaitsev, Sergei V.
59.
Zarembo, Sergei
60.
Zhigailov, Sergei
61.
Zimakov, Sergei
62.
Zonov, Sergei
63.
Zub, Sergei
64.
Tamm, Sergei
65.
Tatarly, Sergei
66.
Teljakovski, Sergei
67.
Teterin, Sergei
68.
Tisler, Sergei
69.
Trashchenkov, Sergei
70.
Tšekrõžov, Sergei
71.
Tšeredišenko, Sergei
72.
Tšudinov, Sergei
73.
Vakulenko, Sergei
74.
Vlassov, Sergei
75.
Vorobjov, Sergei
76.
Yurchenko, Sergei
77.
Žari, Sergei
78.
Žigailov, Sergei
CV
43
1.
Kostin, Sergei
2.
Astapov, Sergei 1988
3.
Berezin, Sergei 1970
4.
Bereznev, Sergei 1968
5.
Buatšidze, Sergei
6.
Buatzidze, Sergei 1905-1975
7.
Demidov, Sergei
8.
Devadze, Sergei 1981
9.
Dokelin, Sergei 1917-1987
10.
Jakušev, Sergei 1964
11.
Konstantinov, Sergei 1909-1984
12.
Kramarenko, Sergei 1980
13.
Kristafovitš, Sergei 1972
14.
Krištafovitš, Sergei
15.
Laks, Sergei 1901-1942
16.
Letunovitš, Sergei 1958
17.
Malnov, Sergei 1956
18.
Martinson, Sergei 1963
19.
Menšutin, Sergei 1919
20.
Nazarenko, Sergei 1955
21.
Odintsov, Sergei 1988
22.
Ovtsov, Sergei
23.
Pavlov, Sergei 1977
24.
Ponomar, Sergei
25.
Preis, Sergei 1959
26.
Rebane, Sergei 1974
27.
Rudenja, Sergei 1965
28.
Sabanov, Sergei 1974
29.
Schilling, Sergei 1881-1947
30.
Soldatov, Sergei 1933-2003
31.
Storozhev, Sergei
32.
Storožev, Sergei 1966
33.
Zimakov, Sergei 1975
34.
Zub, Sergei 1978
35.
Tamm, Sergei 1956
36.
Tisler, Sergei 1967
37.
Tšekrižov, Sergei
38.
Tšekrõžov, Sergei 1950
39.
Tšudinov, Sergei 1920
40.
Tupailo, Sergei 1965
41.
Urba, Sergei, 1899-1943
42.
Urbanovitš, Sergei
43.
Žari, Sergei 1987-
name of the person
14
1.
Kostin, Sergei
2.
Astapov, Sergei
3.
Bereznev, Sergei
4.
Bogatenkov, Sergei
5.
Jermolajev, Sergei
6.
Kaganski, Sergei, 1987-
7.
Letunovitš, Sergei
8.
Nazarenko, Sergei
9.
Pavlov, Sergei
10.
Preis, Sergei, 1959-
11.
Sabanov, Sergei, 1974-
12.
Soldatov, Sergei, 1933-2003
13.
Žari, Sergei
14.
Žigailov, Sergei
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