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book article

At-speed self-testing of high-performance pipe-lined processing architectures [Electronic resource]Gorev, Maksim; Ubar, Raimund-Johannes; Ellervee, Peeter; Devadze, Sergei; Raik, Jaan; Min, Mart31st Norchip Conference : Vilnius, Lithuania, 11-12 November 2013 : conference program and papers2013 / p. 1-6 : ill [USB]

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journal article EST / journal article ENG

Functional self-test of high-performance pipe-lined signal processing architecturesGorev, Maksim; Ubar, Raimund-Johannes; Ellervee, Peeter; Devadze, Sergei; Raik, Jaan; Min, MartMicroprocessors and microsystems2015 / p. 909-918 : ill https://doi.org/10.1016/j.micpro.2014.11.002 Journal metrics at Scopus Article at Scopus Journal metrics at WOS Article at WOS

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Self-testing of pipe-lined signal processing architectures at-speedGorev, Maksim; Ubar, Raimund-Johannes; Ellervee, PeeterInfo- ja kommunikatsioonitehnoloogia doktorikooli IKTDK seitsmenda aastakonverentsi artiklite kogumik : 15.-16. novembril 2013, Haapsalu2013 / p. 25-28 : ill

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Number of records 3, displaying 1 - 3

1. at-speed testing
2. absolute convergence with speed
3. A-statistical convergence with speed
4. boundedness and summability with speed
5. boundedness with speed
6. convergence and absolute convergence with speed
7. convergence and boundedness with speed
8. convergence and α-absolute convergence with speed
9. convergence with speed
10. Drilling speed
11. high speed boat
12. high speed craft (HSC)
13. high speed machining
14. high speed measurement
15. high-speed
16. high-speed camera
17. high-speed craft
18. high-speed design
19. high-speed MAS (magic angle spinning)
20. high-speed planing crafts
21. high-speed railway
22. high-speed serial link test
23. high-speed temperature scanner
24. high-speed temperature scanner (HSTS)
25. high-speed thermogravimetric analysis
26. low speed
27. operational speed
28. paranormal absolute convergence with speed
29. paranormal boundedness with speed
30. paranormal convergence with speed
31. paranormed absolute convergence with speed
32. paranormed boundedness with speed
33. paranormed convergence with speed
34. paranormed zero-convergence with speed
35. Pollen fall speed
36. speed
37. speed and position estimation
38. speed of convergence
39. speed of releases
40. speed tracking setpoints
41. speed-Maddox spaces
42. summability and absolute summability with speed
43. summability and boundedness with speed
44. zero-convergence with speed
45. variable speed drive
46. variable speed drives
47. variable speed wind turbines
48. variable-speed drives
49. variable-speed drives (VSDs)
50. water speed
51. wind speed
52. α-absolute convergence with speed
53. α-absolute summability with speed
54. accelerated testing
55. acoustomechanical testing
56. anaerobic testing
57. aspect-oriented testing
58. assessment and testing
59. benchmark testing
60. Berridge testing
61. burst testing
62. cancer genomic testing
63. compliance testing
64. compositional testing
65. computer aided testing
66. cone heater testing
67. conformance testing
68. courses on electronic testing and design
69. cybersecurity testing
70. D. non-destructive testing
71. deformation testing
72. design field testing
73. destructive testing
74. eddy current testing
75. eddy current testing (ECT)
76. erosion testing
77. fatigue testing
78. fire testing
79. hierarchical testing
80. hypotheses testing
81. Implementation-Independent Testing of Microprocessors
82. integration testing
83. laboratory scale testing
84. load testing
85. macro mechanical testing and green surface tribology
86. material testing
87. materials testing
88. measurement and testing
89. mechanical testing
90. memory testing
91. metamorphic testing
92. microprocessor testing
93. model based testing
94. model-based mutation testing
95. model-based testing
96. mutation testing
97. network-testing
98. non destructive testing
99. nondestructive testing
100. non-destructive testing
101. on-site testing
102. pin on disc wear testing
103. PMU calibration testing
104. PMU testing
105. point-of-care testing
106. processor core testing
107. processor testing
108. real-time HiL testing
109. regression testing
110. RISC processor testing
111. robustness testing
112. safety and security testing
113. scenario testing
114. scratch testing
115. security testing
116. shear testing
117. small-scale fire testing
118. software testing
119. software-in-the-loop (SIL) testing
120. stand-alone testing
121. stress-testing
122. substation testing methods
123. system testing
124. tensile testing
125. testing
126. testing methods
127. testing of digital devices
128. testing of generator
129. testing of phasor measurement units
130. two-dimensional array testing
131. ultrasonic testing
132. wafer testing
133. wear testing
134. vibration testing
135. virtual testing

1. Testing and Calibration Centre of TUT

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