Searching - TalTech Research Portal

Publications
Profiles
Research Groups
Indexes
Help and information
Eesti keeles

Research Groups

Help and information

Advanced search

at-speed testing (keyword)

—

—

Add criteria Simple search filter

Clear

types of item

book ..

journal article ..

newspaper article ..

book article ..

dissertation ..

Open Access ..

Scientific publications ..

year

year of publication

Loading..

Loading..

TalTech department

Loading..

Loading..

Loading..

name of the person

Loading..

Loading..

Clear

Number of records 3
Look more.. (2/126)
Export

export all inquiry results (3)
Save TXT fail

Save PDF fail

print
Open for editing with marked entries my bookmarks

display

sort
1

book article

At-speed self-testing of high-performance pipe-lined processing architectures [Electronic resource]Gorev, Maksim; Ubar, Raimund-Johannes; Ellervee, Peeter; Devadze, Sergei; Raik, Jaan; Min, Mart31st Norchip Conference : Vilnius, Lithuania, 11-12 November 2013 : conference program and papers2013 / p. 1-6 : ill [USB]

book article
2

journal article

Functional self-test of high-performance pipe-lined signal processing architecturesGorev, Maksim; Ubar, Raimund-Johannes; Ellervee, Peeter; Devadze, Sergei; Raik, Jaan; Min, MartMicroprocessors and microsystems2015 / p. 909-918 : ill http://dx.doi.org/10.1016/j.micpro.2014.11.002

journal article
3

book article

Self-testing of pipe-lined signal processing architectures at-speedGorev, Maksim; Ubar, Raimund-Johannes; Ellervee, PeeterInfo- ja kommunikatsioonitehnoloogia doktorikooli IKTDK seitsmenda aastakonverentsi artiklite kogumik : 15.-16. novembril 2013, Haapsalu2013 / p. 25-28 : ill

book article

Number of records 3, displaying 1 - 3

1. at-speed testing
2. absolute convergence with speed
3. A-statistical convergence with speed
4. boundedness and summability with speed
5. boundedness with speed
6. convergence and absolute convergence with speed
7. convergence and boundedness with speed
8. convergence and α-absolute convergence with speed
9. convergence with speed
10. Drilling speed
11. high speed boat
12. high speed craft (HSC)
13. high speed machining
14. high speed measurement
15. high-speed
16. high-speed craft
17. high-speed design
18. high-speed MAS (magic angle spinning)
19. high-speed planing crafts
20. high-speed railway
21. high-speed serial link test
22. high-speed temperature scanner
23. high-speed thermogravimetric analysis
24. low speed
25. operational speed
26. paranormal absolute convergence with speed
27. paranormal boundedness with speed
28. paranormal convergence with speed
29. paranormed absolute convergence with speed
30. paranormed boundedness with speed
31. paranormed convergence with speed
32. paranormed zero-convergence with speed
33. Pollen fall speed
34. speed
35. speed and position estimation
36. speed of convergence
37. speed tracking setpoints
38. summability and boundedness with speed
39. zero-convergence with speed
40. variable speed drive
41. variable speed drives
42. variable speed wind turbines
43. variable-speed drives
44. variable-speed drives (VSDs)
45. wind speed
46. α-absolute convergence with speed
47. α-absolute summability with speed
48. accelerated testing
49. acoustomechanical testing
50. anaerobic testing
51. aspect-oriented testing
52. benchmark testing
53. Berridge testing
54. burst testing
55. cancer genomic testing
56. compliance testing
57. compositional testing
58. computer aided testing
59. conformance testing
60. courses on electronic testing and design
61. cybersecurity testing
62. D. non-destructive testing
63. deformation testing
64. design field testing
65. destructive testing
66. eddy current testing
67. eddy current testing (ECT)
68. erosion testing
69. fatigue testing
70. fire testing
71. hierarchical testing
72. hypotheses testing
73. Implementation-Independent Testing of Microprocessors
74. integration testing
75. laboratory scale testing
76. load testing
77. macro mechanical testing and green surface tribology
78. material testing
79. materials testing
80. measurement and testing
81. mechanical testing
82. memory testing
83. metamorphic testing
84. microprocessor testing
85. model based testing
86. model-based mutation testing
87. model-based testing
88. mutation testing
89. network-testing
90. non destructive testing
91. nondestructive testing
92. non-destructive testing
93. on-site testing
94. pin on disc wear testing
95. PMU calibration testing
96. PMU testing
97. point-of-care testing
98. processor core testing
99. processor testing
100. real-time HiL testing
101. regression testing
102. RISC processor testing
103. robustness testing
104. safety and security testing
105. scenario testing
106. scratch testing
107. security testing
108. small-scale fire testing
109. software testing
110. software-in-the-loop (SIL) testing
111. stand-alone testing
112. stress-testing
113. substation testing methods
114. system testing
115. tensile testing
116. testing
117. testing methods
118. testing of digital devices
119. testing of generator
120. testing of phasor measurement units
121. two-dimensional array testing
122. wafer testing
123. wear testing
124. vibration testing
125. virtual testing

1. Testing and Calibration Centre of TUT

match

sort

Otsing
Valikud 0

year of publication

author

TalTech department

subject term

series

name of the person

keyword

TalTech Library

Akadeemia tee 1

13519

TalTech homepage TalTech Library homepage Digital Collection of TalTech Library Digiteek Repository

6203551

data@taltech.ee

TalTech Raamatukogu