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book article

At-speed self-testing of high-performance pipe-lined processing architectures [Electronic resource]Gorev, Maksim; Ubar, Raimund-Johannes; Ellervee, Peeter; Devadze, Sergei; Raik, Jaan; Min, Mart31st Norchip Conference : Vilnius, Lithuania, 11-12 November 2013 : conference program and papers2013 / p. 1-6 : ill [USB]

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journal article

Functional self-test of high-performance pipe-lined signal processing architecturesGorev, Maksim; Ubar, Raimund-Johannes; Ellervee, Peeter; Devadze, Sergei; Raik, Jaan; Min, MartMicroprocessors and microsystems2015 / p. 909-918 : ill http://dx.doi.org/10.1016/j.micpro.2014.11.002

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book article

Self-testing of pipe-lined signal processing architectures at-speedGorev, Maksim; Ubar, Raimund-Johannes; Ellervee, PeeterInfo- ja kommunikatsioonitehnoloogia doktorikooli IKTDK seitsmenda aastakonverentsi artiklite kogumik : 15.-16. novembril 2013, Haapsalu2013 / p. 25-28 : ill

book article

Number of records 3, displaying 1 - 3

1. at-speed testing
2. boundedness and summability with speed
3. boundedness with speed
4. convergence and absolute convergence with speed
5. convergence and boundedness with speed
6. convergence and α-absolute convergence with speed
7. convergence with speed
8. Drilling speed
9. high speed boat
10. high speed craft (HSC)
11. high speed machining
12. high speed measurement
13. high-speed
14. high-speed craft
15. high-speed design
16. high-speed MAS (magic angle spinning)
17. high-speed planing crafts
18. high-speed railway
19. high-speed serial link test
20. high-speed temperature scanner
21. high-speed thermogravimetric analysis
22. low speed
23. operational speed
24. Pollen fall speed
25. speed
26. speed and position estimation
27. speed of convergence
28. speed tracking setpoints
29. summability and boundedness with speed
30. variable speed drive
31. variable speed drives
32. variable speed wind turbines
33. variable-speed drives
34. variable-speed drives (VSDs)
35. wind speed
36. α-absolute convergence with speed
37. accelerated testing
38. acoustomechanical testing
39. anaerobic testing
40. aspect-oriented testing
41. benchmark testing
42. Berridge testing
43. cancer genomic testing
44. compliance testing
45. compositional testing
46. computer aided testing
47. conformance testing
48. courses on electronic testing and design
49. cybersecurity testing
50. D. non-destructive testing
51. design field testing
52. destructive testing
53. eddy current testing
54. erosion testing
55. fatigue testing
56. fire testing
57. hierarchical testing
58. hypotheses testing
59. integration testing
60. laboratory scale testing
61. load testing
62. macro mechanical testing and green surface tribology
63. material testing
64. materials testing
65. measurement and testing
66. mechanical testing
67. memory testing
68. metamorphic testing
69. microprocessor testing
70. model based testing
71. model-based mutation testing
72. model-based testing
73. mutation testing
74. network-testing
75. non destructive testing
76. nondestructive testing
77. non-destructive testing
78. on-site testing
79. pin on disc wear testing
80. PMU calibration testing
81. PMU testing
82. point-of-care testing
83. processor core testing
84. processor testing
85. real-time HiL testing
86. regression testing
87. RISC processor testing
88. robustness testing
89. scenario testing
90. scratch testing
91. security testing
92. small-scale fire testing
93. software testing
94. software-in-the-loop (SIL) testing
95. stand-alone testing
96. stress-testing
97. substation testing methods
98. system testing
99. tensile testing
100. testing
101. testing methods
102. testing of digital devices
103. testing of generator
104. testing of phasor measurement units
105. two-dimensional array testing
106. wafer testing
107. wear testing
108. vibration testing
109. virtual testing

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