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High-level functional test generation for microprocessor modules (title)
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book article
High-level functional test generation for microprocessor modules
Oyeniran, Adeboye Stephen
;
Ubar, Raimund-Johannes
Proceedings of 26th International Conference Mixed Design of Integrated Circuits and Systems : MIXDES 2019 : Rzeszów, Poland, June 27 - 29, 2019
2019
/
p. 356-361 : ill
https://doi.org/10.23919/MIXDES.2019.8787131
book article
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keyword
40
1.
high-level test data generation
2.
functional test generation
3.
high-level functional fault model
4.
behaviour level test generation
5.
Hierarchical Multi-level Test Generation
6.
high-level synthesis for test
7.
logic level and high level BDDs
8.
microprocessor test
9.
functional self-test
10.
extreme penetration level of non synchronous generation
11.
adaptive test strategy generation
12.
automated test pattern generation
13.
automatic test case generation
14.
automatic test pattern generation
15.
automatic test program generation
16.
highlevel test generation
17.
implementation-independent test generation
18.
offline test generation
19.
provably correct test generation
20.
test generation
21.
test generation and fault diagnosis
22.
Test Group Generation for Detecting Multiple Faults
23.
test program generation
24.
system level test
25.
high level DD (HLDD)
26.
high level of security
27.
high level synthesis
28.
high-level control fault model
29.
high-level control faults
30.
high-level decision diagram
31.
high-level decision diagrams
32.
high-level decision diagrams (HLDD) synthesis
33.
High-level Decision Diagrams for Modeling Digital Systems
34.
high-level expert group on AI
35.
high-level fault coverage
36.
high-level fault model
37.
high-level fault simulation
38.
high-level synthesis
39.
High-Level Synthesis (HLS)
40.
high-speed serial link test
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